Mark For: SASS® trademark registration is intended to cover the category of dIAGNOSTIC TEST APPARATUS FOR MEASUREMENT OF EQUIVALENT ELECTRICAL OXIDE THICKNESS (eEOT) ON DIELECTRIC LAYERS USED IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION. [all]
Status
2022-08-16 UTC
DEAD REGISTRATION Cancelled Invalidated
The trademark application was registered, but subsequently it was cancelled or invalidated and removed from the registry.
(Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use
Yes
Current Use
Yes
Intent To Use
No
Filed ITU
No
44D Filed
No
44E Current
No
66A Current
No
Current Basis
No
No Basis
No
Cancellation Code
2
Attorney Name
Cynthia E. Johnson
Attorney Docket Number
02695-028001
Law Office Assigned
M40
Employee Name
GILBERT, REBECCA L
Timeline
2001-05-29
Date of First Use
2001-05-29
Date of Use In Commerce
2001-09-07
Application Filed
2002-05-14
Published
2002-05-14
Published for Opposition
2002-08-06
Trademark Registered
2007-11-15
Location: SCANNING ON DEMAND
2009-05-09
Cancelled
2009-05-09
Status: Dead/Cancelled
2009-05-09
Status: Registration cancelled because registrant did not file an acceptable declaration under Section 8. To view all documents in this
CYNTHIA E. JOHNSON FISH & RICHARDSON P.C. 225 FRANKLIN ST BOSTON MA 02110-2804
Good, Services, and Codes
(CANCELLED) IC 009. US 021 023 026 036 038. G & S: DIAGNOST IC TEST APPARATUS FOR MEASUREMENT OF EQUIVALENT ELECTRICAL OXIDE THICKNESS (eEOT) ON DIELECTR IC LAYERS USED IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION. FIRST USE: 20010529. FIRST USE IN COMMERCE: 20010529
International Codes:
9
U.S. Codes:
021,023,026,036,038
Type Code
Type
GS0091
DIAGNOSTIC TEST APPARATUS FOR MEASUREMENT OF EQUIVALENT ELECTRICAL OXIDE THICKNESS (eEOT) ON DIELECTRIC LAYERS USED IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION
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Semiconductor Diagnostics, Inc.
Application
Registration Certificate
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