U.S. patent number 7,635,627 [Application Number 11/614,050] was granted by the patent office on 2009-12-22 for methods for fabricating a memory device including a dual bit memory cell.
This patent grant is currently assigned to Spansion LLC. Invention is credited to Ning Cheng, Hiroyuki Kinoshita, Ashot Melik-Martirosian, Minghao Shen.
United States Patent |
7,635,627 |
Cheng , et al. |
December 22, 2009 |
Methods for fabricating a memory device including a dual bit memory
cell
Abstract
Methods are provided for fabricating a memory device comprising
a dual bit memory cell. The method comprises, in accordance with
one embodiment of the invention, forming a gate dielectric layer
and a central gate electrode overlying the gate dielectric layer at
a surface of a semiconductor substrate. First and second memory
storage nodes are formed adjacent the sides of the gate dielectric
layer, each of the first and second storage nodes comprising a
first dielectric layer and a charge storage layer, the first
dielectric layer formed independently of the step of forming the
gate dielectric layer. A first control gate is formed overlying the
first memory storage node and a second control gate is formed
overlying the second memory storage node. A conductive layer is
deposited and patterned to form a word line coupled to the central
gate electrode, the first control gate, and the second control
gate.
Inventors: |
Cheng; Ning (San Jose, CA),
Kinoshita; Hiroyuki (San Jose, CA), Shen; Minghao
(Sunnyvale, CA), Melik-Martirosian; Ashot (Sunnyvale,
CA) |
Assignee: |
Spansion LLC (Sunnyvale,
CA)
|
Family
ID: |
39543440 |
Appl.
No.: |
11/614,050 |
Filed: |
December 20, 2006 |
Prior Publication Data
|
|
|
|
Document
Identifier |
Publication Date |
|
US 20080153228 A1 |
Jun 26, 2008 |
|
Current U.S.
Class: |
438/257;
257/E21.682; 257/E21.209; 257/320; 257/315; 438/593; 438/258 |
Current CPC
Class: |
H01L
27/11521 (20130101); H01L 27/11568 (20130101); H01L
29/42328 (20130101); H01L 29/42332 (20130101); H01L
29/42344 (20130101); H01L 29/40117 (20190801); H01L
29/66825 (20130101); H01L 29/66833 (20130101); H01L
29/7883 (20130101); H01L 29/792 (20130101); H01L
29/40114 (20190801); H01L 29/42348 (20130101) |
Current International
Class: |
H01L
21/336 (20060101) |
Field of
Search: |
;438/257-258,593-594
;257/314-316 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Le; Dung A.
Claims
What is claimed is:
1. A method for fabricating a memory device comprising a dual bit
memory cell, the method comprising the steps of: forming a first
channel dielectric layer at a surface of a semiconductor substrate;
depositing a layer of first conductive material overlying the first
channel dielectric layer, the layer of first conductive material
having a first thickness; patterning the layer of first conductive
material and the first channel dielectric layer to form center gate
electrodes formed of the first conductive material and exposing a
portion of the surface of the semiconductor substrate between
adjacent ones of the center gate electrodes; forming a layered
structure comprising a tunnel dielectric layer, a charge storage
layer and a second dielectric layer overlying the center gate
electrode and the portion of the semiconductor substrate;
depositing a layer of second conductive material overlying the
layered structure; etching the layer of second conductive material
to form a region of second conductive material overlying the
portion of the semiconductor substrate and having a second
thickness less than the first thickness, the step of etching the
second conductive material exposing a portion of the layered
structure at a sidewall of the center gate electrodes; forming
sidewall spacers on the portion of the layered structure; etching
the region of second conductive material and the layered structure
using the sidewall spacers as an etch mask; ion implanting bit
lines in the semiconductor substrate using the sidewall spacers as
an implantation mask; depositing a third dielectric layer overlying
the bit lines; etching the third dielectric layer and the sidewall
spacers to expose a portion of the layer of first conductive
material and a portion of the second conductive material;
depositing a layer of third conductive material in contact with the
portion of the layer of first conductive material and the layer of
second conductive material; and patterning the layer of third
conductive material to form a word line.
2. The method of claim 1 wherein the step of forming a first
channel dielectric layer comprises the step of thermally growing a
layer of silicon dioxide having a first thickness, and wherein the
step of depositing a layer of first conductive material comprises
the step of depositing a layer of polycrystalline silicon.
