Electron microscope

Description

FIG. 1 is a perspective view of the electron microscope showing our new design;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top elevation view thereof; and,

FIG. 7 is a bottom perspective view.

The broken lines illustrate portions of the electron microscope that form no part of the claimed design.

Claims

CLAIM The ornamental design for an electron microscope, as shown and described.

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Inventors:	Chan; Yi-Chia (Kaohsiung, TW), Chen; Yu-Jen (Kaohsiung, TW), Li; Po-Song (Kaohsiung, TW), Ruan; Jiun-Ching (Kaohsiung, TW)
Assignee:	MicroLinks Technology Corp. (Kaohsiung, TW)
Appl. No.:	D/392,067
Filed:	May 17, 2011

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Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D16/130,131 ;359/385,368,399,802,803,806,808,809,810,817,379 ;362/202,205 ;D26/37 ;D8/107,83

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References Cited [Referenced By]

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U.S. Patent Documents

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Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Muncy, Geissler, Olds & Lowe, PLLC