Pre-processing machine for sampling

Description

FIG. 1 is a perspective view of a pre-processing machine for sampling showing our new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof;

FIG. 8 is a bottom view thereof;

FIG. 9 is a perspective view thereof, shown in use state;

FIG. 10 is another perspective view thereof, shown in use state;

FIG. 11 is a front view thereof, shown in use state;

FIG. 12 is a rear view thereof, shown in use state;

FIG. 13 is a left side view thereof, shown in use state;

FIG. 14 is a right side view thereof, shown in use state;

FIG. 15 is a top view thereof, shown in use state; and,

FIG. 16 is a bottom view thereof, shown in use state.

The broken lines in the drawing show unclaimed environment only and form no part of the claimed design.

Claims

CLAIM The ornamental design for a pre-processing machine for sampling, as shown and described.

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Inventors:	Muraoka; Hiroshi (Kyoto, JP), Nakamura; Shin (Shiga, JP), Hanafusa; Nobuhiro (Kyoto, JP)
Applicant:	Name City State Country Type SHIMADZU CORPORATION Kyoto N/A JP
Assignee:	SHIMADZU CORPORATION (Kyoto, JP)
Appl. No.:	D/512,984
Filed:	December 24, 2014

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Foreign Application Priority Data

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Sep 3, 2014 [JP]			2014-019351

Current U.S. Class:	D24/216
Current International Class:	2401
Field of Search:	;D24/216,223-225,231,232,186,107 ;D10/81 ;436/43,45,47 ;422/500,547,62-65,67 ;435/287.1,287.3

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References Cited [Referenced By]

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U.S. Patent Documents

4844887	July 1989	Galle et al.
5863506	January 1999	Farren
6149818	November 2000	Nakamura et al.
D560131	January 2008	Hu
8043560	October 2011	Okumoto et al.
D655822	March 2012	Oonuma et al.
D676143	February 2013	Liu et al.
D685919	July 2013	Lee et al.
8759106	June 2014	Ravalico et al.
D716469	October 2014	Muraoka et al.
2002/0025275	February 2002	Oonuma et al.
2010/0210019	August 2010	Kurono et al.
2014/0199772	July 2014	Kiss et al.

Foreign Patent Documents

	D1302325		Jun 2007		JP
	D1302680		Jun 2007		JP

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Jianq Chyun IP Office