Optical measuring theodolite

Ishii August 10, 2

Patent Grant D494074

U.S. patent number D494,074 [Application Number D/194,459] was granted by the patent office on 2004-08-10 for optical measuring theodolite. This patent grant is currently assigned to Kabushiki Kaisha Topcon. Invention is credited to Mitsuo Ishii.


United States Patent D494,074
Ishii August 10, 2004

Optical measuring theodolite

Claims

The ornamental design for an optical measuring theodolite, as shown and described.
Inventors: Ishii; Mitsuo (Itabashi-ku, JP)
Assignee: Kabushiki Kaisha Topcon (Tokyo, JP)
Appl. No.: D/194,459
Filed: November 26, 2003

Foreign Application Priority Data

Sep 12, 2003 [JP] 2003-026797
Current U.S. Class: D10/66; D10/50; D16/130
Current International Class: 1004
Field of Search: ;D10/66,50 ;356/138-155 ;33/281,285-286,290-299 ;D16/130

References Cited [Referenced By]

U.S. Patent Documents
4752126 June 1988 Fujii
D364573 November 1995 Pearsall
D367233 February 1996 Hoshino
D375464 November 1996 Hoshino
D389418 January 1998 Takayama et al.
D409507 May 1999 Ishii
D416856 November 1999 Onose
D427087 June 2000 Kaneko et al.
6119355 September 2000 Raby
D450254 November 2001 Ishii
Primary Examiner: Greene; Paula A.
Attorney, Agent or Firm: Jacobson Holman PLLC

Description



FIG. 1 is a front view of the present optical measuring theodolite,

FIG. 2 is a rear view thereof,

FIG. 3 is a left side view thereof,

FIG. 4 is a right side view thereof,

FIG. 5 is a plan view thereof,

FIG. 6 is a bottom view thereof,

FIG. 7 is a perspective view thereof taken in an left upper direction; and,

FIG. 8 is an enlarged view thereof taken along lines a--a and b--b.

The broken lines are for illustrative purposes only and forms no part of the claimed design.

* * * * *


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