3. The method of claim 1 wherein the step of forming a layered
structure comprises the steps of: depositing a layer of tunnel
oxide; depositing a layer of charge storage material; and
depositing a layer of oxide.
4. The method of claim 3 wherein the step of depositing a layer of
charge storage material comprises the step of depositing a layer of
material selected from the group consisting of silicon nitride,
silicon rich silicon nitride, and polycrystalline silicon.
5. The method of claim 3 wherein the step of depositing a layer of
oxide comprises the step of depositing a layer of a material
selected from the group consisting of silicon dioxide and high-K
oxide.
6. The method of claim 1 wherein the step of depositing a layer of
first conductive material comprises the step of depositing a layer
of polycrystalline silicon, the step of depositing a layer of
second conductive material comprises the step of depositing a layer
of polycrystalline silicon, and the step of depositing a layer of
third conductive material comprises the step of depositing a layer
of polycrystalline silicon.
7. A method for fabricating a memory device comprising a dual bit
memory cell, the method comprising the steps of: forming a gate
insulator of a first thickness at a surface of a semiconductor
substrate; forming a central gate electrode overlying the gate
insulator and thereafter; forming a first memory storage node
adjacent a first side of the central gate electrode and a second
memory storage node adjacent a second side of the central gate
electrode, each of the first memory storage node and the second
memory node comprising a tunnel dielectric layer, a charge storage
layer, a barrier dielectric layer, and a control gate electrode;
implanting conductivity determining ions into the semiconductor
substrate to form a first bit line in alignment with the first
memory storage node and a second bit line in alignment with the
second memory storage node; and depositing and patterning a layer
of conductive material to form a word line coupled to the central
gate electrode and to the control gate of each of the first memory
storage node and the second memory storage node.
8. The method of claim 7 wherein the step of forming a gate
insulator comprises the step of thermally growing a layer of
silicon dioxide and wherein the steps of forming a first memory
storage node and forming a second memory node comprise the step of
depositing a layer of silicon oxide of a second thickness less than
the first thickness.
9. The method of claim 7 wherein the step of forming a first memory
storage node comprises the steps of: depositing a tunnel oxide
layer; depositing a layer of material selected from the group
consisting of silicon nitride, silicon rich silicon nitride, and
polycrystalline silicon.
10. The method of claim 7 wherein the step of forming a central
gate electrode comprises the steps of: depositing a first layer of
polycrystalline silicon; and patterning the first layer of
polycrystalline silicon to form a central gate electrode having a
first thickness; and wherein the method further comprises the steps
of: depositing a second layer of polycrystalline silicon; and
etching back the second layer of polycrystalline silicon to a
second thickness less than the first thickness.
11. The method of claim 10 further comprising the steps of: forming
spacers adjacent the central gate electrode; and etching the second
layer of polycrystalline silicon using the spacers as an etch mask
to form the control gate of each of the first and the second memory
storage nodes.
12. A method for fabricating a memory device comprising a dual bit
memory cell, the method comprising the steps of: forming a gate
dielectric layer at a surface of a semiconductor substrate; forming
a central gate electrode overlying the gate dielectric layer;
forming a first memory storage node adjacent one side of the gate
dielectric layer and a second memory storage node adjacent an
opposite side of the gate dielectric layer, each of the first
storage node and the second storage node comprising a first
dielectric layer and a charge storage layer, the first dielectric
layer formed independently of the step of forming a gate dielectric
layer; forming a first control gate overlying the first memory
storage node and a second control gate overlying the second memory
storage node; and depositing and patterning a conductive layer to
form a word line coupled to the central gate electrode, the first
control gate and the second control gate.
13. The method of claim 12 wherein the step of forming a first
memory storage node comprises the steps of: forming a tunnel oxide
layer at the surface of the substrate; and depositing a layer of
charge storage material overlying the tunnel oxide layer.
14. The method of claim 13 wherein the step of depositing a layer
of charge storage material comprises the step of depositing a layer
of material selected from the group consisting of silicon nitride,
silicon rich silicon nitride, and polycrystalline silicon.
15. The method of claim 12 wherein the step of forming a first
memory storage node comprises the steps of depositing sequential
layers of oxide, nitride, and oxide.
16. The method of claim 15 wherein the step of forming a first
memory storage node further comprises the step of depositing a
layer of polycrystalline silicon.
17. The method of claim 16 further comprising the steps of: etching
the layer of polycrystalline silicon to expose a sidewall adjacent
the central gate electrode; and forming a sidewall spacer on the
sidewall.
