U.S. patent number 7,522,660 [Application Number 10/897,073] was granted by the patent office on 2009-04-21 for pulse pattern generating apparatus.
This patent grant is currently assigned to Yokogawa Electric Corporation. Invention is credited to Yasukazu Akasaka, Ikurou Aoki, Kousuke Doi, Shinji Kobayashi, Hirotoshi Kodaka, Hiroyuki Matsuura, Akira Miura, Masamichi Ohashi, Hironori Okita, Chie Sato, Hiroshi Sugawara, Akira Toyama, Morio Wada, Tsuyoshi Yakihara.
United States Patent |
7,522,660 |
Sato , et al. |
April 21, 2009 |
Pulse pattern generating apparatus
Abstract
An object of this invention is to realize a pulse pattern
generating apparatus that outputs a test signal of high waveform
quality even when the shape of an eye pattern is changed. This
invention is an improvement of a pulse pattern generating apparatus
that generates a test signal of a predetermined pattern by using
plural digital-analog converters and outputs the test signal to a
test subject. The apparatus includes: a parameter setting unit for
setting values of plural parameters that determine the shape of an
eye pattern of the test signal; a storage unit for storing output
values to the digital-analog converters corresponding to the values
of the parameters; an arithmetic operation unit for calculating
output values to the digital-analog converters from the values of
the parameters from the parameter setting unit and the output
values in the storage unit; and a voltage value setting unit for
setting, for the digital-analog converters, voltage values to be
outputted from the digital-analog converters on the basis of the
result of calculation by the arithmetic operation unit.
Inventors: |
Sato; Chie (Musashino,
JP), Kobayashi; Shinji (Musashino, JP),
Kodaka; Hirotoshi (Musashino, JP), Aoki; Ikurou
(Musashino, JP), Doi; Kousuke (Musashino,
JP), Toyama; Akira (Musashino, JP), Wada;
Morio (Musashino, JP), Matsuura; Hiroyuki
(Musashino, JP), Sugawara; Hiroshi (Musashino,
JP), Ohashi; Masamichi (Musashino, JP),
Okita; Hironori (Musashino, JP), Akasaka;
Yasukazu (Musashino, JP), Yakihara; Tsuyoshi
(Musashino, JP), Miura; Akira (Musashino,
JP) |
Assignee: |
Yokogawa Electric Corporation
(Tokyo, JP)
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Family
ID: |
34269990 |
Appl.
No.: |
10/897,073 |
Filed: |
July 23, 2004 |
Prior Publication Data
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Document
Identifier |
Publication Date |
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US 20050058190 A1 |
Mar 17, 2005 |
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Foreign Application Priority Data
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Sep 16, 2003 [JP] |
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2003-322383 |
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Current U.S.
Class: |
375/224;
702/124 |
Current CPC
Class: |
G01R
31/3171 (20130101); G01R 31/31928 (20130101) |
Current International
Class: |
H04B
3/46 (20060101) |
Field of
Search: |
;370/252 ;375/224,230
;345/340 ;714/704 ;702/124 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
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8-331102 |
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Dec 1996 |
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JP |
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2001-144819 |
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May 2001 |
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JP |
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Primary Examiner: Payne; David C
Assistant Examiner: Nguyen; Leon-Viet Q
Attorney, Agent or Firm: Westerman, Hattori, Daniels &
Adrian, LLP.
Claims
What is claimed is:
1. A pulse pattern generating apparatus that generates a test
signal of a predetermined pattern for measuring waveform quality of
a digital signal by using plural digital-analog converters and
outputs the test signal to a test subject, the apparatus
comprising: a parameter setting unit for setting values of plural
parameters that determine the shape of an eye pattern of the test
signal; wherein the parameter setting unit displays a screen where
a user can input values via a user interface in order to set and
change a cross point position, relative to the rest of the eye
pattern, and to set and change an amplitude of the eye pattern; a
storage unit for storing output values to the digital-analog
converters corresponding to the values of the parameters within
setting ranges in which the values of the parameters are set; an
arithmetic operation unit for calculating output values to the
digital-analog converters from the values of the parameters from
the parameter setting unit and the output values in the storage
unit; a voltage value setting unit for setting, for the
digital-analog converters, voltage values to be outputted from the
digital-analog converters on the basis of the result of calculation
by the arithmetic operation unit; and wherein the arithmetic
operation unit performs interpolation from the output values in the
storage unit and thus calculates output values corresponding to the
values of the parameters set by the parameter setting unit.
