U.S. patent number D494,074 [Application Number D/194,459] was granted by the patent office on 2004-08-10 for optical measuring theodolite.
This patent grant is currently assigned to Kabushiki Kaisha Topcon. Invention is credited to Mitsuo Ishii.
United States Patent |
D494,074 |
Ishii |
August 10, 2004 |
Optical measuring theodolite
Claims
The ornamental design for an optical measuring theodolite, as shown
and described.
Inventors: |
Ishii; Mitsuo (Itabashi-ku,
JP) |
Assignee: |
Kabushiki Kaisha Topcon (Tokyo,
JP)
|
Appl.
No.: |
D/194,459 |
Filed: |
November 26, 2003 |
Foreign Application Priority Data
|
|
|
|
|
Sep 12, 2003 [JP] |
|
|
2003-026797 |
|
Current U.S.
Class: |
D10/66; D10/50;
D16/130 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/66,50 ;356/138-155
;33/281,285-286,290-299 ;D16/130 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Greene; Paula A.
Attorney, Agent or Firm: Jacobson Holman PLLC
Description
FIG. 1 is a front view of the present optical measuring
theodolite,
FIG. 2 is a rear view thereof,
FIG. 3 is a left side view thereof,
FIG. 4 is a right side view thereof,
FIG. 5 is a plan view thereof,
FIG. 6 is a bottom view thereof,
FIG. 7 is a perspective view thereof taken in an left upper
direction; and,
FIG. 8 is an enlarged view thereof taken along lines a--a and
b--b.
The broken lines are for illustrative purposes only and forms no
part of the claimed design.
* * * * *