U.S. patent number D839,116 [Application Number 35/504,111] was granted by the patent office on 2019-01-29 for spectrometer.
This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masaki Hirose, Takashi Kasahara, Katsuhiko Kato, Toshimitsu Kawai, Hiroki Oyama, Katsumi Shibayama, Yumi Teramachi, Takafumi Yokino.
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United States Patent |
D839,116 |
Hirose , et al. |
January 29, 2019 |
Spectrometer
Claims
CLAIM The ornamental design for a spectrometer, as shown and
described.
Inventors: |
Hirose; Masaki (Hamamatsu,
JP), Shibayama; Katsumi (Hamamatsu, JP),
Kasahara; Takashi (Hamamatsu, JP), Kawai;
Toshimitsu (Hamamatsu, JP), Oyama; Hiroki
(Hamamatsu, JP), Teramachi; Yumi (Hamamatsu,
JP), Yokino; Takafumi (Hamamatsu, JP),
Kato; Katsuhiko (Hamamatsu, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
HAMAMATSU PHOTONICS K.K. |
Shizuoka |
N/A |
JP |
|
|
Assignee: |
HAMAMATSU PHOTONICS K.K.
(Hamamatsu-shi, Shizuoka, JP)
|
Appl.
No.: |
35/504,111 |
Filed: |
June 6, 2017 |
International Registration
Int'l Reg. No. |
Int'l Reg. Date |
Int'l Reg.
Publication Date |
Hague Int'l
Filing Date |
DM/096394 |
Jun 6, 2017 |
Dec 8, 2017 |
Jun 6, 2017 |
Foreign Application Priority Data
|
|
|
|
|
Dec 28, 2016 [JP] |
|
|
2016-028540 |
|
Current U.S.
Class: |
D10/81 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/81,47
;D13/158,159,160 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Kirschbaum; George D.
Description
1. Spectrometer
1.1 : Perspective
1.2 : Front
1.3 : Back
1.4 : Top
1.5 : Bottom
1.6 : Left
1.7 : Right
1.8 : Partial enlarged cross-sectional view
1.9 : Partial enlarged top view
1.10 : Partial enlarged perspective view
The broken line showing is included for the purpose of illustrating
portions of the "article" and forms no part of the claimed
design.
* * * * *