Sphygmomanometer

Description

FIG. 1 is a perspective view illustrating a first embodiment of our new design for a sphygmomanometer;

FIG. 2 is a front elevational view of the sphygmomanometer of FIG. 1;

FIG. 3 is a rear elevational view of the sphygmomanometer of FIG. 1;

FIG. 4 is a top plan view of the sphygmomanometer of FIG. 1;

FIG. 5 is a bottom plan view of the sphygmomanometer of FIG. 1;

FIG. 6 is a right side elevational view of the sphygmomanometer of FIG. 1;

FIG. 7 is a left side elevational view of the sphygmomanometer of FIG. 1;

FIG. 8 is a top plan view of the sphygmomanometer of FIG. 6 according to reference arrow 8 of FIG. 6;

FIG. 9 is a front perspective view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 10 is a rear perspective view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 11 is a front elevational view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 12 is a rear elevational view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 13 is a top plan view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 14 is a bottom plan view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 15 is a right side elevational view of the sphygmomanometer of FIG. 1 with the armband opened;

FIG. 16 is a left side elevational view of the sphygmomanometer of FIG. 1 with the armband opened; and,

FIG. 17 is a rear view of the sphygmomanometer of FIG. 15 according to reference arrow 15 of FIG. 15.

Claims

CLAIM The ornamental design for a sphygmomanometer, as shown and described.

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Inventors:	Eda; Kenji (Osaka, JP), Tanaka; Takahide (Shiga, JP), Nakada; Tetsuya (Osaka, JP), Nakanishi; Takefumi (Kyoto, JP), Nakanishi; Hiroya (Kyoto, JP), Koike; Tadashi (Kyoto, JP), Murata; Chiaki (Osaka, JP)
Assignee:	Omron Healthcare Co., Ltd. (Kyoto, JP)
Appl. No.:	D/212,055
Filed:	August 26, 2004

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Foreign Application Priority Data

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Feb 27, 2004 [JP]			D2004-005957
Feb 27, 2004 [JP]			D2004-005958
Feb 27, 2004 [JP]			D2004-005959
Feb 27, 2004 [JP]			D2004-005960
Feb 27, 2004 [JP]			D2004-005961
Feb 27, 2004 [JP]			D2004-005962

Current U.S. Class:	D24/165
Current International Class:	2401
Field of Search:	;D24/165

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References Cited [Referenced By]

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U.S. Patent Documents

D244235	May 1977	Lichowsky
D341658	November 1993	Kojima

Foreign Patent Documents

	D-1140559		May 2002		JP
	D-1200780		Apr 2004		JP

Primary Examiner: Zarfas; Louis S.
Assistant Examiner: Yu; Daniel
Attorney, Agent or Firm: Dickstein Shapiro LLP