18. The method of claim 17 further comprising the step of etching
the layer of polycrystalline silicon using the sidewall spacer as
an etch mask to expose a portion of the surface of the
semiconductor substrate.
19. The method of claim 18 further comprising the step of
implanting conductivity determining impurities into the
semiconductor substrate using the sidewall spacer as an ion
implantation mask to form a bit line.
20. The method of claim 19 further comprising the step of etching
the sidewall spacer prior to the step of depositing and patterning
a conductive layer.
Description
TECHNICAL FIELD
The present invention generally relates to methods for fabricating
memory devices, and more particularly relates to methods for
fabricating memory devices that include a dual bit memory cell.
BACKGROUND
One form of semiconductor memory is a nonvolatile memory in which
the memory state of a memory cell is determined by whether or not
an electrical charge is stored on a charge storage layer built into
the gate structure of a field effect transistor. To enhance the
storage capacity of such a nonvolatile memory, two storage nodes
can be built into each memory cell. The storage nodes are
associated with locations in charge storage layers at opposite
sides of the gate structure. As the capacity of semiconductor
memories increases, the size of each individual device used to
implement the memory shrinks in size. With a memory that uses dual
storage nodes per memory cell, the reduction in device size means
that the spacing between the two storage nodes of a memory cell
decreases. As the spacing between storage nodes decreases, problems
arise with respect to the reliability and retention of the memory
data. Charge stored in one memory node of the memory cell may leak
through the gate structure to the other memory node to corrupt the
memory stored at that other memory node. Additionally, as device
size decreases, programming of one memory node can disturb the data
stored in the other memory node due to relatively wide charge
distributions in the charge storage layer. Such problems limit the
possible choices for erasing such dual bit memory cells.
Accordingly, it is desirable to provide methods for fabricating
semiconductor memory devices that have enhanced isolation between
memory storage nodes of a dual bit memory cell. In addition, it is
desirable to provide methods for fabricating semiconductor memory
devices in which a gate insulator separating two memory storage
nodes can be formed independently of the insulators of the charge
storage node. Additionally, it is desirable to provide methods for
fabricating dual bit memory cell devices that can be erased by
Fowler-Nordheim (FN) tunneling for less power consumption.
Furthermore, other desirable features and characteristics of the
present invention will become apparent from the subsequent detailed
description and the appended claims, taken in conjunction with the
accompanying drawings and the foregoing technical field and
background.
BRIEF SUMMARY
Methods are provided for fabricating a memory device comprising a
dual bit memory cell. The method comprises, in accordance with one
embodiment of the invention, forming a gate dielectric layer and a
central gate electrode overlying the gate dielectric layer at a
surface of a semiconductor substrate. First and second memory
storage nodes are formed adjacent the sides of the gate dielectric
layer, each of the first and second storage nodes comprising a
first dielectric layer and a charge storage layer, the first
dielectric layer formed independently of the step of forming the
gate dielectric layer. A first control gate is formed overlying the
first memory storage node and a second control gate is formed
overlying the second memory storage node. A conductive layer is
deposited and patterned to form a word line coupled to the central
gate electrode, the first control gate, and the second control
gate.
BRIEF DESCRIPTION OF THE DRAWINGS
The present invention will hereinafter be described in conjunction
with the following drawing figures, wherein like numerals denote
like elements, and wherein
FIG. 1 schematically illustrates, in cross section, a memory device
comprising a dual bit memory cell in accordance with an embodiment
of the invention; and
FIG. 2-12 schematically illustrate, in cross section, method steps
in accordance with the various embodiments of the invention for
fabricating a memory device comprising a dual bit memory cell.
DETAILED DESCRIPTION
The following detailed description is merely exemplary in nature
and is not intended to limit the invention or the application and
uses of the invention. Furthermore, there is no intention to be
bound by any expressed or implied theory presented in the preceding
technical field, background, brief summary or the following
detailed description.
FIG. 1 illustrates schematically, in cross section, a non-volatile
memory device 20 that includes a plurality of dual bit memory cells
22 fabricated in accordance with an embodiment of the invention.
