Instrument cluster with displayed image design
Park , et al. April 6, 2
U.S. patent number D915,259 [Application Number D/756,659] was granted by the patent office on 2021-04-06 for instrument cluster with displayed image design. This patent grant is currently assigned to Hyundai Mobis Co., Ltd.. The grantee listed for this patent is Hyundai Mobis Co., Ltd.. Invention is credited to Jin Yung Bae, Hyung Soo Kim, Min Hee Kim, Bo Young Park.
| United States Patent | D915,259 |
| Park , et al. | April 6, 2021 |
Instrument cluster with displayed image design
Claims
CLAIM The ornamental design for an instrument cluster with displayed image design, as shown and described.
| Inventors: | Park; Bo Young (Seongnam-si, KR), Kim; Hyung Soo (Seongnam-si, KR), Kim; Min Hee (Yongin-si, KR), Bae; Jin Yung (Yongin-si, KR) | ||||||||||
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| Applicant: |
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| Assignee: | Hyundai Mobis Co., Ltd. (Seoul,
KR) |
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| Appl. No.: | D/756,659 | ||||||||||
| Filed: | October 29, 2020 |
Related U.S. Patent Documents
| Application Number | Filing Date | Patent Number | Issue Date | ||
|---|---|---|---|---|---|
| 29631338 | Dec 29, 2017 | ||||
Foreign Application Priority Data
| Dec 4, 2017 [KR] | 30-2017-0057178 | |||
| Current U.S. Class: | D12/192 |
| Current International Class: | 1216 |
| Field of Search: | ;D12/192,415,114,345 ;D15/17,28 ;D10/46,98,102-103,122-12 ;D23/324 |
References Cited [Referenced By]
U.S. Patent Documents
| 9403489 | August 2016 | Angeletti |
| D778250 | February 2017 | Owens |
| D792362 | July 2017 | Maxwell |
| D815002 | April 2018 | Niemiec |
| D839158 | January 2019 | Buttery |
| D840304 | February 2019 | Kang |
| D849622 | May 2019 | Woodhouse |
| D856880 | August 2019 | Tomasson |
| D867948 | November 2019 | Engelmann |
| 2014/0125876 | May 2014 | Nakayama |
| 2015/0001870 | January 2015 | Parcher |
| 2017/0274773 | September 2017 | Woodhouse |
| 2017/0315354 | November 2017 | Park |
Attorney, Agent or Firm: H.C. Park & Associates, PLC
Description
FIG. 1 is a front view of an instrument cluster with displayed image design showing our new design; and,
FIG. 2 is an enlarged view of FIG. 1.
The broken lines shown in FIG. 1 illustrate portions of the instrument cluster that form no part of the claimed design.
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