Door latch for semiconductor manufacturing equipment

Description

FIG. 1 is a front, top and right side perspective view of a door latch for semiconductor manufacturing equipment showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof.

FIG. 7 is a rear elevational view thereof;

FIG. 8 is a cross-sectional view take along line 8-8 in FIG. 2 thereof; and,

FIG. 9 is a perspective illustration indicating the state that a lock was opened.

The broken lines are included for the purpose of illustrating portions of the article that form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for a door latch for semiconductor manufacturing equipment, as shown and described.

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Inventors:	Sambu; Makoto (Toyama, JP), Fujii; Satoshi (Toyama, JP)
Applicant:	Name City State Country Type KOKUSAI ELECTRIC CORPORATION Tokyo N/A JP
Assignee:	KOKUSAI ELECTRIC CORPORATION (Tokyo, JP)
Appl. No.:	D/694,323
Filed:	June 10, 2019

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Foreign Application Priority Data

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Dec 14, 2018 [JP]			2018-027249

Current U.S. Class:	D8/331
Current International Class:	0807
Field of Search:	;D8/330-333,336,338,343-346,300-302,306-329 ;70/91,277,336,280,14,51,52,57.1,67,69,78,85,86,88,141 ;292/340-346,180

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References Cited [Referenced By]

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U.S. Patent Documents

1800662	April 1931	Rush
D281947	December 1985	Greco
D290684	July 1987	Wildgen
D301972	July 1989	Lozano
D303754	October 1989	Weinerman
D324167	February 1992	Greco
5158244	October 1992	Gelardi
D365744	January 1996	Leung
5725262	March 1998	Kritzler
D493690	August 2004	Melin
D495235	August 2004	Burrows
D891915	August 2020	Grewe
2020/0064399	February 2020	Ponghon

Foreign Patent Documents

	3052630		Dec 1995		CN
	4045668		Jul 2016		GB
	D1414452		Sep 2010		JP
	D1587764		May 2016		JP
	D1627028		Sep 2018		JP
	300725276.0000		Jan 2013		KR
	301058926.0000		May 2019		KR

Primary Examiner: Hill; Keli L
Assistant Examiner: Sahneh; Sara S
Attorney, Agent or Firm: Fitch, Even, Tabin & Flannery, LLP

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