Front panel for measurement instruments

Nelson , et al. April 22, 2

Patent Grant D567124

U.S. patent number D567,124 [Application Number D/276,752] was granted by the patent office on 2008-04-22 for front panel for measurement instruments. This patent grant is currently assigned to Tektronix, Inc.. Invention is credited to Michael D. Nelson, David K. Orr.


United States Patent D567,124
Nelson ,   et al. April 22, 2008

Front panel for measurement instruments

Claims

CLAIM The ornamental design of a front panel for measurement instruments, as shown and described.
Inventors: Nelson; Michael D. (Seattle, WA), Orr; David K. (Seattle, WA)
Assignee: Tektronix, Inc. (Beaverton, OR)
Appl. No.: D/276,752
Filed: February 2, 2007

Current U.S. Class: D10/80; D10/103
Current International Class: 1004
Field of Search: ;324/156,157,131,132,116,72.5,107,110,114,115,142,127,151A,151R ;329/110,155,156 ;337/112,327,360 ;340/653,660 ;379/21 ;439/482 ;D24/185-186,232-234 ;D10/80,102-103 ;D14/432,440,441 ;24/280 ;73/431 ;116/334,DIG.47 ;220/214 ;236/46R,47,94 ;292/37R,256.67 ;301/666,669

References Cited [Referenced By]

U.S. Patent Documents
D332833 January 1993 Lauks et al.
D420607 February 2000 Wrisley et al.
6140812 October 2000 Russell et al.
6731104 May 2004 Yang
D508426 August 2005 Wrisley
6982550 January 2006 Cannon
Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Bucher; William K.

Description



The ornamental design disclosed in this application is for various embodiments of a front panel for measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like.

FIG. 1 is a perspective view of a first embodiment of front panel for measurement instruments;

FIG. 2 is a front elevation view of the first embodiment of front panel for measurement instruments;

FIG. 3 is a left side elevation view of the first embodiment of front panel for measurement instruments;

FIG. 4 is a right side elevation view of the first embodiment of front panel for measurement instruments;

FIG. 5 is a top plan view of the first embodiment of front panel for measurement instruments;

FIG. 6 is a bottom plan view of the first embodiment of front panel for measurement instruments;

FIG. 7 is a perspective view of a second embodiment of front panel for measurement instruments;

FIG. 8 is a front elevation view of the second embodiment of front panel for measurement instruments;

FIG. 9 is a left side elevation view of the second embodiment of front panel for measurement instruments;

FIG. 10 is a right side elevation view of the second embodiment of front panel for measurement instruments;

FIG. 11 is a top plan view of the second embodiment of front panel for measurement instruments;

FIG. 12 is a bottom plan view of the second embodiment of front panel for measurement instruments;

FIG. 13 is a perspective view of a third embodiment of front panel for measurement instruments;

FIG. 14 is a front elevation view of the third embodiment of front panel for measurement instruments;

FIG. 15 is a left side elevation view of the third embodiment of front panel for measurement instruments;

FIG. 16 is a right side elevation view of the third embodiment of front panel for measurement instruments;

FIG. 17 is a top plan view of the third embodiment of front panel for measurement instruments; and,

FIG. 18 is a bottom plan view of third embodiment of front panel for measurement instruments.

The front panel has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, first beveled surfaces extending from side and top surfaces and from a first portion of a bottom surface to the rectangular front face, and a second beveled surface extending from a second portion of the bottom surface to the rectangular front face with the second beveled surface laterally transitioning from the first beveled surface.

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