Metrology training device
Maxted , et al. June 13, 2
U.S. patent number D789,450 [Application Number D/506,251] was granted by the patent office on 2017-06-13 for metrology training device. This patent grant is currently assigned to RENISHAW PLC. The grantee listed for this patent is RENISHAW PLC. Invention is credited to Stuart Howell, Paul Maxted.
| United States Patent | D789,450 |
| Maxted , et al. | June 13, 2017 |
Metrology training device
Claims
CLAIM The ornamental design for a metrology training device, as shown and described.
| Inventors: | Maxted; Paul (Bristol, GB), Howell; Stuart (Bristol, GB) | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Applicant: |
|
||||||||||
| Assignee: | RENISHAW PLC
(Wotton-Under-Edge, GB) |
||||||||||
| Appl. No.: | D/506,251 | ||||||||||
| Filed: | October 14, 2014 |
Foreign Application Priority Data
| Apr 11, 2014 [EP] | 002445510-0001 | |||
| Apr 11, 2014 [EP] | 002445510-0002 | |||
| Apr 11, 2014 [EP] | 002445510-0003 | |||
| Apr 11, 2014 [EP] | 002445510-0004 | |||
| Current U.S. Class: | D19/62 |
| Current International Class: | 1907 |
| Field of Search: | ;D19/59-64,136 ;434/187,205,211,213-216,304,394 ;D21/577,622-623,632,648,47-480 ;273/153R,157R,155-156,149R ;446/97,292,321 ;D30/121 ;29/108 ;D6/302 ;D2/961 ;D10/8,64,74 |
References Cited [Referenced By]
U.S. Patent Documents
| D193659 | September 1962 | Matricardi |
| D219216 | November 1970 | Speers |
| 4487585 | December 1984 | Goldwasser |
| D397382 | August 1998 | Gensler |
| D429775 | August 2000 | Adelman |
| 6354841 | March 2002 | Bradt |
| D480116 | September 2003 | Collins |
| D589708 | April 2009 | Marek |
| D611985 | March 2010 | Puglisi |
| D627550 | November 2010 | Zhang |
| 8020867 | September 2011 | Cheng |
| 8602833 | December 2013 | Binder |
| D698095 | January 2014 | Paculdo |
| D734896 | July 2015 | Mam |
| D737905 | September 2015 | Klemm |
| D754801 | April 2016 | Fox |
| D759166 | June 2016 | Fox |
| 9403084 | August 2016 | Klemm |
| 2005/0184459 | August 2005 | Marantz |
| 2005/0200076 | September 2005 | Wu |
| 2007/0164513 | July 2007 | Gelman |
Other References
|
<https://www.youtube.com/watch?v=mYsAEwbEqyE> uploaded on May 26, 2014. cited by applicant. |
Primary Examiner: Simmons; Ian
Assistant Examiner: Cavanna; Mark
Attorney, Agent or Firm: Oliff PLC
Description
FIG. 1 is a top, front, right-side perspective view of the metrology training device;
FIG. 2 is a front plan view thereof;
FIG. 3 is a back plan view thereof;
FIG. 4 is a left-side elevational view thereof;
FIG. 5 is a right-side elevational view thereof;
FIG. 6 is a top elevational view thereof; and,
FIG. 7 is a bottom elevational view thereof.
The broken lines depict portions that form no part of the claimed design.
* * * * *
References
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 