U.S. patent number 3,868,506 [Application Number 05/383,611] was granted by the patent office on 1975-02-25 for x-ray diffraction instrument.
This patent grant is currently assigned to Rigaku Denki Company Limited. Invention is credited to Katsuhiko Ogiso.
United States Patent |
3,868,506 |
Ogiso |
February 25, 1975 |
X-RAY DIFFRACTION INSTRUMENT
Abstract
According to this invention a mount for X-ray tubes is rotatable
around the axis of an X-ray which is incident upon a specimen. A
support for the mount is rotatable around a straight line passing
through the point at which the X-ray is incident upon the specimen
and a holder for a first guide rail is rotatable around a straight
line which intersects a first straight line at right angles. Guide
rails permit the X-ray sources and diffracted X-ray detectors to
travel along such guide rails, so that the internal strain,
residual austenite and crystal orientation of the specimen can be
measured without being limited by the configuration of specimen's
surface.
Inventors: |
Ogiso; Katsuhiko (Tokyo,
JA) |
Assignee: |
Rigaku Denki Company Limited
(Tokyo, JA)
|
Family
ID: |
12009325 |
Appl.
No.: |
05/383,611 |
Filed: |
July 30, 1973 |
Foreign Application Priority Data
|
|
|
|
|
Feb 20, 1973 [JA] |
|
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48-19797 |
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Current U.S.
Class: |
378/72; 378/197;
378/73 |
Current CPC
Class: |
G01N
23/207 (20130101) |
Current International
Class: |
G01N
23/207 (20060101); G01N 23/20 (20060101); G01n
023/20 () |
Field of
Search: |
;250/272,277,278,279,490,491 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Lawrence; James W.
Assistant Examiner: Anderson; B. C.
Attorney, Agent or Firm: Breiner; A. W.
Claims
I claim:
1. An x-ray diffraction instrument comprising a mount for an x-ray
source; an x-ray source constructed and arranged on said mount; a
first circular guide rail constructed and arranged on said mount;
said first circular guide rail having its center aligned with a
point where an x-ray from said source is incident on a specimen; a
plurality of detectors for detecting diffracted x-ray arranged on
said first circular guide rail; a second circular guide rail having
its center aligned with said x-ray incident point; a support for
supporting said mount to rotate said mount around an axis aligned
with the direction of x-ray incident onto the specimen, said
support being movable along said second circular guide rail; means
for holding said circular guide rail to rotate said second rail
around an axis formed by a vertical straight line passing through
said x-ray incident point; and a shaft for carrying said means to
rotate said holder around an axis formed by a horizontal straight
line intersecting said vertical straight line at said x-ray
incident point.
2. An X-ray diffraction instrument according to claim 1,
characterized in that the rotation centers of the mount, first
guide rail, the support and the centers of the first and second
circular guide rails are all at the point where the X-ray is
incident onto the specimen.
3. An x-ray diffraction instrument according to claim 1,
characterized in that the three detectors for the diffracted x-ray
are arranged on the first guide rail; and an electric motor and a
gear box are constructed and arranged with said mount for driving
the first and second detectors in symmetrical relation with the
direction of the incident x-ray and for driving the second and
third detectors in the same direction at the same angular speed.
Description
DETAILED DESCRIPTION OF THE INVENTION
This invention relates to an X-ray diffraction instrument. When a
characteristic X-ray is applied on a metal surface, a diffraction
phenomenon takes place. Since this phenomenon gives informations
such as the angle of the incident X-ray from the diffracted X-ray
and the intensity of the diffracted X-ray, the state of the metal
crystal can be determined in a non-destructive manner by analyzing
these informations.
The metal weld, for example, may sometimes include a residual
strain which occurs during cooling by shrinkage. The residual
strain may remarkably reduce the strength of the material. It is
already known that the residual strain can be measured by the
diffraction angle of X-ray. When a carbon steel in .gamma.-phase
and at a high temperature is cooled rapidly, lattice modification
occurs in the material which accompanies the change in volume, and
the carbon steel changes into .alpha.-phase. A complicated residual
strain appears due to the interaction of the stress caused by the
cubical expansion resulting from the lattice modification and the
stress caused by shrinkage during cooling. In this case the whole
carbon steel in .gamma.-phase is not modified into .alpha.-phase
but a portion of it remains in the unstable .gamma.-phase due to
rapid cooling. This is the residual austenite, which is modified
with time into the stable .alpha.-phase by the external force,
heat, etc. Since this is a lattice modification, it accompanies the
change in volume which, in turn, results in the change in size or
in residual strain. The mechanical and physical properties of the
metal products such as cold-rolled steel plates and pressed
products, which have been subjected to a remarkable plastic
deformation, are changeable because the metal crystal of these
products has an orientation. The residual strain, residual
austenite and aggeregation structure of crystals have an
interrelationship with each other and form important factors for
determining the strength of the metallic material.
