Microscope base and arm
Hofmann , et al. November 17, 2
U.S. patent number D743,463 [Application Number D/494,792] was granted by the patent office on 2015-11-17 for microscope base and arm. This patent grant is currently assigned to Carl Zeiss Microscopy GmbH. The grantee listed for this patent is Carl Zeiss Microscopy GmbH. Invention is credited to Kerstin Hofmann, Axel Laschke, Ilka Schlesiger, Martin Stohr, Michael Winterot.
| United States Patent | D743,463 |
| Hofmann , et al. | November 17, 2015 |
Microscope base and arm
Claims
CLAIM We claim the ornamental design for a microscope base and arm, as shown and described.
| Inventors: | Hofmann; Kerstin (Goettingen, DE), Laschke; Axel (Waake, DE), Schlesiger; Ilka (Jena, DE), Winterot; Michael (Jena, DE), Stohr; Martin (Jena, DE) | ||||||||||
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| Applicant: |
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| Assignee: | Carl Zeiss Microscopy GmbH
(Jena, DE) |
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| Appl. No.: | D/494,792 | ||||||||||
| Filed: | June 24, 2014 |
Foreign Application Priority Data
| Apr 3, 2014 [EM] | 002439794 | |||
| Current U.S. Class: | D16/131 |
| Current International Class: | 1606 |
| Field of Search: | ;D16/131 ;359/361,368,375,376,377,378,379,380,381,382,383,384,385,387,388,389,390,393 |
References Cited [Referenced By]
U.S. Patent Documents
| 4283111 | August 1981 | Wieber et al. |
| 4606616 | August 1986 | Parker |
| D439258 | March 2001 | Kawahata |
| D461201 | August 2002 | Apotheloz |
| D464068 | October 2002 | Asaka et al. |
| D498247 | November 2004 | Suzuki et al. |
| D546355 | July 2007 | Apotheloz |
| D546356 | July 2007 | Apotheloz |
| D592689 | May 2009 | Dunn |
| D611972 | March 2010 | Apotheloz |
| 2004/0263960 | December 2004 | Obuchi |
| 2010/0259816 | October 2010 | Feger |
| 2011/0080638 | April 2011 | Feger |
| 2011/0085234 | April 2011 | Feger |
Other References
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Brochure of Stemi DR, Stemi DV4 and Stemi 2000 Stereomicroscopes, 30 pages, published by Carl Zeiss Microscopy GmbH, Jena, Germany. cited by applicant . Brochure of Stemi 2000 Stereomicroscopes, 6 pages, published by Carl Zeiss Microscopy GmbH, Jena, Germany. cited by applicant. |
Primary Examiner: Holland; Derrick
Assistant Examiner: Calve; Lauren
Attorney, Agent or Firm: Christensen Fonder, P.A.
Description
FIG. 1 is a front perspective view of a microscope base and arm.
FIG. 2 is a right side elevational view thereof.
FIG. 3 is a left side elevational view thereof.
FIG. 4 is a front elevational view thereof.
FIG. 5 is a rear elevational view thereof; and,
FIG. 6 is a top plan view thereof.
The broken lines shown represent unclaimed subject matter form no part of the claimed design. The bottom side of the microscope base and arm forms no part of the claimed design.
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