Although portions of only four dual bit memory cells are
illustrated, those of skill in the art will appreciate that memory
device 20 may include a large number of such cells. Each of dual
bit memory cells 22 includes a central gate electrode 24 that
overlies a gate dielectric 26 formed at a surface 28 of a
semiconductor substrate 30. A first memory storage node 32 is
formed at one side of gate dielectric 26 and a second memory
storage node 34 is formed at the opposite side of the gate
dielectric. Each of the memory storage nodes includes, in
accordance with one embodiment of the invention, a thin tunnel
dielectric layer 36, a charge storage layer 38, a blocking
dielectric layer 40 and a control gate 42. A conductive word line
44 is coupled to the central gate electrode and the control gates
of each of a plurality of memory cells in a row of memory device
20. Alternating first bit lines 46 and second bit lines 48 are
formed in the semiconductor substrate in the semiconductor
substrate in alignment with the charge storage nodes. The bit lines
are shared between adjacent memory cells.
FIGS. 2-12 schematically illustrate, in cross section, method steps
for fabricating a memory device such as memory device 20 in
accordance with various embodiments of the invention. Many of the
steps employed in the fabrication of semiconductor devices are well
known and so, in the interest of brevity, some of those
conventional steps will only be mentioned briefly herein or will be
omitted entirely without providing the well known process
details.
The method begins, as illustrated in FIG. 2, with a semiconductor
substrate 60, preferably a silicon substrate, at the surface of
which is formed a gate dielectric layer 62. A layer of conductive
gate electrode forming material 64 is deposited on the gate
dielectric layer. The conductive gate electrode forming material is
preferably a layer of polycrystalline silicon, and the layer will
hereinafter be referred to, for convenience but without limitation,
as a layer of polycrystalline silicon. Although not illustrated, a
layer of hard mask material may be deposited on the layer of
polycrystalline silicon. Gate dielectric layer 62 is preferably a
thermally grown layer of silicon dioxide having a thickness of
about 5-30 nanometers (nm), although the layer can be formed of
other dielectric materials that are grown or deposited at surface
66 of the semiconductor substrate. As is well known, dielectric
materials can be deposited, for example, by chemical vapor
deposition (CVD), low pressure chemical vapor deposition (LPCVD) or
plasma enhanced chemical vapor deposition (PECVD). The layer of
polycrystalline silicon can be deposited by, for example, LPCVD by
the reduction of silane (SiH.sub.4) or other silicon source
material and can be deposited either as an undoped or as an
impurity doped layer. The layer of polycrystalline silicon
preferably has a thickness of about 30-120 nm.
Semiconductor substrate 60 will hereinafter be referred to, for
convenience of discussion but without limitation, as a silicon
substrate. As used herein, the term "silicon substrate" will be
used to encompass the relatively pure or lightly impurity doped
monocrystalline silicon materials typically used in the
semiconductor industry as well as silicon admixed with other
elements such as germanium, carbon, and the like to form
substantially monocrystalline semiconductor material. The silicon
substrate can be a bulk silicon wafer as illustrated or can be a
thin layer of silicon on an insulator (SOI) that, in turn is
supported by a semiconductor carrier substrate.
As illustrate in FIG. 3, polycrystalline silicon layer 64 and gate
dielectric layer 62 are patterned and etched to form a central gate
electrode 68 and gate dielectric 70 for each memory cell 22 of
semiconductor device 20. The polycrystalline silicon and gate
dielectric layer can be etched using conventional photolithography
and etch techniques.
In accordance with one embodiment of the invention a layer of oxide
72 is deposited over the gate electrodes and gate dielectric and a
layer of charge storage material 74 is deposited over the layer of
oxide. A further charge barrier layer of oxide 76 is deposited over
the layer of charge storage material with the three layers forming
an O--R--O layered storage node structure 77 as illustrated in FIG.
4 where "R" indicates a generic charge storage material. Although
described for convenience as a deposited oxide layer, layer of
oxide 72 (the first "O" of O--R--O) also can be a thermally grown
layer of silicon dioxide or can be formed of a dielectric material
other than an oxide. Layer of oxide 72 preferably is preferably a
tunneling layer having a thickness of about 3-12 nm that allows
tunneling of charge carriers between the semiconductor substrate
and the charge storage layer. In accordance with an embodiment of
the invention, layer 72 is formed independently of layer 70 of gate
dielectric. By forming the two layers independently, the thickness
of the two layers and their composition can be independently
specified. Independently forming layer 72 and layer 70 has
beneficial implications for allowing Fowler-Nordheim erasing of the
memory cells as explained below.
