Microscope

Yip , et al. March 18, 2

Patent Grant D564553

U.S. patent number D564,553 [Application Number D/264,470] was granted by the patent office on 2008-03-18 for microscope. This patent grant is currently assigned to Leading Extreme Optimist Industries, Ltd.. Invention is credited to Bryan Yip, Gin Fai Yip.


United States Patent D564,553
Yip ,   et al. March 18, 2008

Microscope

Claims

CLAIM The ornamental design for a microscope, as shown and described.
Inventors: Yip; Gin Fai (North Point, HK), Yip; Bryan (Kowloon, HK)
Assignee: Leading Extreme Optimist Industries, Ltd. (Chai Wan, HK)
Appl. No.: D/264,470
Filed: August 10, 2006

Current U.S. Class: D16/131
Current International Class: 1606
Field of Search: ;D16/131-133,202-203,216-218,352 ;D14/156,168,192 ;359/402-403,405,407,409,411,412-413,418-419,428,438,119,353,815,819,744

References Cited [Referenced By]

U.S. Patent Documents
D311924 November 1990 Loyd et al.
D331934 December 1992 Tak
D349295 August 1994 Weidemann
D349907 August 1994 Allmendinger
D371786 July 1996 Maeyama
D418853 January 2000 Kubota
D433430 November 2000 Meinzer
D523886 June 2006 Wen et al.
D528143 September 2006 Walter et al.
D537459 February 2007 Yip et al.
D539317 March 2007 Tonhofer
7221402 May 2007 Cheng
Primary Examiner: Greene; Paula A.
Attorney, Agent or Firm: Carmody & Torrance LLP

Description



FIG. 1 is a perspective view of a microscope showing our new design;

FIG. 2 is a second perspective view of FIG. 1 showing the telescoping nature of the eyepiece;

FIG. 3 is a top plan view of FIG. 1;

FIG. 4 is a bottom plan view of FIG. 1;

FIG. 5 is a right side elevational view of FIG. 1;

FIG. 6 is a left side elevational view of FIG. 1;

FIG. 7 is a first end elevational view of FIG. 1; and,

FIG. 8 is a second end elevational view of FIG. 1.

The dotted lines are intended to show features that are environmental only and form no part of the claimed design. All surface lines are merely intended to illustrate the contour of the surfaces represented.

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