U.S. patent number D847,099 [Application Number D/613,375] was granted by the patent office on 2019-04-30 for measuring device for monitoring the state of industrial machine.
This patent grant is currently assigned to OMRON Corporation. The grantee listed for this patent is OMRON Corporation. Invention is credited to Aiki Kora, Takuya Nakada, Koyuru Nakano, Tadahiko Ogawa, Shohei Shimahara, Yukiyoshi Yamamoto.
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United States Patent |
D847,099 |
Nakada , et al. |
April 30, 2019 |
Measuring device for monitoring the state of industrial machine
Claims
CLAIM The ornamental design for a measuring device for monitoring
the state of industrial machine, as shown and described.
Inventors: |
Nakada; Takuya (Suita,
JP), Yamamoto; Yukiyoshi (Aso, JP), Kora;
Aiki (Osaka, JP), Shimahara; Shohei (Kusatsu,
JP), Nakano; Koyuru (Nara, JP), Ogawa;
Tadahiko (Moriyama, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
OMRON Corporation |
Kyoto-shi, Kyoto |
N/A |
JP |
|
|
Assignee: |
OMRON Corporation (Kyoto,
JP)
|
Appl.
No.: |
D/613,375 |
Filed: |
August 9, 2017 |
Foreign Application Priority Data
|
|
|
|
|
Feb 14, 2017 [JP] |
|
|
2017-002791 |
|
Current U.S.
Class: |
D13/159 |
Current International
Class: |
1303 |
Field of
Search: |
;D10/46,75
;D13/110,123,133,147,154,158,159,160,173,184,199 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Capitol City TechLaw
Description
FIG. 1 is a front, top, and right side perspective view of a
measuring device for monitoring the state of industrial machine
showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
The broken lines shown in the figures illustrate portions of the
measuring device for monitoring the state of industrial machine
that form no part of the claimed design.
* * * * *