2. The pulse pattern generating apparatus as claimed in claim 1,
wherein the test signal is a pseudo-random pattern signal.
3. The pulse pattern generating apparatus as claimed in claim 1,
wherein the parameters set by the parameter setting unit are: a
cross point of the eye pattern; and amplitude of the eye
pattern.
4. The pulse pattern generating apparatus as claimed in claim 1,
wherein the output values to the digital-analog converters stored
in the storage unit are actually measured values.
5. The pulse pattern generating apparatus as claimed in claim 1,
wherein the output values to the digital-analog converters stored
in the storage unit are model values or statistical values.
6. The pulse pattern generating apparatus as claimed in claim 1,
wherein the transmission rate of the test signal is higher than 10
[Gbps].
Description
BACKGROUND OF THE INVENTION
1. Field of the Invention
This invention relates to a pulse pattern generating apparatus that
generates a test signal of a predetermined pattern for measuring
the waveform quality of a digital signal by using plural
digital-analog converters and then outputting the generated signal
to a test subject, and particularly to a pulse pattern generating
apparatus that outputs a test signal of high waveform quality even
if the shape of an eye pattern is changed.
2. Description of the Related Art
When a digital signal using an electric signal or an optical signal
is transmitted through a transmission line or inputted to a device,
which is a test subject, the waveform quality of the digital signal
is deteriorated by the characteristics of the test subject. The
deterioration in the waveform quality causes increase in the bit
error rate, increase of jitter, variance of the amplitude of
waveform, change in the shape of an eye pattern and the like.
Generally, for testing the deterioration in the waveform quality, a
test signal is inputted to a test subject and an output signal
outputted from the test subject is received. Then, the received
signal and the test signal are compared with each other to measure
the bit error rate (see, for example, JP-A-8-331102 (paragraph
nos.0002-0008, FIGS. 3 and 4)) or to measure an eye pattern (see,
for example, JP-A-2001-144819 (paragraph nos.0002-0008, FIG. 8)).
The test is thus performed.
Therefore, the test signal needs to have high waveform quality
(i.e., less jitter, less variance in amplitude, less noise, less
overshoot/undershoot, high opening rate of the eye pattern and the
like).
FIG. 1 shows the structure of a conventional pulse pattern
generating apparatus.
FIG. 2 shows an eye pattern (with a cross point of 50%) of a test
signal outputted from the apparatus shown in FIG. 1.
In FIG. 1, a voltage value setting unit 10 has a pattern generator
circuit 11 and sets a voltage value for causing a signal outputted
from the pattern generator circuit 11 to have an eye pattern of a
predetermined shape. The pattern generator circuit 11 outputs an
M-sequence pseudo-random pulse pattern (hereinafter simply referred
to as pulse pattern) signal.
A waveform generator unit 20 has digital-analog converters
(hereinafter simply referred to as DA converters) 21 to 24, an
amplifier 25, an upper limit clipping circuit 26 and a lower limit
clipping circuit 27. The waveform generator unit 20 generates and
outputs a pulse pattern signal having an eye pattern of a desired
shape in accordance with the setting from the voltage value setting
unit 10. The pulse pattern signal outputted from the waveform
generator unit 20 is a test signal of the predetermined
pattern.
The DA converters 21 to 24 output voltage values set in accordance
with the setting from the voltage value setting unit 10. The
amplifier 25 amplifies the pulse pattern signal from the pattern
generator circuit 11 in accordance with the output from the DA
converter 21, and the outputs the amplified pulse pattern signal.
The upper limit clipping circuit 26 includes, for example, a diode,
a resistor, a capacitor and the like. The upper limit clipping
circuit 26 clips the pulse pattern signal outputted from the
amplifier 25 and offset by the output from the DA converter 22, at
an upper limit value of a certain constant level in accordance with
the output from the DA converter 23, and outputs the clipped pulse
pattern signal. The lower limit clipping circuit 27 includes, for
example, a diode, a resistor, a capacitor and the like. The lower
limit clipping circuit 27 clips the pulse pattern signal outputted
from the upper limit clipping circuit 26, at a lower limit value of
a certain constant value in accordance with the output from the DA
converter 24.
