U.S. patent number D769,750 [Application Number D/557,790] was granted by the patent office on 2016-10-25 for probe pin.
This patent grant is currently assigned to OMRON Corporation. The grantee listed for this patent is OMRON Corporation. Invention is credited to Makoto Kondo, Takahiro Sakai, Hirotada Teranishi.
United States Patent |
D769,750 |
Teranishi , et al. |
October 25, 2016 |
Probe pin
Claims
CLAIM The ornamental design for a probe pin, as shown and
described.
Inventors: |
Teranishi; Hirotada (Osaka,
JP), Sakai; Takahiro (Moriyama, JP), Kondo;
Makoto (Moriyama, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
OMRON Corporation |
Kyoto-shi, Kyoto |
N/A |
JP |
|
|
Assignee: |
OMRON Corporation (Kyoto,
JP)
|
Appl.
No.: |
D/557,790 |
Filed: |
March 11, 2016 |
Foreign Application Priority Data
|
|
|
|
|
Sep 15, 2015 [JP] |
|
|
2015-020449 |
|
Current U.S.
Class: |
D10/78 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/78,80
;D13/133,154 |
References Cited
[Referenced By]
U.S. Patent Documents
Other References
US. Appl. No. 29/557,788, filed Mar. 11, 2016; Teranishi et al.
cited by applicant.
|
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Sterne, Kessler, Goldstein &
Fox P.L.L.C.
Description
FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
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