U.S. patent number D474,704 [Application Number D/168,298] was granted by the patent office on 2003-05-20 for electrical test instrument body.
This patent grant is currently assigned to Fluke Corporation. Invention is credited to John K. Ikeda, Duncan N. Kearsley.
United States Patent |
D474,704 |
Ikeda , et al. |
May 20, 2003 |
Electrical test instrument body
Claims
The ornamental design for an electrical test instrument body, as
shown and described.
Inventors: |
Ikeda; John K. (Seattle,
WA), Kearsley; Duncan N. (Stanwood, WA) |
Assignee: |
Fluke Corporation (Everett,
WA)
|
Appl.
No.: |
D/168,298 |
Filed: |
September 27, 2002 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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141875 |
May 14, 2001 |
D467190 |
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Current U.S.
Class: |
D10/79 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/79
;324/99D,115-117,126-130,142,143,149,156,158F,158P |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Koske; Richard A.
Description
FIG. 1 is a perspective view of an electrical test instrument body
showing our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines showing in FIGS. 1-7 are for illustrative purposes
only and form no part of the claimed design. In particular, the jaw
portion and certain elements on the body shown in FIGS. 1-7 form no
part of the claimed design.
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