Mark For: OPTONICS® trademark registration is intended to cover the categories of capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors. [all]
Status
2022-08-02 UTC
DEAD REGISTRATION Cancelled Invalidated
The trademark application was registered, but subsequently it was cancelled or invalidated and removed from the registry.
(Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use
Yes
Current Use
Yes
Intent To Use
No
Filed ITU
No
44D Filed
No
44E Current
No
66A Current
No
Current Basis
No
No Basis
No
Cancellation Code
2
Attorney Name
Joseph Bach
Attorney Docket Number
2321
Law Office Assigned
L30
Employee Name
CROSS, TRACY L
Timeline
1998-11-00
Date of First Use
1998-11-01
Date of First Use
1998-11-01
Date of Use In Commerce
2002-02-15
Application Filed
2004-01-27
Trademark Registered
2007-06-09
Location: SCANNING ON DEMAND
2010-09-03
Cancelled
2010-09-03
Status: Dead/Cancelled
2010-09-03
Status: Registration cancelled because registrant did not file an acceptable declaration under Section 8. To view all documents in this
JOSEPH BACH JBPATENTS.COM 17460 LAKEVIEW DRIVE MORGAN HILL CA 95037
Good, Services, and Codes
(CANCELLED) IC 009. US 021 023 026 036 038. G & S: Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors. FIRST USE: 19981100. FIRST USE IN COMMERCE: 19981100
International Codes:
9
U.S. Codes:
021,023,026,036,038
Type Code
Type
GS0091
Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors
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