U.S. patent number 3,668,384 [Application Number 04/812,237] was granted by the patent office on 1972-06-06 for mass spectrometer.
This patent grant is currently assigned to The Bendix Corporation. Invention is credited to Richard H. Lehman, Charles J. Moorman.
United States Patent |
3,668,384 |
Moorman , et al. |
June 6, 1972 |
MASS SPECTROMETER
Abstract
A mass spectrometer having means operatively connecting a
circuit which provides a time lag between each ionizing electron
pulse and each ion accelerating pulse to a delay circuit in an
output scanner comprising the spectrometer so that each mass in the
spectrum which is under observation will always be in best
focus.
Inventors: |
Moorman; Charles J.
(Cincinnati, OH), Lehman; Richard H. (Cincinnati, OH) |
Assignee: |
The Bendix Corporation
(N/A)
|
Family
ID: |
25208958 |
Appl.
No.: |
04/812,237 |
Filed: |
April 1, 1969 |
Current U.S.
Class: |
250/287;
250/427 |
Current CPC
Class: |
H01J
49/025 (20130101); H01J 49/403 (20130101) |
Current International
Class: |
H01J
49/40 (20060101); H01J 49/34 (20060101); H01j
039/34 () |
Field of
Search: |
;250/41.9G,41.9SB,41.9TF
;313/63,230 |
References Cited
[Referenced By]
U.S. Patent Documents
Other References
"The Encyclopedia of Spectroscopy," Edited by G. L. Clark,
Published by Reinhold Publishing Corp., New York, 1960, pages
631-636 QC451C55..
|
Primary Examiner: Lindquist; William F.
Claims
1. In combination with a time-of-flight mass spectrometer of the
type having an ionization chamber for receiving molecules of
material to be analyzed, means for providing electron pulses to
convert the molecules into ions, means for periodically
accelerating the ions to provide ion pulses, said accelerating
means including a grid disposed in said ionization chamber and
means for applying a plurality of electrical pulses to said grid to
accelerate ions out of said ionization chamber, a tube for
receiving the ion pulses, means for measuring the time-of-flight
through said tube of ions in said ion pulses, said measuring means
including an electron multiplier having a plurality of channels for
measuring electron current and means for gating electrons, said
gating means including means for applying voltage pulses thereto to
gate electrons associated with ions of a particular mass into a
predetermined channel of said measuring means, the improvement
comprising:
said accelerating means further comprising an electrical circuit
having means for establishing a first variable time delay between
the end of each electron pulse and the beginning of each ion
acceleration pulse applied to said grid to selectively vary the
mass of the ion in best focus; means electrically connected to said
gating means for establishing a second variable time delay between
the beginning of each ion accelerating pulse applied to said grid
and the beginning of each gate pulse to selectively vary the
detection of electrons associated with different ion masses; means
for applying said gate pulses to one of said electron multiplier
channels in accordance with a predetermined time sequence to gate
electrons associated with different masses into a predetermined
channel for measurement; and means electrically connected to said
first time delay circuit and said second time delay circuit to
synchronously vary said first and second time delays so that as
said gate pulses are sequentially applied to one of said electron
multiplier channels each particular mass at the time is in best
focus.
Description
BACKGROUND OF THE INVENTION
Attempts have been made heretofore to improve the performance of a
time-of-flight (TOF) mass spectrometer by introducing a time lag
between each ion forming electron pulse and ion accelerating pulse.
However, this technique has the disadvantage of being mass
dependent, i.e., the time lag required for optimum focus is related
to the mass which is in best focus while other masses in the
spectrum experience defocusing, whereby there is a basic problem of
providing optimum focusing for a plurality of masses in the
spectrum under observation.
SUMMARY
This invention provides an improved mass spectrometer having means
operatively connecting a circuit which provides a time lag between
each ionizing electron pulse and each ion accelerating pulse to a
delay circuit operatively connected to electrical gate means
associated with an output scanner comprising the spectrometer so
that one or more masses in a particular spectrum which is under
observation will always be in best focus.
Other details, uses, and advantages of this invention will become
apparent as the following description of the exemplary embodiment
thereof presented in the accompanying drawing proceeds.
BRIEF DESCRIPTION OF THE DRAWING
The accompanying drawing illustrates one exemplary embodiment of a
mass spectrometer of this invention with certain parts in cross
section, other parts broken away, and still others shown
schematically.
DESCRIPTION OF ILLUSTRATED EMBODIMENT
Reference is now made to the drawing which illustrates an exemplary
time-of-flight (TOF) mass spectrometer 10 which is made in
accordance with this invention. The spectrometer 10 has an
ionization chamber and drift tube assembly 11 which has an
ionization chamber 12 suitably defined at one end thereof and
electrical gate means provided at its opposite end and shown in
this example as a plurality of three electrical gates.