The operation of this apparatus will now be described.
The pulse pattern generator circuit 11 of the voltage value setting
unit 10 outputs a pulse pattern signal of small amplitude to the
amplifier 25. The voltage value setting unit 10 sets the voltage
values of the DA converters 21 to 24 synchronously with the pulse
pattern signal from the pulse pattern generator circuit 11. The DA
converters 21 to 24 outputs the voltage values thus set.
Then, the amplifier 25 amplifies the pulse pattern signal of small
amplitude to desired amplitude at an amplification factor
corresponding to the voltage value outputted from the DA converter
21. The pulse pattern signal is amplified to amplitude that is
sufficiently larger than the amplitude of the pulse pattern signal
outputted from the lower limit clipping circuit 27.
The amplified pulse pattern signal is offset by the voltage value
outputted from the DA converter 22 and inputted to the upper limit
clipping circuit 26. For example, because of the offset from the DA
converter 22, the lower limit value used for clipping by the lower
value clipping circuit 27 becomes 1 [V].
Moreover, the upper limit clipping circuit 26 performs clipping at
an upper limit value of a level corresponding to the voltage value
outputted from the DA converter 23, for example, at a level
slightly lower than a high level. Specifically, the level is
determined as the output from the DA converter 23 is added as a
bias voltage of a diode, not shown, of the upper limit clipping
circuit 26. Then, the clipped pulse pattern signal is outputted to
the lower value clipping circuit 27. Since the voltage of the level
at which clipping is performed is changed by the bias voltage to
the diode, the voltage value of the level at which clipping is
performed and the voltage value outputted from the DA converter 23
have a nonlinear relation.
Then, the lower limit clipping circuit 27 performs clipping at a
lower limit value of a level corresponding to the voltage value
outputted from the DA converter 24. For example, it performs
clipping at a position where the cross point of the eye pattern is
50% as shown in FIG. 2. Then, the pulse pattern signal shown in
FIG. 2, which has the new levels at which clipping is performed by
the clipping circuits 26 and 27, as its high and low levels, is
outputted to a test subject, not shown. Of course, the level
difference between the new high and low levels is the amplitude.
Although the pulse pattern signal outputted from the pattern
generator circuit 11 has overshoot and undershoot, these are
eliminated by the clipping circuits 26 and 27. In this manner, the
pulse pattern signal of high waveform quality is outputted. The
offset in FIG. 2 is not the voltage value outputted from the DA
converter 22 but is the level difference between the level of 0 [V]
and an intermediate level between the low and high levels.
The apparatus shown in FIG. 1 as described above outputs a test
signal of high waveform quality by setting the voltage values of
the plural DA converters 21 to 24 in accordance with the pulse
pattern signal. In this apparatus, the cross point and amplitude,
which are parameters to determine the shape of the eye pattern,
have fixed values. This is because the voltage values of the DA
converters 21 to 24 are closely related with the shape of the eye
pattern and cannot be set easily.
For example, the case of changing the value of the cross point from
50% to 30% while the amplitude remains unchanged will now be
described with reference to FIGS. 3A to 3C. FIGS. 3A to 3C show the
eye patterns of the pulse pattern signal. FIG. 3A shows the eye
pattern of the pulse pattern signal outputted form the amplifier
25. FIG. 3B shows the eye pattern of the pulse pattern signal with
the cross point of 50%. FIG. 3C shows the eye pattern of the pulse
pattern signal outputted from the amplifier 25 (having a larger
amplification factor than in FIG. 3A).
First, when the cross point is 50%, as described above, clipping is
performed at level L1 of the upper limit value and at level L2 of
the lower limit value as shown in FIG. 3A. Thus, a pulse pattern
signal having the eye pattern with the amplitude shown in FIG. 3B
and the cross point of 50% is generated.
