OPTONICS

Dcg Systems, Inc

Application Filed: 2002-02-15
Trademark Application Details
Trademark Logo OPTONICS

Mark For: OPTONICS® trademark registration is intended to cover the categories of capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors. [all]

Status

2022-08-02 UTC
DEAD REGISTRATION Cancelled Invalidated
The trademark application was registered, but subsequently it was cancelled or invalidated and removed from the registry.


Research OneLook Acronym Finder
Serial Number76371349
Registration Number2809556
Mark Literal ElementsOPTONICS
Mark Drawing Type1 - TYPESET WORD(S) /LETTER(S) /NUMBER(S)
Mark TypeTRADEMARK
Standard Character ClaimNo
RegisterSUPPLEMENTAL
Current LocationSCANNING ON DEMAND 2007-06-09
Basis1(a)
Class StatusSECTION 8 - CANCEL
Primary US Classes
  • 021: Electrical Apparatus, Machines and Supplies
  • 023: Cutlery, Machinery, Tools and Parts Thereof
  • 026: Measuring and Scientific Appliances
  • 036: Musical Instruments and Supplies
  • 038: Prints and Publications
Primary International Class
  • 009 - Primary Class
  • (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed UseYes
Current UseYes
Intent To UseNo
Filed ITUNo
44D FiledNo
44E CurrentNo
66A CurrentNo
Current BasisNo
No BasisNo
Cancellation Code2
Attorney NameJoseph Bach
Attorney Docket Number2321
Law Office AssignedL30
Employee NameCROSS, TRACY L

Timeline

1998-11-00Date of First Use
1998-11-01Date of First Use
1998-11-01Date of Use In Commerce
2002-02-15Application Filed
2004-01-27Trademark Registered
2007-06-09Location: SCANNING ON DEMAND
2010-09-03Cancelled
2010-09-03Status: Dead/Cancelled
2010-09-03Status: Registration cancelled because registrant did not file an acceptable declaration under Section 8. To view all documents in this
2018-07-08Transaction Date

Trademark Parties (Applicants & Owners)

Party: DCG SYSTEMS, INC
Address45900 NORTHPORT LOOP EAST FREEMONT, CALIFORNIA UNITED STATES 94537
Legal Entity TypeCorporation
Legal Entity StateNo Place Where Organized Found

Attorney of Record

JOSEPH BACH
JBPATENTS.COM
17460 LAKEVIEW DRIVE
MORGAN HILL CA 95037

Good, Services, and Codes

(CANCELLED)
IC 009. US 021 023 026 036 038. G & S: Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors. FIRST USE: 19981100. FIRST USE IN COMMERCE: 19981100

International Codes:9
U.S. Codes:021,023,026,036,038
Type CodeType
GS0091Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors

Trademark Filing History

DescriptionDateProceeding Number
CANCELLED SEC. 8 (6-YR)2010-09-03
AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP2008-05-07
CASE FILE IN TICRS2007-06-09
AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP2007-05-02
REGISTERED-SUPPLEMENTAL REGISTER2004-01-27
EMAIL RECEIVED2003-11-24
APPROVED FOR REGISTRATION SUPPLEMENTAL REGISTER2003-11-21
EXAMINERS AMENDMENT MAILED2003-11-17
TEAS RESPONSE TO OFFICE ACTION RECEIVED2003-03-15
CORRESPONDENCE RECEIVED IN LAW OFFICE2003-03-15
NON-FINAL ACTION MAILED2003-02-28
PAPER RECEIVED2002-12-16
CORRESPONDENCE RECEIVED IN LAW OFFICE2002-12-16
TEAS RESPONSE TO OFFICE ACTION RECEIVED2002-12-14
TEAS CHANGE OF CORRESPONDENCE RECEIVED2002-12-14
NON-FINAL ACTION MAILED2002-07-08
ASSIGNED TO EXAMINER2002-06-2576503
ASSIGNED TO EXAMINER2002-06-1473370
ASSIGNED TO EXAMINER2002-06-1176503

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