Diagnostic analyzer

Description

FIG. 1 is a front left perspective view of a diagnostic analyzer.

FIG. 2 is a front view of the diagnostic analyzer of FIG. 1.

FIG. 3 is a rear view of the diagnostic analyzer of FIGS. 1 or 8.

FIG. 4 is a right side view of the diagnostic analyzer of FIGS. 1 or 8.

FIG. 5 is a left side view of the diagnostic analyzer of FIGS. 1 or 8.

FIG. 6 is a top view of the diagnostic analyzer of FIG. 1.

FIG. 7 is a bottom view of the diagnostic analyzer of FIGS. 1 or 8.

FIG. 8 is a front left perspective view of a diagnostic analyzer.

FIG. 9 is a front view of the diagnostic analyzer of FIG. 8; and,

FIG. 10 is a top view of the diagnostic analyzer of FIG. 8.

The features shown in broken lines form no part of the claimed design.

Claims

CLAIM The ornamental design for a "diagnostic analyzer," as shown and described.

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Inventors:	Barton; Christina A. (Irving, TX), Wallace; Rachel Elizabeth (Madison, WI), Verhalen; Ami Marie (Sun Prairie, WI), Nett; Daniel Roger (Sun Prairie, WI)
Applicant:	Name City State Country Type Abbott Laboratories Abbott Park IL US
Assignee:	Abbott Laboratories (Abbott Park, IL)
Appl. No.:	D/531,603
Filed:	June 26, 2015

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Current U.S. Class:	D24/232
Current International Class:	2401
Field of Search:	;D24/216-219,231,232,233,107,169,186 ;D10/81

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References Cited [Referenced By]

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U.S. Patent Documents

D319307	August 1991	Sakagami
D346027	April 1994	Kobayashi
D351025	September 1994	Yamashita
D354354	January 1995	Yamashita
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D662431	June 2012	Kimura
D672471	December 2012	Franco
D676568	February 2013	Liu
D715456	October 2014	Oonuma
D716966	November 2014	Lizari Illarramendi
D721820	January 2015	Oonuma et al.
D724753	March 2015	Gutmann
D728124	April 2015	Oonuma
D729399	May 2015	Oonuma et al.
D736402	August 2015	Gutmann
D777049	January 2017	Barton et al.
D800000	October 2017	Barton et al.
D802785	November 2017	Barton et al.
2002/0169518	November 2002	Luoma, II
2013/0034466	February 2013	Wakamiya
2013/0288355	October 2013	DeWitte
2015/0140577	May 2015	Li
2015/0276566	October 2015	Berntsen

Other References

Notification of the Registration of the Community Designs, issued by the Office for Harmonization in The Internal Market, in connection with European Community Design Nos. 002930230-0001 through 002930230-0029, dated Mar. 17, 2016, 6 pages. cited by applicant . Notification of the Registration of the Community Designs, issued by the European Union Intellectual Property Office, in connection with European Community Design Nos. 003003631-0001 through 003003631-0014, dated Apr. 28, 2016, 5 pages. cited by applicant . Notice for Reasons for Rejection, English Language, issued by the Intellectual Property Office of Japan, in connection with Japanese application No. 2015-28871, dated Jun. 14, 2016, 5 pages. cited by applicant . Japanese Patent Office, "Notice of Reason for Rejection," issued in connection with Japanese Design Application No. 2016-1034, dated Sep. 6, 2016, 5 pages. cited by applicant . State Intellectual Property Office of China, "First Office Action," issued in connection with Chinese Application No. 201530555269.1, dated Oct. 9, 2016, 3 pages. cited by applicant . Japanese Patent Office, "Notice of Reason for Rejection," issued in connection with Japanese Design Application No. 2016-22301, dated Nov. 8, 2016, 4 pages. cited by applicant . United States Patent and Trademark Office, "Restriction and/or Election Requirement," issued in connection with U.S. Appl. No. 29/505,590, dated Oct. 13, 2016, 27 pages. cited by applicant . United States Patent and Trademark Office, "Restriction Requirement," issued in connection with U.S. Appl. No. 29/505,590, dated Oct. 13, 2016, 27 pages. cited by applicant . Notification of First Corrections, issued by the State Intellectual Property Office of the P.R. China, in connection with Chinese Patent Application No. 201530555269.1, dated Apr. 25, 2016, 4 pages. cited by applicant . United States Patent and Trademark Office, "Non-Final Office Action," issued in connection with U.S. Appl. No. 29/602,019, dated Jan. 17, 2018, 15 pages. cited by applicant.

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Hanley, Flight & Zimmerman, LLC