Charge storage layer 74 can be a deposited layer of silicon
nitride, silicon rich silicon nitride, polycrystalline silicon, or
other charge storage material. Silicon rich silicon nitride is a
silicon nitride having a silicon content greater than the silicon
content of stoichiometric silicon nitride. Silicon rich nitride is
more conductive than stoichiometric silicon nitride and tends to
have shallower trap energy levels and higher trap density, both of
which allow electrons to move easily to enable Fowler-Nordheim
erase of the memory storage node. The charge storage layer can be
deposited, for example by LPCVD to a thickness of preferably about
4-12 nm. If the charge storage layer is silicon nitride or silicon
rich silicon nitride, the layer can be deposited, for example, by
the reaction of dichlorosilane (SiH.sub.2Cl.sub.2) and ammonia. If
the charge storage layer is polycrystalline silicon, the layer can
be deposited by, for example, the reduction of silane. Charge
barrier layer 76 (the second "O" of O--R--O) can be a silicon oxide
or a high dielectric constant (high-K) insulator such as HfSiO, or
the like. Preferably the layer is deposited by LPCVD to a thickness
of about 4-15 nm. The charge barrier layer can also be formed of a
layer of silicon oxide together with a layer of high-K dielectric
material (not illustrated).
The method continues, in accordance with an embodiment of the
invention by the deposition of a layer of conductive material 78
over charge barrier layer 76 as illustrated in FIG. 5. Preferably
the layer of conductive material is a layer of polycrystalline
silicon, and the layer will hereinafter be referred to, for
convenience of description but without limitation, as a layer of
polycrystalline silicon. The layer of polycrystalline silicon is
deposited to a thickness sufficient to substantially fill the
spaces between gate electrodes 68. Preferably the layer of
polycrystalline silicon is deposited as a doped layer of
polycrystalline silicon by the addition of an impurity dopant
species such as arsenic to the reactants used to deposit the
layer.
As illustrated in FIG. 6, layer of polycrystalline silicon 78 is
etched back to expose a portion 80 of layered structure 72, 74, 76
at a sidewall 81 of central gate electrode 68. A portion of
sidewall 81 and portion 80 of the layered structure thus extend
above surface 82 of the etched polycrystalline silicon layer 78.
The polycrystalline silicon layer can be etched, for example, by
plasma etching in a Cl or HBr/O.sub.2 chemistry.
In accordance with an embodiment of the invention a layer of
silicon nitride or other sidewall spacer forming material is
deposited over the etched back polycrystalline silicon layer and
exposed portion 80 of the layered structure on sidewall 81. The
sidewall spacer forming material is anisotropically etched, for
example by reactive ion etching (RIE) in a CHF.sub.3, CF.sub.4, or
SF.sub.6 chemistry to form sidewall spacers 84 on exposed portion
80 of the layered structure and adjacent sidewalls 81 of the
central gate electrodes as illustrated in FIG. 7. The sidewall
spacers expose a portion 86 of surface 82 of etched back
polycrystalline silicon layer 78.
Sidewall spacers 84 are used as an etch mask to etch the exposed
portion of polycrystalline silicon layer 78, the layered structure
overlying the top of central gate electrode 68 and the portion of
layered structure 77 subsequently exposed after the etching of
layer 78. The etching also removes a portion of the layered
structure along sidewalls 81. The etching can be accomplished, for
example by plasma etching in a Cl or HBr/O.sub.2 chemistry to etch
the polycrystalline silicon and in a CHF.sub.3, CF.sub.4, or
SF.sub.6 chemistry to etch the layered O--R--O structure. The
etching exposes the top of central gate electrode 68 and a portion
90 of surface 66 of the semiconductor substrate. The etching also
forms control gates 92 and 94 adjacent opposite sides 96 and 98,
respectively, of central gate electrode 68 and overlying a charge
storage node portion 79 of layered structure 77 as illustrated in
FIG. 8.
As illustrated in FIG. 9, sidewall spacers 84 are also used as an
ion implantation mask and conductivity determining ions are
implanted into exposed portions 90 of the semiconductor substrate
as indicated by arrows 100 to form bit lines 102 and 104. The bit
lines are formed adjacent to and aligned with the memory storage
nodes. Bit lines are shared between adjacent memory cells. The ion
implantation also impurity dopes central gate electrodes 68. The
implanted ions can be arsenic or phosphorus to form N-type bit
lines. Those of skill in the art will understand that additional
ion implantations, either N-type or P-type, may also be used to
dope the channel region of the memory storage cell to control
threshold voltage, punch through voltage, and the like.
The method continues by the deposition of a dielectric layer 110.