On the other hand, in the case of changing the cross point to 30%,
if level L2 of the lower limit value shown in FIG. 3A is simply
raised, the amplitude changes. Moreover, the changed level and
level L2 are different levels. Thus, the setting of the voltage
value of the DA converter 21 is first changed and the amplification
factor of the amplifier 25 is increased to generate a pulse pattern
signal having the eye pattern shown in FIG. 3C. Then, the setting
of the voltage values of the DA converters 23 and 24 is changed and
clipping is performed at level L3 of the upper limit value and at
level L4 of the lower limit value. Thus, a pulse pattern signal
having the same amplitude as in FIG. 3B and a different cross point
is generated. Of course, to equalize level L2 and level L4 of the
lower limit value, the voltage value of the DA converter 22 is set
and the quantity of offset is changed.
Similarly, in the case of changing the amplitude alone, it is
necessary to not only change the setting of the voltage value of
the DA converter 21, which determined the amplification factor of
the amplifier 25, but also change the setting of the voltage values
of the DA converters 22 to 24. Since the shape of the eye pattern
is closely related with the voltage values set in the DA converters
21 to 24, the parameter values are generally fixed.
However, while users strongly want to input a pulse pattern signal
having large amplitude or change the cross point depending on the
test subject, there is a problem that the fixed shape of the eye
pattern limits the subjects that can be tested. If a user
personally changes the shape of the eye pattern, it is difficult to
optimally set the voltage values of all the DA converters 21 to 24
and a pulse pattern signal of poor waveform quality is outputted.
This causes a problem that the test cannot be carried out
accurately. Particularly when the transmission rate of the pulse
pattern signal is very high, for example, higher than 10 [Gbps], it
is difficult to set the voltage values of the DA converters 21 to
24.
SUMMARY OF THE INVENTION
It is an object of this invention to realize a pulse pattern
generating apparatus that outputs a test signal having high
waveform quality even when the shape of the eye pattern is
changed.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a structure view of a conventional pulse pattern
generating apparatus.
FIG. 2 is a view showing an eye pattern (with a fixed parameter) of
a pulse pattern signal outputted from the apparatus shown in FIG.
1.
FIGS. 3A to 3C are views showing eye patterns of pulse pattern
signals.
FIG. 4 is a structural view showing a first embodiment of this
invention.
FIGS. 5A and 5B are views showing exemplary characteristics stored
in a storage unit 40.
FIG. 6 is a view showing an exemplary screen display for setting
parameters.
FIG. 7 is a view showing eye patterns of pulse pattern signals
outputted from the apparatus shown in FIG. 4.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
Embodiments of this invention will now be described with reference
to the drawings.
FIG. 4 is a structural view showing an embodiment of this
invention. The same elements as in FIG. 1 are denoted by the same
numerals and will not be described further in detail. In FIG. 4, a
parameter setting unit 30 is additionally provided. It sets values
of plural parameters (cross point and amplitude) that determine the
shape of an eye pattern.
Also a storage unit 40 is additionally provided. It stores an
output value to the DA converter 21 of the waveform generator
circuit 20 corresponding to the parameter values, that is,
characteristics of the parameter values and output values, within
the setting ranges of the parameter values (for example, the
setting range of the cross point is 30 to 70% and the setting range
of the amplitude is 1 to 5 [V]).
Also an arithmetic operation unit 50 is additionally provided. It
calculates output values to the DA converters 21 to 24 of the
waveform generator unit 20 from the parameter values set by the
parameter setting unit 30 and the output value in the storage unit
40.
A voltage value setting unit 60 is provided instead of the
above-described voltage value setting unit 10. The voltage value
setting unit 60 has a pattern generator circuit 61 similar to the
pattern generator circuit 11, and sets voltage values to be
outputted from the DA converters 21 to 24, for the DA converters 21
to 24 of the waveform generator unit 20 on the basis of the result
of calculation from the arithmetic operation unit 50. The pattern
generator circuit 61 outputs a signal of a very high transmission
rate, for example, a pulse pattern signal of higher than 10
[Gbps].
The operation of this apparatus will now be described.
