Reticle pattern for a gun scope

Description

FIG. 1 is a front perspective view of reticle pattern for a gun scope showing our new design;

FIG. 2 is a front view, the rear side view being a mirror image of the front view thereof;

FIG. 3 is a top view, the bottom view being a mirror image of the top view thereof;

FIG. 4 is a left view, the right view being a mirror image of the left view thereof; and,

FIG. 5 is an enlarged sectional view of the reticle pattern for a gun scope taken along the lines 5--5 in FIG. 2.

The broken lines shown in all views are to illustrate environment only and form no part of the claimed design.

Claims

The ornamental design for the reticle pattern for a gun scope, as shown and described.

---

Inventors:	Ishikawa; Yasuaki (Tokyo, JP)
Assignee:	Nikon Corporation (Tokyo, JP)
Appl. No.:	D/162,614
Filed:	June 20, 2002

---

Foreign Application Priority Data

---

May 20, 2002 [JP]			2002-013288

Current U.S. Class:	D22/108
Current International Class:	2201
Field of Search:	;D22/100,108,109,199 ;D16/130,132,134,135,136 ;42/120,122,123 ;33/297 ;356/21,246,247 ;359/422,428

---

References Cited [Referenced By]

---

U.S. Patent Documents

3540256	November 1970	Thompson
5223650	June 1993	Finn
5491546	February 1996	Wascher et al.
D397704	September 1998	Reese
6357158	March 2002	Smith, III
D456057	April 2002	Smith, III

Foreign Patent Documents

	44-41868		Dec 1973		JP
	47-26183		Jul 1975		JP

Other References

Nikon Corporation, "Nikon: A better look at your world," (2001), pp. 9 and 24..

Primary Examiner: Zarfas; Louis S.
Assistant Examiner: Weingart; Monica A.
Attorney, Agent or Firm: Oliff & Berridge, PLC