Particle characterization device
Cross , et al.
U.S. patent number D878,227 [Application Number 35/504,661] was granted by the patent office on 2020-03-17 for particle characterization device. The grantee listed for this patent is MALVERN INSTRUMENTS LIMITED. Invention is credited to David Boyce, John Cross, Chris Langley, Mark Shadbolt.
| United States Patent | D878,227 |
| Cross , et al. | March 17, 2020 |
Particle characterization device
Claims
CLAIM We claim the ornamental design for a particle characterization device, as shown and described.
| Inventors: | Cross; John (Warwick, GB), Boyce; David (Warwick, GB), Langley; Chris (Warwick, GB), Shadbolt; Mark (Malvern, GB) | ||||||||||
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| Applicant: |
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| Appl. No.: | 35/504,661 | ||||||||||
| Filed: | December 13, 2017 |
International Registration
| Int'l Reg. No. | Int'l Reg. Date | Int'l Reg. Publication Date |
Hague Int'l Filing Date |
|---|---|---|---|
| DM/100202 | Dec 13, 2017 | Mar 23, 2018 | Dec 13, 2017 |
| Current U.S. Class: | D10/81 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/81,46 ;D24/216 |
References Cited [Referenced By]
U.S. Patent Documents
| D644544 | September 2011 | Yukikado |
| D665917 | August 2012 | TerMaat |
| D683642 | June 2013 | Buesser |
| D722515 | February 2015 | Zock |
| D758221 | June 2016 | Fujiwara |
| D762133 | July 2016 | Derocher |
| D796979 | September 2017 | Delavy |
| D797587 | September 2017 | Delavy |
| D800000 | October 2017 | Barton |
| D830210 | October 2018 | Ihara |
| D838198 | January 2019 | Kimura |
Description
1. Particle characterization device
1.1 is a bottom view.
1.2 is a rear view.
1.3 is a front view.
1.4 is a side view.
1.5 is a front perspective view.
1.6 is a side view of the opposite side of 1.4.
1.7 is a top view.
The broken lines shown in the drawings illustrate portions that form no part of the claimed design.
The dash-dot lines shown in the drawings represent the bounds of the claimed design.
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