First, the characteristics of the parameter values and output value
are stored in advance into the storage unit 40. For example, this
is done at the time of manufacturing the apparatus shown in FIG. 4
or at the time of maintenance. This storage operation will be
described first. An oscilloscope, not shown, is connected to the
output side of the waveform generator unit 20, and a pulse pattern
signal outputted from the waveform generator unit 20 is measured by
the oscilloscope. In this case, sweep is triggered by a clock
component of the pulse pattern signal, and a waveform changing from
the low level to the high level, a waveform changing from the high
level to the low level, a waveform keeping the low level, and a
waveform keeping the high level are superimposed to display an eye
pattern.
Then, if the setting range of the cross point is 30 to 70% and the
setting range of the amplitude is 1 to 5 [V], while the eye pattern
displayed on the oscilloscope is observed, output values to the DA
converters 21 to 24 corresponding to individual parameter values
are calculated with the cross point changed by 5% each and the
amplitude changed by 0.5 [V] each. The calculated output values are
stored into the storage unit 40.
Specifically, while the eye pattern displayed on the oscilloscope
is observed, voltage values to be outputted from the DA converters
21 to 24 are adjusted so that the eye pattern has amplitude of 1
[V] and a cross point of 30%. The values set in the DA converters
21 to 24 at this point are stored into the storage unit 40 as
output values corresponding to the amplitude of 1 [V] and the cross
point of 30%.
Then, the voltage values to be outputted from the DA converters 21
to 24 are adjusted so that the eye pattern has amplitude of 1.5 [V]
and a cross point of 30%. The values set in the DA converters 21 to
24 at this point are stored into the storage unit 40 as output
values corresponding to the amplitude of 1.5 [V] and the cross
point of 30%.
Similarly, the characteristics of output values corresponding to
combinations of the values of the amplitude and the values of the
cross point (81 combinations in total) are stored into the storage
unit 40.
FIGS. 5A and 5B are views showing characteristics stored into the
storage unit 40. FIG. 5A is an explanatory view of each axis. FIG.
5B is a view showing characteristics of each of the DA converters
21 to 24. In FIGS. 5A and 5B, the X-axis represents amplitude, the
Y-axis represents cross point, and the Z-axis represents the output
value to the DA converters 21 to 24. Of course, the value on the
Z-axis and the voltage value outputted from each of the DA
converters 21 to 24 correspond to each other in a one-to-one
correspondence. For example, when the value on the Z-axis is 2000,
the DA converter 21 outputs a voltage value of 2 [V]. When the
value on the Z-axis is 2200, the DA converter 21 outputs a voltage
value of 2.2 [V].
Now, the operation of generating a pulse pattern signal for
measuring the waveform quality of a digital signal by using the
plural DA converters 21 to 24 and outputting the generated pulse
pattern signal to a test subject will be described.
The parameter setting unit 30 displays a screen shown in FIG. 6 on
a display unit (for example, CRT or liquid crystal display), not
shown. In FIG. 6, the amplitude is set by using either a text box
100 or a scroll bar 101, and the cross point is set by using either
a text box 102 or a scroll bar 103. The values of the amplitude and
cross point may be displayed in such a manner that the user can
only set the values within the setting ranges stored in the storage
unit 40.
Then, the user sets the value of the amplitude and the value of the
cross point (for example, amplitude of 3.45 [V] and cross point of
50%) via a user interface, not shown. The parameter setting unit 30
reads the parameter values set by the user and outputs these values
to the arithmetic operation unit 50.
The arithmetic operation unit 50 thus calculates the output values
to the DA converters 21 to 24 from the storage unit 40. For
example, according to FIG. 5B, the output value to the DA converter
21 is 2040. Since the storage unit 40 stores the output values
corresponding to an amplitude value of every 0.5 [V] and a cross
point value of every 5%, if corresponding amplitude and cross point
are not found, the arithmetic operation unit 50 performs linear
interpolation or curved interpolation from values close to the
preset values (for example, amplitude values of 3 [V] and 3.5 [V])
and thus calculates the output values.
Then, the arithmetic operation unit 50 outputs the result of the
calculation to the voltage value setting unit 60. The pulse pattern
generator circuit 61 of the voltage value setting unit 60 outputs a
pulse pattern signal of small amplitude to the amplifier 25. From
the output values as the result of the calculation, the voltage
value setting unit 60 sets voltage values to be outputted from the
DA converters 21 to 24, for each of the DA converters 21 to 24. The
voltage value setting unit 60 may output the voltage values to the
DA converters 21 to 24 synchronously with the pulse pattern signal
from the pulse pattern generator circuit 61. The DA converters 21
to 24 thus output the preset voltage values, respectively.
