U.S. patent number D839,756 [Application Number D/640,013] was granted by the patent office on 2019-02-05 for temperature measurement control device.
This patent grant is currently assigned to Shenzhen Riitek Technology Co., Ltd.. The grantee listed for this patent is Shenzhen Riitek Technology Co., LTD.. Invention is credited to Junkui Chen, Xianyong Pang.
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United States Patent |
D839,756 |
Pang , et al. |
February 5, 2019 |
Temperature measurement control device
Claims
CLAIM The ornamental design for a temperature measurement control
device, as shown and described.
Inventors: |
Pang; Xianyong (Shenzhen,
CN), Chen; Junkui (Shenzhen, CN) |
Applicant: |
Name |
City |
State |
Country |
Type |
Shenzhen Riitek Technology Co., LTD. |
Shenzhen, Guangdong |
N/A |
CN |
|
|
Assignee: |
Shenzhen Riitek Technology Co.,
Ltd. (Shenzhen, Guangdong, CN)
|
Appl.
No.: |
D/640,013 |
Filed: |
March 11, 2018 |
Current U.S.
Class: |
D10/52;
D10/78 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/52,53,55,56,57,78 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Chan; Raymond Y. David and Raymond
Patent Firm
Description
FIG. 1 is a perspective view of the temperature measurement control
device showing my new design;
FIG. 2 is a front view of the temperature measurement control
device;
FIG. 3 is a rear view of the temperature measurement control
device;
FIG. 4 is a left view of the temperature measurement control
device;
FIG. 5 is a right view of the temperature measurement control
device;
FIG. 6 is a top view of the temperature measurement control device;
and,
FIG. 7 is a bottom view of the temperature measurement control
device.
* * * * *