Portion of semiconductor device

Sako , et al. April 15, 2

Patent Grant D473199

U.S. patent number D473,199 [Application Number D/161,325] was granted by the patent office on 2003-04-15 for portion of semiconductor device. This patent grant is currently assigned to Kabushiki Kaisha Toshiba. Invention is credited to Kazuyoshi Fukuda, Takahiro Ide, Masahiro Ootomo, Shigeki Sako.


United States Patent D473,199
Sako ,   et al. April 15, 2003

Portion of semiconductor device

Claims

The ornamental design for a portion of semiconductor device, as shown and described.
Inventors: Sako; Shigeki (Yokohama, JP), Ootomo; Masahiro (Kitakyushu, JP), Fukuda; Kazuyoshi (Kitakyushu, JP), Ide; Takahiro (Yokohama, JP)
Assignee: Kabushiki Kaisha Toshiba (Tokyo, JP)
Appl. No.: D/161,325
Filed: May 29, 2002

Foreign Application Priority Data

Nov 30, 2001 [JP] 2001-035199
Current U.S. Class: D13/182
Current International Class: 1303
Field of Search: ;D13/182 ;174/52.1,52.2,52.4,52.5 ;206/710,719 ;257/666,678,690,691-697,704,780 ;361/600,742,820

References Cited [Referenced By]

U.S. Patent Documents
D259559 June 1981 Mochizuki et al.
5105257 April 1992 Michii
5309018 May 1994 Shibata
5585670 December 1996 Isshiki et al.
5925927 July 1999 Orcutt
D416872 November 1999 Burke
6020625 February 2000 Qin et al.
6093957 July 2000 Kwon
6177718 January 2001 Kozono
Foreign Patent Documents
800572 Nov 1990 JP
1079850 Jul 2000 JP

Other References

Extract of Denpa Shimbun (newspaper) showing a PAM built-in microcomputer (MB91110). .
Extract of Denpa Shimbun (newspaper) showing a CCD signal processor (VSP2101). .
Extract of Denpa Shimbun (newspaper) showing a AV decoder system LSI (MN677521) for a DVD player. .
Extract of Denpa Shimbun (newspaper) showing a Scan USB (NET 1031). .
Toshiba Catalog of micro controller (TMP86CM25F)..

Primary Examiner: Shooman; Ted
Assistant Examiner: Sikder; Selina
Attorney, Agent or Firm: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.

Description



FIG. 1 is a front, bottom and right side perspective view of a portion of semiconductor device, showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof; a bottom plan view being a mirror image thereof;

FIG. 4 is a right side elevational view thereof; a left side elevational view being a mirror image thereof; and,

FIG. 5 is a rear elevational view thereof.

The broken line portions are shown for illustrative purpose only and form no part of the claimed design.

* * * * *


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