Portion of a sample rack

Suzuki , et al. November 3, 2

Patent Grant D603524

U.S. patent number D603,524 [Application Number D/309,873] was granted by the patent office on 2009-11-03 for portion of a sample rack. This patent grant is currently assigned to Hitachi High-Technologies Corporation. Invention is credited to Seiji Nomura, Takeshi Setomaru, Kouichi Suzuki, Nobuo Suzuki.


United States Patent D603,524
Suzuki ,   et al. November 3, 2009

Portion of a sample rack

Claims

CLAIM We claim the ornamental design for a portion of a sample rack, as shown and described.
Inventors: Suzuki; Kouichi (Hitachinaka, JP), Suzuki; Nobuo (Hitachinaka, JP), Nomura; Seiji (Tokai, JP), Setomaru; Takeshi (Hitachinaka, JP)
Assignee: Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.: D/309,873
Filed: October 30, 2008

Foreign Application Priority Data

Jul 18, 2008 [JP] 2008-018581
Current U.S. Class: D24/229
Current International Class: 2402
Field of Search: ;D24/108,127-130,216,224,227-232 ;422/63-64,99-104,250,266,297,300,476 ;211/74,71.01 ;D8/9,19,27,70-71,60,354,356,387,399,499 ;D13/112 ;D15/11,145,147 ;D25/119,124

References Cited [Referenced By]

U.S. Patent Documents
D333522 February 1993 Gianino
D392866 March 1998 Degen et al.
D413391 August 1999 Lapeus et al.
D413677 September 1999 Dumitrescu et al.
D417009 November 1999 Boyd
D420747 February 2000 Dumitrescu et al.
D421130 February 2000 Cohen et al.
D428497 July 2000 Lapeus et al.
D433759 November 2000 Mathis et al.
D483241 December 2003 Miller et al.
D484989 January 2004 Gebrian
D500363 December 2004 Fanning et al.
D516891 March 2006 Thomas
D534280 December 2006 Gomm et al.
D560811 January 2008 Powell et al.
D568731 May 2008 Campbell
Foreign Patent Documents
D878520 Sep 1993 JP
2006-292696 Oct 2006 JP

Other References

Sample rack, (Parts No. E001-E020), before 2003, Hitachi High-Technologies Corporation. cited by other.

Primary Examiner: Nelson; T. Chase
Assistant Examiner: Cavanna; Mark
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.

Description



FIG. 1 is a front, top and left side perspective view of a portion of a sample rack showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is an enlarged view of the portion shown in box 3 in FIG. 2;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a rear elevational view thereof.

The broken lines shown are for illustrative purpose and form no part of the claimed design. The alternate long and short dash lines define, but are not included in, the boundaries of the claimed design.

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