Temperature measurement control device

Pang , et al. Fe

Patent Grant D839756

U.S. patent number D839,756 [Application Number D/640,013] was granted by the patent office on 2019-02-05 for temperature measurement control device. This patent grant is currently assigned to Shenzhen Riitek Technology Co., Ltd.. The grantee listed for this patent is Shenzhen Riitek Technology Co., LTD.. Invention is credited to Junkui Chen, Xianyong Pang.


United States Patent D839,756
Pang ,   et al. February 5, 2019

Temperature measurement control device

Claims

CLAIM The ornamental design for a temperature measurement control device, as shown and described.
Inventors: Pang; Xianyong (Shenzhen, CN), Chen; Junkui (Shenzhen, CN)
Applicant:
Name City State Country Type

Shenzhen Riitek Technology Co., LTD.

Shenzhen, Guangdong

N/A

CN
Assignee: Shenzhen Riitek Technology Co., Ltd. (Shenzhen, Guangdong, CN)
Appl. No.: D/640,013
Filed: March 11, 2018

Current U.S. Class: D10/52; D10/78
Current International Class: 1004
Field of Search: ;D10/52,53,55,56,57,78

References Cited [Referenced By]

U.S. Patent Documents
4601589 July 1986 Meisner
6568848 May 2003 Chapman
7201099 April 2007 Harris, Jr.
D684490 June 2013 Nelson
D684491 June 2013 Confield
D694141 November 2013 Lienenkamp
D723404 March 2015 Faulkner
10074255 September 2018 Prabhakar
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Chan; Raymond Y. David and Raymond Patent Firm

Description



FIG. 1 is a perspective view of the temperature measurement control device showing my new design;

FIG. 2 is a front view of the temperature measurement control device;

FIG. 3 is a rear view of the temperature measurement control device;

FIG. 4 is a left view of the temperature measurement control device;

FIG. 5 is a right view of the temperature measurement control device;

FIG. 6 is a top view of the temperature measurement control device; and,

FIG. 7 is a bottom view of the temperature measurement control device.

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Patent Diagrams and Documents

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