Modular test instrument

Description

FIG. 1 is an oblique view, taken from the front and from above, of a first variant of a modular test instrument showing my new design;

FIG. 2 is another oblique view thereof, taken from the rear and from below;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a right sider elevation view thereof;

FIG. 7 is a top plan view thereof;

FIG. 8 is a bottom plan thereof;

FIG. 9 is an oblique view, taken from the front and from above, of a second variant of a modular test instrument showing my new design;

FIG. 10 is another oblique view thereof, taken from the rear and from below;

FIG. 11 is a front elevation view thereof;

FIG. 12 is a rear elevation view thereof;

FIG. 13 is a left side elevation view thereof;

FIG. 14 is a right sider elevation view thereof;

FIG. 15 is a top plan view thereof; and,

FIG. 16 is a bottom plan thereof.

The dashed line showing of structural lines is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design. Line shading is used to better illustrate the three-dimensional contours of portions of the modular test instrument. Solid black, and horizontal stippled hashing surface treatment is used to show contrast between a dark tone and a light tone, respectively, in accordance with 37 CFR 1.152, MPEP 1503.02 (II and IV), and MPEP 608.02 IX.

Claims

CLAIM The ornamental design for a modular test instrument, as shown and described.

---

Inventors:	Lafrance; Denis (Quebec, CA), Michaud; Antoine-Alexandre (Quebec, CA)
Applicant:	Name City State Country Type EXFO INC. Quebec N/A CA
Assignee:	EXFO INC. (Quebec, CA)
Appl. No.:	D/554,373
Filed:	February 11, 2016

---

Current U.S. Class:	D10/75; D10/81
Current International Class:	1004
Field of Search:	;D10/75,76,81

---

References Cited [Referenced By]

---

U.S. Patent Documents

D343799	February 1994	Spinks
D362845	October 1995	Ito
D573047	July 2008	Chen
D573048	July 2008	Chen
D573049	July 2008	Chen
D693712	November 2013	Noda
D693714	November 2013	Noda
D699609	February 2014	Noda

Other References

Exfo Inc., "IQS-600 Integrated Qualification System", 2013 all pages, Canada. cited by applicant.

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Norton Rose Fulbright Canada LLP Daoust; Alexandre