The purpose of this invention is to provide an X-ray diffraction
instrument for measuring not only the residual strain but also the
residual austenite and aggregation structure at the same positions
of the actual structures and components.
The invention will be described in more detail with reference to
the accompanying drawings, in which
FIG. 1 is a front view of the X-ray diffraction instrument
according to one embodiment of this invention; and
FIG. 2 is an elevational view of the instrument shown in FIG.
1.
X-ray a is applied from an X-ray tube 2 onto the surface of a
specimen 1 of which residual strain, residual austenite and crystal
orientation are to be measured. Detectors 3, 4 and 5 are arranged
for detecting the diffracted X-ray b, c and d. The X-ray tube 2 is
fixedly attached to a mount 6, and the detectors 3, 4 and 5 are
mounted on a circular guide rail 7 formed on the mount 6 so that
they are movable along the guide rail 7. The guide rail 7 is formed
into a circular configuration of which center coincides with point
p at which the X-ray is incident upon the surface of the specimen.
An electric motor and a gear box are arranged in the mount 6 for
driving the detectors 3 and 4 symmetrically about the axis of
incident X-ray a and for driving the detectors 4 and 5 in the same
direction at an equal angular speed. Another guide rail 8 is formed
into a circular configuration which has a larger diameter than the
guide rail 7 and has its center at point p. A support 9 is mounted
on the guide rail 8 so that it is movable along the guide rail 8.
The mount 6 for the X-ray sources are supported by the support 9 so
that it is rotatable around the axis of incident X-ray a. A holder
12 is carried by a bar at the forward end of the L-shaped arm 11
fixedly attached to the shaft 10. The holder 12 is supported by the
guide rail 8 in such a manner that it permits the rotation of the
guide rail 8 around a straight line a passing through the point p.
The shaft 10 is so arranged that its axis t intersects the line s
at point p at right angles.
The shaft 10 has a worm gear 13 mounted on it for driving the shaft
10 by a worm 14. An electric motor 15 is mounted on the holder 12
to drive the guide rail 8 through the gears 16 and 17 which are
operatively connected to the motor 15.
As is clear from the foregoing description, the instrument of this
invention involves .alpha.-rotation by the shaft 10,
.beta.-rotation around the line s and .gamma.-rotation around the
axis of X-ray irradiation a. The instrument of this invention
includes a circular guide rail 7 for the X-ray sources and a second
circular guide rail 8 for detectors for the diffracted X-ray. The
circular guide rails 7 and 8 have a common center which is point p
at which the X-ray is incident on the specimen. Accordingly, when
the surface of the specimen 1 is coincident with the axis t, the
residual strain on the surface of the specimen 1 can be determined
from the output curve of the detectors 3 and 4 by making the
direction a of the incident X-ray to coincide with line s and by
irradiating the X-ray onto the specimen surface at a suitable angle
which is selected by .alpha.-rotation of the shaft 10, and by
symmetrically moving the detectors 3 and 4 along the guide rail 7.
The guide rail 7 is generally arranged at right angles with axis t,
but depending on the configuration of the specimen and when the
diffracted X-ray is shielded, measurement can be carried out with
the guide rail 7 arranged in parallel with the axis t. When the
surface of the specimen 1 is at an angle with the axis t, the
support 9 can be moved along the guide rail 8 and .beta.-rotation
allows the X-ray to be irradiated onto the specimen surface at
right angles. Therefore, it is also possible to determine the
internal stress from the diffraction angle in this particular case
and the diffraction angle when the X-ray is irradiated onto the
specimen surface at an angle of, for instance, 45.degree..
The residual austenite can be determined from the ratio of the
intensity of the diffracted X-ray from the carbon steel in
.alpha.-phase to the intensity of the diffracted X-ray from the
carbon steel in .gamma.-phase. The intensity of these diffractions
can be measured with the detectors 4 and 5. The errors in the
measured diffraction due to the crystal orientation can be
minimized by calculating the average value of measurements for
various directions which can be measured during .alpha.- and
.beta.-rotations. According to the instrument of this invention, it
is not necessary to cut off the specimen and apply it to the
measuring device, but the measuring device is installed near the
specimen to carry out a non-destructive measurement.
When the specimen has an X-ray diffraction angle of .theta., if the
specimen is located so that the surface thereof is in parallel with
the axis t, and the incident X-ray a and the diffracted X-ray b are
both at an angle of (.pi./2 - .theta.) with axis s, the crystal
lattice surface which is in parallel with the specimen surface can
be observed. Consequently, the crystal orientation on the surface
of the specimen can be measured during .beta.- and
.alpha.-rotations.
It will be noted that the instrument according to this invention
permits measurement of the internal strain, residual austenite and
crystal orientation at desired positions of a fixed specimen. The
instrument is also very excellent in that it measures strains in
various directions and avoids errors from the measurements of
residual austenite which may otherwise result from the crystal
orientation.
* * * * *