The dielectric layer is deposited to a thickness at least
sufficient to fill the spaces between the gate electrode structures
as illustrated in FIG. 10. Layer 110 can be, for example, a layer
of silicon oxide deposited by a high temperature (HTO) deposition
process, a high density plasma (HDP) deposition process, or by an
LPCVD or PECVD process using, for example, tetraethylorthosilicate
(TEOS) as a reactant source. The resultant structure, if the
insulator is deposited by an HTO process, is illustrated in FIG. 10
and the following figures. The topography of layer 110 would be
somewhat different, as would be understood by those of skill in the
art, if the layer is deposited by a HDP process.
In accordance with one embodiment of the invention dielectric layer
110 is etched back or is polished back, for example by a CMP
process, to a thickness about the same as the height of or slightly
less than the height of central gate electrodes 68. In a CMP
process the silicon nitride sidewall spacers can be used as a
polish stop. The CMP process can be followed by a chemical etch.
Following the etch back or CMP step, sidewall spacers 84 and a
portion of silicon nitride or silicon rich silicon nitride portion
74 of layered structure 77 are removed, for example by etching in
hot phosphoric acid (H.sub.3PO.sub.4). Layers 72 and 76 of the
layered O--R--O structure can then be etched in a dilute
hydrofluoric acid solution to reduce the height of the layered
structure along sidewall 81 (or respectively 96 and 98) of central
gate electrode 68 as illustrated in FIG. 11.
A further layer of conductive material, preferably polycrystalline
silicon, is deposited onto the etched back dielectric layer 110 and
in contact with central gates 68 and control gates 92 and 94. The
polycrystalline silicon can be deposited as an impurity doped layer
or can be deposited as an undoped layer that is subsequently
impurity doped. The further layer of conductive material is
photolithographically patterned and etched to form a word line 120
coupling all of the control gates and central gate electrodes in a
row as illustrated in FIG. 12. Those of skill in the art will
understand that other processing, either before, during, or after
the above described method steps, can be used to form the other
devices and interconnects used to implement the remainder of the
memory device.
In this structure, in accordance with an embodiment of the
invention, central gate electrode 68 overlies a gate dielectric
layer 70. On either side of central gate electrode 68 are control
gates 92 and 94, and each of the control gates overlies a layered
structure charge storage node structure 79 (originally part of
layered structure 77) that includes a tunnel dielectric 72, a
charge storage layer 74, and a charge barrier layer 76. Gate
dielectric layer 70 and tunnel dielectric layer 72 are formed
independently and can be formed of different materials and can have
different thicknesses. Charge storage nodes 79 of a memory cell 22
and the charge storage layers 74 of those nodes are separated by
gate dielectric 70. Prior art dual bit memory storage cells relied
upon a continuous charge storage layer with opposite extremities of
the layer able to independently store data in the form of stored
charge. Unfortunately such prior art structures were susceptible to
problems relating to reliability and data retention, especially if
the charge storage layer was formed of the slightly conductive
silicon rich silicon nitride, because charge could leak across the
gate structure from one storage node site to the other. These
problems were especially prevalent as a result of repeated cycling
of program, erase, and read cycles. Separating the charge storage
nodes by an independently formed, relatively thick (in comparison
to the tunnel dielectric) gate dielectric avoids the problem of
charge leakage or spillage from one storage node to the other. In
addition, the memory device fabricated in accordance with the
various embodiments of the invention can be effectively erased by
Fowler-Nordheim tunneling. FN erasing is desirable because such
erasing is faster and requires less power. A FN erase cycle
requires the application of relatively high voltages to the word
line. In prior art structures such high voltages might cause
injection through the central gate dielectric which, in turn, might
cause data disturb in the adjacent memory storage node as well as
in the memory storage node intended to be erased. Devices
fabricated in accordance with the invention are able to be FN
erased because the central gate dielectric is relatively thicker
that the tunnel dielectric of the memory storage nodes, and that
under erase conditions tunneling can occur through the tunnel
dielectrics, but there is no charge injection through the thicker
central gate dielectric.
While at least one exemplary embodiment has been presented in the
foregoing detailed description, it should be appreciated that a
vast number of variations exist. It should also be appreciated that
the exemplary embodiment or exemplary embodiments are only
examples, and are not intended to limit the scope, applicability,
or configuration of the invention in any way. Rather, the foregoing
detailed description will provide those skilled in the art with a
convenient road map for implementing the exemplary embodiment or
exemplary embodiments. It should be understood that various changes
can be made in the function and arrangement of elements without
departing from the scope of the invention as set forth in the
appended claims and the legal equivalents thereof.
* * * * *