The operations of the amplifier 25, the upper limit clipping
circuit 26 and the lower limit clipping circuit 27 of the waveform
generator unit 20 are the same as in the apparatus shown in FIG. 1
and therefore will not be described further in detail. FIG. 7 shows
eye patterns of pulse pattern signals outputted from the apparatus
shown in FIG. 4. FIG. 7 shows eye patterns outputted while changing
parameter values in various manners. It can be seen from FIG. 7
that pulse pattern signals having very high waveform quality
equivalent to the waveform quality of the eye pattern shown in FIG.
2 are outputted. The three eye patterns in the upper row in FIG. 7
are displayed as they are enlarged in the direction of amplitude,
and their actual amplitude is smaller than the amplitude of the eye
patterns in the middle and lower rows.
In this manner, for each eye pattern shape, the output values of
the DA converters 21 to 24 are actually measured and stored into
the storage unit 40, and the arithmetic operation unit 50 uses the
output values in the storage unit 40 to calculate output values
that realize an eye pattern shape set by the parameter setting unit
30. On the basis of the result of the calculation, the voltage
value setting unit 60 sets the voltage values of the DA converters
21 to 24. This enables output of a pulse pattern signal of high
waveform quality even when the eye pattern shape is changed.
This invention is not limited to this structure and may have the
following structures.
While the four DA converters 21 to 24 are used in the waveform
generator unit 20 in the apparatus of FIG. 4, whatever number of DA
converters may be used. Similarly, in addition to the amplifier 25,
the upper limit clipping circuit 26 and the lower limit clipping
circuit 27, a circuit for generating a pulse pattern signal (for
example, a waveform shaping unit, phase shifter or the like) may be
provided in the waveform generator unit 20.
In the above-described structure, an electric signal outputted from
the waveform generator unit 20 is outputted to the test subject.
However, a light beam from a laser diode may be modulated by an
electric signal outputted from the waveform generator unit 20, thus
converted to an optical signal and then outputted to the test
subject.
In the above-described structure, the output values to the DA
converters 21 to 24 stored into the storage unit 40 are actually
measured values that have been found in advance. However, model
values acquired by modeling the waveform generator unit 20 and then
performing numerical calculation, or statistical value of actually
measured values on plural apparatuses shown in FIG. 4 may be used.
In this case, since actual measuring on each apparatus need not be
carried out, the time required until storing the output values to
the storage unit 40 can be reduced.
While the setting ranges of the parameters are 1 to 5 [V] for
amplitude and 30 to 70% for cross point in the above-described
structure, whatever setting range may be used.
In the above-described structure, the output values stored into the
storage unit 40 are every 0.5 [V] for amplitude and every 5% for
cross point. However, whatever interval may be set between the
output values and unequal intervals may be used.
Moreover, while amplitude and cross point are used as examples of
the parameters for determining the eye pattern shape in the
above-described structure, the offset shown in FIG. 2 maybe used as
the parameter. In this case, output values corresponding to the
offset are stored into the storage unit 40.
This invention has the following effects.
Output values of digital-analog converters for each eye pattern
shape are stored into the storage unit. The arithmetic operation
unit uses the output values in the storage unit to calculate output
values that realize an eye pattern shape set by the parameter
setting unit. On the basis of the result of the calculation, the
voltage value setting unit sets voltage values of the
digital-analog converters. This enables output of a test signal of
high waveform quality even when the eye pattern shape is
changed.
Since the arithmetic operation unit performs interpolation from the
output values in the storage unit and thus calculates the output
values corresponding to desired parameter values, a test signal of
high waveform quality can be outputted even when the eye pattern
shape is changed to a desired shape.
Since the storage unit stores actually measured values on each
apparatus as output values, a test signal of higher waveform
quality can be outputted even when the eye pattern shape is
changed.
Since the storage unit stores model values or statistical values as
output values, actual measuring need not carried out on each
apparatus. This enables reduction in the time required until
storing the output values to the storage unit.
* * * * *