U.S. patent number D575,174 [Application Number D/289,116] was granted by the patent office on 2008-08-19 for apparatus for measuring electrical parameters.
This patent grant is currently assigned to Liaisons Electroniques-Mecaniques Lem SA. Invention is credited to Pascal Morel.
United States Patent |
D575,174 |
Morel |
August 19, 2008 |
Apparatus for measuring electrical parameters
Claims
CLAIM The ornamental design for a apparatus for measuring
electrical parameters, as shown and described.
Inventors: |
Morel; Pascal (Saint Pierre en
Faucigny, FR) |
Assignee: |
Liaisons Electroniques-Mecaniques
Lem SA (Plan-Les-Ouates, CH)
|
Appl.
No.: |
D/289,116 |
Filed: |
July 6, 2007 |
Foreign Application Priority Data
Current U.S.
Class: |
D10/78 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/78
;324/110,107,115,117,127,142,157 ;336/175,178,216 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Baker & Daniels LLP
Description
FIG. 1 is a top perspective view of the measuring apparatus;
FIG. 2 is a lower perspective view of the apparatus of FIG. 1;
FIG. 3 is a top plan view of the apparatus of FIGS. 1 and 2;
FIG. 4 is an end view of the apparatus as depicted in FIG. 3;
FIG. 5 is a left plan view of the apparatus shown in FIG. 3;
FIG. 6 is a right plan view of the apparatus shown in FIG. 3;
FIG. 7 is an end view of the apparatus shown in FIG. 3; and,
FIG. 8 is a lower plan view of the device shown in FIG. 2.
* * * * *