U.S. patent number D835,293 [Application Number D/586,483] was granted by the patent office on 2018-12-04 for gene analysis apparatus.
This patent grant is currently assigned to Hitachi High-Technologies Corporation. The grantee listed for this patent is Hitachi High-Technologies Corporation. Invention is credited to Hiroyuki Higashino, Ai Masuda, Jin Matsumura, Hiroyuki Noda, Motohiro Yamazaki.
United States Patent |
D835,293 |
Masuda , et al. |
December 4, 2018 |
Gene analysis apparatus
Claims
CLAIM The ornamental design for a gene analysis apparatus, as shown
and described.
Inventors: |
Masuda; Ai (Tokyo,
JP), Noda; Hiroyuki (Tokyo, JP), Higashino;
Hiroyuki (Tokyo, JP), Matsumura; Jin (Tokyo,
JP), Yamazaki; Motohiro (Tokyo, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
Hitachi High-Technologies Corporation |
Minato-ku, Tokyo |
N/A |
JP |
|
|
Assignee: |
Hitachi High-Technologies
Corporation (Tokyo, JP)
|
Appl.
No.: |
D/586,483 |
Filed: |
December 5, 2016 |
Foreign Application Priority Data
|
|
|
|
|
Jun 7, 2016 [JP] |
|
|
2016-012099 |
|
Current U.S.
Class: |
D24/232 |
Current International
Class: |
2401 |
Field of
Search: |
;D24/107,169,185,186,216-219,231-234 ;D10/81 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Crowell & Moring LLP
Description
FIG. 1 is a front and top perspective view of a gene analysis
apparatus according to the design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a left side elevational view thereof;
FIG. 8 is a cross-sectional view taken along line 8-8 of FIG. 2;
and,
FIG. 9 is a front and top perspective view showing the door in an
open position.
The broken lines in the drawings depict unclaimed environmental
subject matter.
* * * * *