Controller for an electron microscope

Description

FIG. 1 is a front, top and right side perspective view of a controller for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

Claims

CLAIM We claim the ornamental design for a controller for an electron microscope, as shown.

---

Inventors:	Noda; Hiroyuki (Kokubunji, JP), Oonuma; Mitsuru (Tokyo, JP), Omachi; Akira (Komae, JP), Nemoto; Masahiro (Hitachiota, JP), Sasagawa; Kiyoshi (Honjo, JP)
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/366,699
Filed:	July 29, 2010

---

Foreign Application Priority Data

---

Feb 22, 2010 [JP]			2010-004041

Current U.S. Class:	D16/130
Current International Class:	1699
Field of Search:	;D16/130,131 ;D10/46,75,104,106 ;D14/338,397,398,362,406,407,408,415,417,455,188,218,140.8,388 ;D18/11,12.2 ;359/393,368,381,392 ;386/291 ;D21/333,324

---

References Cited [Referenced By]

---

U.S. Patent Documents

4422105	December 1983	Rodesch et al.
D291318	August 1987	Kim
D292927	November 1987	Burnstein et al.
4824229	April 1989	Narita et al.
D320197	September 1991	Weber
D325728	April 1992	Mayo et al.
D330522	October 1992	Mokhtarian
5237327	August 1993	Saitoh et al.
D362695	September 1995	Waldhelm
D377320	January 1997	McGuire
5946131	August 1999	Wells et al.
6118581	September 2000	Domanik et al.
6148096	November 2000	Pressman et al.

Foreign Patent Documents

	D978141		Mar 1997		JP

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.