Substrate for spectroscopic analysis

Description

FIG. 1 is a front view of a substrate for spectroscopic analysis according to our new design.

FIG. 2 is a rear view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 3 is a top plan view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 4 is a bottom view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 5 is a right side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 6 is a left side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 7 is a perspective of the substrate for spectroscopic analysis of FIG. 1.

FIG. 8 is a top plan view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 9 is a perspective view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 10 is a sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3.

FIG. 11 is a sectional view taken along the line 11-11 of the substrate for spectroscopic analysis of FIG. 1.

FIG. 12 is a sectional view taken along the line 12-12 of the substrate for spectroscopic analysis of FIG. 8.

FIG. 13 is an enlarged sectional view taken along the line 13-13 of the substrate for spectroscopic analysis of FIG. 10; and,

FIG. 14 is a reference sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3 in use, wherein the element is inserted in the concave part for element and the glass plate is set above the cover part.

The features shown in dotted lines depict environmental subject matter only and form no part of the claimed design.

The broken lines having alternating long and short segments define bounds of the claimed design and form no part thereof.

The whole of the substrate for spectroscopic analysis of our design is transparent.

The broken lines show portions of the substrate for spectroscopic analysis that form no part of the claimed design.

Claims

CLAIM The ornamental design for a substrate for spectroscopic analysis, as shown and described.

---

Inventors:	Ito; Masashi (Hamamatsu, JP), Shibayama; Katsumi (Hamamatsu, JP), Ofuji; Kazuto (Hamamatsu, JP), Oyama; Hiroki (Hamamatsu, JP), Maruyama; Yoshihiro (Hamamatsu, JP)
Applicant:	Name City State Country Type HAMAMATSU PHOTONICS K.K. Hamamatsu-shi, Shizuoka N/A JP
Assignee:	HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka, JP)
Appl. No.:	D/477,946
Filed:	December 30, 2013

---

Foreign Application Priority Data

---

Jul 5, 2013 [JP]			2013-015423
Jul 5, 2013 [JP]			2013-015425
Jul 5, 2013 [JP]			2013-015426

Current U.S. Class:	D24/225
Current International Class:	2402
Field of Search:	;D24/216,222-226,231,232,169 ;D10/80,81 ;422/99,100,102,68.1,69,560-566 ;435/288.1,288.3,289.1,283.1 ;436/165

---

References Cited [Referenced By]

---

U.S. Patent Documents

4761381	August 1988	Blatt et al.
D302294	July 1989	Hillman
D320269	September 1991	Hammond
D324426	March 1992	Fan et al.
D328135	July 1992	Fan et al.
D351913	October 1994	Hieb et al.
D366938	February 1996	Shartle et al.
D383852	September 1997	Shartle et al.
D395708	June 1998	Shartle et al.
D461906	August 2002	Pham
D467348	December 2002	McMichael et al.
D500142	December 2004	Crisanti et al.
D512512	December 2005	Bell et al.
D528215	September 2006	Malmsater
D530826	October 2006	Rich et al.
D531321	October 2006	Godfrey et al.
D540953	April 2007	Ramel et al.
D559995	January 2008	Handique et al.
D621060	August 2010	Handique
D636893	April 2011	Nicholls et al.
D639976	June 2011	Francis et al.
D639977	June 2011	Francis et al.
D640389	June 2011	Francis et al.
D669191	October 2012	Handique
8330951	December 2012	Li et al.
D676145	February 2013	Kouge et al.
D679024	March 2013	Kouge et al.
D692578	October 2013	Kikuhara et al.
D700711	March 2014	Kikuhara et al.
D702364	April 2014	Iqbal et al.
8709787	April 2014	Handique
2011/0268630	November 2011	Williams et al.

Foreign Patent Documents

	WO-2013/062540		May 2013		WO

Other References

US. Appl. No. 29/477,936, Hamamatsu Photonics K.K. cited by applicant . U.S. Appl. No. 29/477,940, Hamamatsu Photonics K.K. cited by applicant . U.S. Appl. No. 29/477,937, Hamamatsu Photonics K.K. cited by applicant . U.S. Appl. No. 29/477,957, Hamamatsu Photonics K.K. cited by applicant . U.S. Appl. No. 29/477,934, Hamamatsu Photonics K.K. cited by applicant . Leaflet "rSERS.TM. Raman Enhancing Media," Raman Systems, a wholly owned subsidiary of Agiltron, Inc., www.ramansystems.com. cited by applicant.

Primary Examiner: Nelson; T. Chase
Assistant Examiner: Cavanna; Mark
Attorney, Agent or Firm: Drinker Biddle & Reath LLP