Array of triangular semiconductor dies

Description

FIG 1 is a first embodiment of a top plan view of an array of triangular semiconductor dies showing our new design;

FIG. 2 is a front perspective view thereof;

FIG. 3 is a rear perspective view thereof;

FIG. 4 is a second embodiment of a top plan view of an array of triangular semiconductor dies showing our new design;

FIG. 5 is a front perspective view thereof;

FIG. 6 is a rear perspective view thereof;

FIG. 7 is a third embodiment of a top plan view of an array of triangular semiconductor dies showing our new design;

FIG. 8 is a front perspective view thereof;

FIG. 9 is a rear perspective view thereof;

FIG. 10 is a fourth embodiment of a top plan view of an array of triangular semiconductor dies showing our new design;

FIG. 11 is a front perspective view thereof;

FIG. 12 is a rear perspective view thereof;

FIG. 13 is a fifth embodiment of a top plan view of an array of triangular semiconductor dies showing our new design;

FIG. 14 is a front perspective view thereof; and,

FIG. 15 is a rear perspective view thereof.

The broken lines in the figures represent unclaimed subject matter and form no part of the claimed design. The separations between the top and bottom layers of the triangle and the brackets around the space indicate that no particular length is claimed.

Claims

CLAIM The ornamental design for an array of triangular semiconductor dies, as shown and described.

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Inventors:	Sharma; Rajat (Fremont, CA), Felker; Andrew (Fremont, CA), Houck; William D. (Fremont, CA)
Applicant:	Name City State Country Type SORAA, INC. Fremont CA US
Assignee:	Soraa, Inc. (Freemont, CA)
Appl. No.:	D/539,504
Filed:	September 15, 2015

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Related U.S. Patent Documents

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	Application Number	Filing Date	Patent Number	Issue Date
	29441116	Dec 31, 2012	D739363
	13357578	Jan 24, 2012	9450143
	13163482	Oct 23, 2012	8293551

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Current U.S. Class:	D13/182
Current International Class:	1303
Field of Search:	;D13/110,182,184 ;361/679.01,728,761,820,718,748,752,783 ;257/668,678,684 ;324/71.5,252 ;29/825,829,830,831,832,846 ;174/68.1,250-261,268 ;216/13 ;428/901

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References Cited [Referenced By]

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U.S. Patent Documents

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Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Saul Ewing Arnstein & Lehr LLP