Meter for an integrated diagnostic test system

Neel , et al. June 28, 2

Patent Grant D506832

U.S. patent number D506,832 [Application Number D/206,525] was granted by the patent office on 2005-06-28 for meter for an integrated diagnostic test system. This patent grant is currently assigned to Home Diagnostics, Inc.. Invention is credited to Allan Javier Caban, Gary T. Neel.


United States Patent D506,832
Neel ,   et al. June 28, 2005

Meter for an integrated diagnostic test system

Claims

The ornamental design for a meter for an integrated diagnostic test system, as shown and described.
Inventors: Neel; Gary T. (Weston, FL), Caban; Allan Javier (Lakeworth, FL)
Assignee: Home Diagnostics, Inc. (Fort Lauderdale, FL)
Appl. No.: D/206,525
Filed: June 2, 2004

Current U.S. Class: D24/224; D10/102; D24/169
Current International Class: 2401
Field of Search: ;D24/169,216,224,231 ;D10/49,75,81,102,103 ;600/322 ;436/810 ;422/99,102 ;435/283.1,288.1,304.1

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Primary Examiner: Zarfas; Louis S.
Assistant Examiner: Levy; Melanie
Attorney, Agent or Firm: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.

Description



FIG. 1 is a front perspective view of our meter for an integrated diagnostic system;

FIG. 2 is a top view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a front view thereof; and,

FIG. 6 is a right side view thereof.

The bottom of our meter for an integrated diagnostic test system is not visible during normal use and does not form part of the claimed design. The broken lines in the figures are for illustrative purposes only and do not form part of the claimed invention.

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