Air quality measuring apparatus

Description

FIG. 1 is a perspective view of an air quality measuring apparatus, showing my new design;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a left side elevation view thereof;

FIG. 5 is a right side elevation view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a reference perspective view thereof showing a configuration of use.

The broken lines in FIGS. 3 and 8 show portions of the air quality measuring apparatus which form no part of the claimed design.

The word "NAVIEN" forming a part of the disclosure is a registered trademark of Kyungdong Navien Co., Ltd.

Claims

CLAIM I claim, the ornamental design for an air quality measuring apparatus, as shown and described.

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Inventors:	Cho; Jun Hyeong (Seoul, KR)
Applicant:	Name City State Country Type KYUNGDONG NAVIEN CO., LTD. Pyeongtaek-si N/A KR
Assignee:	KYUNGDONG NAVIEN CO., LTD. (Pyeongtaek-si, KR)
Appl. No.:	D/750,027
Filed:	September 10, 2020

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Foreign Application Priority Data

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Mar 10, 2020 [KR]			30-2020-0010826

Current U.S. Class:	D10/52; D10/53
Current International Class:	1004
Field of Search:	;D10/52,53

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References Cited [Referenced By]

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U.S. Patent Documents

D790367	June 2017	Krafft
D815962	April 2018	Sobczyk
D894022	August 2020	Guillien
D907514	January 2021	Lambert
D924080	July 2021	Duchosal
D942281	February 2022	Kim
D942872	February 2022	Zhang

Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Novick, Kim & Lee, PLLC Kim; Jae Youn Shin; Hyun Woo