Testing device

Description

FIG. 1 is a front elevational view of the testing device;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a left-side elevational view thereof;

FIG. 5 is a right-side elevational view thereof;

FIG. 6 is a front, top, right perspective view thereof; and,

FIG. 7 is a back, top, left perspective view thereof.

The evenly spaced broken lines depict unclaimed parts of the testing device and form no part of the claimed design.

Claims

CLAIM The ornamental design for a testing device, as shown and described.

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Inventors:	Matsumoto; Sigeru (Tokyo, JP), Miyashita; Hiroshi (Tokyo, JP), Tashiro; Kazuyoshi (Kanagawa, JP), Murauchi; Kazuhiro (Tokyo, JP)
Applicant:	Name City State Country Type KOKUSAI KEISOKUKI KABUSHIKI KAISHA Tama N/A JP
Assignee:	KOKUSAI KEISOKUKI KABUSHIKI KAISHA (Tama, JP)
Family ID:	70226409
Appl. No.:	D/722,239
Filed:	February 3, 2020

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Related U.S. Patent Documents

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	Application Number	Filing Date	Patent Number	Issue Date
	35505963	May 2, 2018	D881730

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Current U.S. Class:	D10/82
Current CPC Class:	G01R1/0416 20130101
Current International Class:	1004
Field of Search:	;D10/65,75,81-83 ;D15/199

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References Cited [Referenced By]

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U.S. Patent Documents

7629533	December 2009	Cole, Sr. et al.
D638952	May 2011	Oonuma et al.
D712447	September 2014	He et al.
D787695	May 2017	Mottscheller
D796360	September 2017	Schulz et al.
D801202	October 2017	Johnston
D823149	July 2018	Schulze
10156586	December 2018	Adams et al.
D840847	February 2019	Doi et al.
10209272	February 2019	Li et al.
D842726	March 2019	Weaver et al.
D847676	May 2019	Matsumiya et al.
D848882	May 2019	Matsumiya et al.
D848883	May 2019	Matsumiya et al.
D869969	December 2019	Matsumoto et al.
D881730	April 2020	Matsumoto

Primary Examiner: Chilcot; Richard E
Attorney, Agent or Firm: Oliff PLC

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