Probe pin
Teranishi , et al. October 25, 2
U.S. patent number D769,750 [Application Number D/557,790] was granted by the patent office on 2016-10-25 for probe pin. This patent grant is currently assigned to OMRON Corporation. The grantee listed for this patent is OMRON Corporation. Invention is credited to Makoto Kondo, Takahiro Sakai, Hirotada Teranishi.
| United States Patent | D769,750 |
| Teranishi , et al. | October 25, 2016 |
Probe pin
Claims
CLAIM The ornamental design for a probe pin, as shown and described.
| Inventors: | Teranishi; Hirotada (Osaka, JP), Sakai; Takahiro (Moriyama, JP), Kondo; Makoto (Moriyama, JP) | ||||||||||
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| Applicant: |
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| Assignee: | OMRON Corporation (Kyoto,
JP) |
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| Appl. No.: | D/557,790 | ||||||||||
| Filed: | March 11, 2016 |
Foreign Application Priority Data
| Sep 15, 2015 [JP] | 2015-020449 | |||
| Current U.S. Class: | D10/78 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/78,80 ;D13/133,154 |
References Cited [Referenced By]
U.S. Patent Documents
| D229184 | November 1973 | Brown et al. |
| D507197 | July 2005 | Sun |
| D662895 | July 2012 | Kimura |
| D665744 | August 2012 | Yamauchi |
| D665745 | August 2012 | Yamauchi |
| 8366496 | February 2013 | Hsu |
| 8460010 | June 2013 | Kimura |
| 8669774 | March 2014 | Kato |
| 8808038 | August 2014 | Hwang |
| 9130290 | September 2015 | Sakai |
| 9207260 | December 2015 | Ogasawara |
| D749968 | February 2016 | Huang |
| D750987 | March 2016 | Huang |
| 9322846 | April 2016 | Sakai |
Other References
|
US. Appl. No. 29/557,788, filed Mar. 11, 2016; Teranishi et al. cited by applicant. |
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Sterne, Kessler, Goldstein & Fox P.L.L.C.
Description
FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
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