CENTERLINE

Advantech Manufacturing, Inc.

Application Filed: 1992-06-18
Trademark Application Details
Trademark Logo CENTERLINE

Mark For: CENTERLINE® trademark registration is intended to cover the categories of optical sieve measurement evaluations; namely, measuring applicant's and customers' test sieves against accepted norms so that such sieves can be accepted or rejected on the basis of their closeness to designated standards.

Status

2021-07-25 UTC
LIVE REGISTRATION Issued and Active
The trademark application has been registered with the Office.


Research OneLook Acronym Finder
Serial Number74285895
Registration Number1760468
Mark Literal ElementsCENTERLINE
Mark Drawing Type1 - TYPESET WORD(S) /LETTER(S) /NUMBER(S)
Mark TypeService Mark
Standard Character ClaimNo
Current LocationGENERIC WEB UPDATE 2013-09-19
Basis1(a)
Class StatusACTIVE
Primary International Class
  • 042 - Primary Class
  • (Computer, scientific & legal) Scientific and technological services and research and design relating thereto: industrial analysis and research services; design and development of computer hardware and software; legal services.
Filed UseYes
Current UseYes
Intent To UseNo
Filed ITUNo
44D FiledNo
44E CurrentNo
66A CurrentNo
Current BasisNo
No BasisNo
Attorney NameDaniel E. Kattman
Attorney Docket Number4526
Law Office AssignedJ30
Employee NameGOLD, BARBARA A

Timeline

1989-10-00Date of First Use
1989-10-01Date of First Use
1989-10-01Date of Use In Commerce
1992-06-18Application Filed
1992-12-29Published
1992-12-29Published for Opposition
1993-03-23Trademark Registered
2013-03-23Renewal Date
2013-09-19Location: GENERIC WEB UPDATE
2013-09-19Status: Live/Registered
2013-09-19Status: The registration has been renewed.
2018-07-08Transaction Date
2022-03-23Maintenance Early File Date
2023-03-23Maintenance On Time Date
2023-09-25Maintenance Late Fee Date

Trademark Parties (Applicants & Owners)

Party: ADVANTECH MANUFACTURING, INC.
Address645 SOUTH 94TH PLACE MILWAUKEE, WISCONSIN UNITED STATES 53214
Legal Entity TypeCorporation
Legal Entity StateWISCONSIN

Documents

Registration CertificateTIFF1993-03-23
Registration CertificateTIFF1993-03-23
Paper Correspondence IncomingMULTI2002-08-29
Paper Correspondence IncomingTIFF2002-08-29
File JacketJPEG2008-07-09
SpecimenJPEG2008-07-09
UnclassifiedMULTI2008-07-09
PR-Section 8 and 9MULTI2013-09-18
SpecimenJPEG2013-09-18
Notice-Acceptance-RenewalXML2013-09-19

Attorney of Record

Daniel E. Kattman
REINHART BOERNER VAN DEUREN SC
Suite 1900
1000 NORTH WATER STREET
MILWAUKEE WI 53201-2965

Good, Services, and Codes

International Codes:42
U.S. Codes:100
Type CodeType
GS0421optical sieve measurement evaluations; namely, measuring applicant's and customers' test sieves against accepted norms so that such sieves can be accepted or rejected on the basis of their closeness to designated standards

Trademark Filing History

DescriptionDateProceeding Number
REGISTERED AND RENEWED (SECOND RENEWAL - 10 YRS)2013-09-1969471
REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED2013-09-1969471
NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED2013-09-19
TEAS SECTION 8 & 9 RECEIVED2013-09-18
REGISTERED - COMBINED SECTION 8 (10-YR) & SEC. 9 FILED2013-09-1869471
CASE FILE IN TICRS2008-07-16
REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS)2002-11-16
REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED2002-11-16
REGISTERED - COMBINED SECTION 8 (10-YR) & SEC. 9 FILED2002-08-29
PAPER RECEIVED2002-08-29
REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.1998-07-07
REGISTERED - SEC. 8 (6-YR) & SEC. 15 FILED1998-04-20
REGISTERED-PRINCIPAL REGISTER1993-03-23
PUBLISHED FOR OPPOSITION1992-12-29
NOTICE OF PUBLICATION1992-11-27
APPROVED FOR PUB - PRINCIPAL REGISTER1992-10-17
EXAMINER'S AMENDMENT MAILED1992-10-09
NON-FINAL ACTION MAILED1992-10-01
ASSIGNED TO EXAMINER1992-09-1766384

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