Grain inspection device

Description

FIG. 1 is a left front perspective view of a grain inspection device showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines in the drawings are included for the purpose of illustrating portions of the grain inspection device and form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for a grain inspection device, as shown and described.

---

Inventors:	Matsushima; Hideaki (Tokyo, JP), Ishizuki; Hiroki (Tokyo, JP), Ikeda; Manabu (Tokyo, JP), Zheng; Jun (Tokyo, JP)
Applicant:	Name City State Country Type SATAKE CORPORATION Tokyo N/A JP
Assignee:	Satake Corporation (JP)
Appl. No.:	D/469,414
Filed:	October 10, 2013

---

Foreign Application Priority Data

---

Apr 18, 2013 [JP]			2013-008778

Current U.S. Class:	D15/28
Current International Class:	1503
Field of Search:	;D15/5,10-33,141,138,147,148 ;460/119 ;209/137,147,21,22,241,242,250,257,262,281,296,305,715 ;222/55

---

References Cited [Referenced By]

---

U.S. Patent Documents

D367023	February 1996	Benson
D565617	April 2008	Chang et al.
D576639	September 2008	Uenohara
D654937	February 2012	Fader et al.
D712936	September 2014	Wilhelmi et al.

Foreign Patent Documents

	1144560		Jun 2002		JP
	1193353		Jan 2004		JP
	1206499		May 2004		JP

Primary Examiner: Ramirez; Cynthia
Assistant Examiner: Colan; Gino
Attorney, Agent or Firm: Lerner, David, Littenberg, Krumholz & Mentlik, LLP