Contact probe

Description

FIG. 1 is a perspective view of the front, top and left side of a contact probe of a first embodiment showing our new design;

FIG. 2 is a perspective view of the rear, top and right side thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof;

FIG. 8 is a bottom view thereof;

FIG. 9 is an enlarged view of tip side from 9-9 section in FIG. 1 thereof;

FIG. 10 is an enlarged view of tip side from 10-10 section in FIG. 2 thereof;

FIG. 11 is an enlarged view of tip side from 11-11 section in FIG. 3 thereof; and

FIG. 12 is an enlarged view of tip side from 12-12 section in FIG. 6 thereof,

FIG. 13 is a perspective view of the front, top and left side of a contact probe of a second embodiment showing our new design;

FIG. 14 is a perspective view of the rear, top and right side thereof;

FIG. 15 is a front view thereof;

FIG. 16 is a rear view thereof;

FIG. 17 is a left side view thereof;

FIG. 18 is a right side view thereof;

FIG. 19 is a top view thereof;

FIG. 20 is a bottom view thereof;

FIG. 21 is an enlarged view of tip side from 21-21 section in FIG. 13 thereof;

FIG. 22 is an enlarged view of tip side from 22-22 section in FIG. 14 thereof;

FIG. 23 is an enlarged view of tip side from 23-23 section in FIG. 15 thereof; and

FIG. 24 is an enlarged view of tip side from 24-24 section in FIG. 18 thereof,

FIG. 25 is a perspective view of the front, top and left side of a contact probe of a third embodiment showing our new design;

FIG. 26 is a perspective view of the rear, top and right side thereof;

FIG. 27 is a front view thereof;

FIG. 28 is a rear view thereof;

FIG. 29 is a left side view thereof;

FIG. 30 is a right side view thereof;

FIG. 31 is a top view thereof;

FIG. 32 is a bottom view thereof;

FIG. 33 is an enlarged view of tip side from 33-33 section in FIG. 25 thereof;

FIG. 34 is an enlarged view of tip side from 34-34 section in FIG. 26 thereof;

FIG. 35 is an enlarged view of tip side from 35-35 section in FIG. 27 thereof; and

FIG. 36 is an enlarged view of tip side from 36-36 section in FIG. 30 thereof,

FIG. 37 is a perspective view of the front, top and left side of a contact probe of a fourth embodiment showing our new design;

FIG. 38 is a perspective view of the rear, top and right side thereof;

FIG. 39 is a front view thereof;

FIG. 40 is a rear view thereof;

FIG. 41 is a left side view thereof;

FIG. 42 is a right side view thereof;

FIG. 43 is a top view thereof;

FIG. 44 is a bottom view thereof;

FIG. 45 is an enlarged view of tip side from 45-45 section in FIG. 37 thereof;

FIG. 46 is an enlarged view of tip side from 46-46 section in FIG. 38 thereof;

FIG. 47 is an enlarged view of tip side from 47-47 section in FIG. 39 thereof; and,

FIG. 48 is an enlarged view of tip side from 48-48 section in FIG. 42 thereof.

The portions of the article in broken lines are shown for illustrative purposes only and form no part of the claimed design.

Claims

CLAIM The ornamental design(s) for a contact probe, as shown and described.

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Inventors:	Nakamura; Yuji (Tokyo, JP), Suzuki; Katsumi (Tokyo, JP)
Applicant:	Name City State Country Type Nakamura; Yuji Suzuki; Katsumi Tokyo Tokyo N/A N/A JP JP
Assignee:	Yamaichi Electronics Co., Ltd. (Tokyo, JP)
Appl. No.:	D/431,034
Filed:	August 31, 2012

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Foreign Application Priority Data

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Mar 1, 2012 [JP]			2012-004631
Mar 1, 2012 [JP]			2012-004632
Mar 1, 2012 [JP]			2012-004633
Mar 1, 2012 [JP]			2012-004634

Current U.S. Class:	D10/80
Current International Class:	1004
Field of Search:	;D10/80 ;324/72,72.5,761,758,756,755,158P,755.02,755.05,754.14 ;200/46 ;439/700,482,824

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References Cited [Referenced By]

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U.S. Patent Documents

4050762	September 1977	Hines et al.
4417206	November 1983	Stowers
4438397	March 1984	Katz
4885533	December 1989	Coe
5032787	July 1991	Johnston et al.
D400811	November 1998	Swart et al.
6053777	April 2000	Boyle
6159056	December 2000	Boyle
7253647	August 2007	Lee
2012/0122355	May 2012	Hemmi

Foreign Patent Documents

	62-140459		Sep 1987		JP
	2002-357622		Dec 2002		JP
	2010-038612		Feb 2010		JP

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Studebaker & Brackett PC