Probe pin

Description

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof, a rear elevational view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the PROBE PIN that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.

Claims

CLAIM The ornamental design for a probe pin, as shown and described.

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Inventors:	Teranishi; Hirotada (Osaka, JP), Sakai; Takahiro (Moriyama, JP), Kondo; Makoto (Moriyama, JP)
Applicant:	Name City State Country Type OMRON Corporation Kyoto-shi, Kyoto N/A JP
Assignee:	OMRON Corporation (Kyoto-shi, JP)
Appl. No.:	D/563,345
Filed:	May 4, 2016

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Foreign Application Priority Data

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Nov 12, 2015 [JP]			2015-025354

Current U.S. Class:	D10/78; D10/80
Current International Class:	1004
Field of Search:	;D10/78,80

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References Cited [Referenced By]

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U.S. Patent Documents

6784680	August 2004	Haga
7190179	March 2007	Haga

Other References

US. Appl. No. 29/563,343, filed May 4, 2016; Teranishi et al. cited by applicant . U.S. Appl. No. 29/563,347, filed May 4, 2016; Teranishi et al. cited by applicant.

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Sterne, Kessler, Goldstein & Fox P.L.L.C.