The anodes 13, 14, 15 of the electrical gates are suitably
operatively connected to associated measuring means which are
utilized to determine and indicate the character of each mass being
observed by the spectrometer 10. In this example of the invention a
two channel recorder 16 is provided and has its channel 1
operatively connected to anode 13 and its channel 2 operatively
connected to gate 14 and oscilloscope 17 is provided and
operatively connected to gate 15.
The spectrometer 10 has an inlet 18 which receives molecules of a
fluid such as a gas "G" which is to be analyzed and conveys such
gas molecules into the ionization chamber 12. The molecules of gas
"G" in the ionization chamber 12 are converted to ions, in a known
manner, by electron bombardment in the form of electrical pulses
which will be referred to as ionizing electron pulses provided in
this example by an electron pulse generator 20.
The ions thus formed by electron bombardment are periodically moved
out of the ionization chamber 12 by the application of what will be
referred to as ion pulses which are provided by an ion pulse
generator 21 which provides suitable electrical pulses to a grid 22
arranged adjacent the downstream end of the ionization chamber 12.
The ion pulses provided by the ion pulse generator 21 are effective
in accelerating the ions toward the electrical gates, and initially
such ions move through a field free region 23 of the ionization and
drift tube assembly 11. The assembly 11 may comprise suitable
deflector plates 24 and lens 25 for purposes which are well known
in the spectrometer art.
The ions move through the field free region 23 of the TOF mass
spectrometer 10 as a function of their mass-to-charge ratios, and
in a manner well known in the art, whereby they are separated into
groups or bunches with the lightest group reaching an electron
multiplier 26 comprising the spectrometer 10 first followed by
successively heavier groups. The electron multiplier 26 may be
supplied with power from any suitable source and an ion cathode 30
of the multiplier 26 is kept at several thousand volts negative
with respect to ground. In this example of the invention the
cathode 30 is shown at -3 Kv negative as indicated at 31.
Each mass group passes through the electron multiplier 26 and then
through selected ones of the gates 13-15 as controlled by an
electrical charge supplied to a grid 32. The grid 32 is controlled
by a suitable electrical device 33 which is utilized to provide
electrical pulses and introduce a suitable time delay between the
ion pulses and what will be referred to as the gate pulses
operating the electrical gates 13-14 and in essence such pulses
comprise electrical pulses to the grid 32. The device 33 may also
be referred to as a mass selector 33 in this specification.
Having presented in general terms a description of the operation of
a TOF mass spectrometer the following description will highlight
the manner in which various additional components cooperate with
components previously presented whereby this invention makes
possible continuous high speed analysis of each mass of a plurality
of masses in a spectrum which is under observation so that each and
substantially every mass will always be in best focus. As
previously explained, the ions travel, in groups, through the field
free region 23 in accordance with their mass-to-charge ratios.
Expressed in basic terms this invention assures that as each group
passes through the field free region, through the electron
multiplier 26, and toward the electrical gates the mass selector 33
operates to introduce a suitable automatically variable time delay
so that the lightest mass will be brought into focus first then
successively heavier masses until all masses in the spectrum have
been analyzed.
The spectrometer 10 is provided with trigger pulses as indicated at
34 and such trigger pulses pass through what will be referred to as
a voltage ramp generator indicated at 35 which is used to control
the voltage level of the trigger pulses and the increased voltage
level trigger pulses are provided to the mass selector 33. Trigger
pulses are also provided from the generator 35 to an amplifier 36
connected in parallel with the mass selector 33. The amplifier 36
amplifies the signal, i.e., electrical pulses, and passes such
signal to a switch assembly 40.
The switch assembly 40 has three positions which will be referred
to as an off position 40A, a programmed position 40B, and a manual
position 40C. The switch assembly 40 also has a switch arm 41 which
may be moved to any one of the three positions 40A - 40C either
manually or using automatic switching means.
With the switch 40 arranged with its switch arm 41 at the
programmed position 40B a signal from the amplifier 36 passes
through an adjustable electrical load means which is shown in this
example as a variable electrical resistor 42 to a device which will
be referred to as a time lag focus device 43 which is operatively
connected in series between the variable resistor 42 and the ion
pulse generator 21. The operation of the device 43 will be
described in more detail subsequently.
As trigger pulses are supplied to the voltage ramp generator 35
corresponding pulses are also supplied through a line 44 to the
electron pulse generator 20. The electron pulse generator 20
changes the wave form and energy level of the pulses enabling
efficient electron bombardment of the molecules in the ionization
chamber 12. Through the action of the time lag focus device 43 a
time lag is introduced between the time a particular ionizing
electron pulse is provided by the generator 20 and an ion pulse is
provided by the ion pulse generator 21. Thus, electron bombardment
causes ionization in a known manner and a controlled time interval
thereafter the ion pulse generator 21 accelerates the mass groups
through the ionization chamber and drift tube assembly 11 whereby
the groups or bunches of ion particles move through the field free
region in accordance with their mass-to-charge ratios.
The trigger pulses provided to the generator 35 are also provided
to the mass selector 33 and the mass selector 33 operates to
provide an appropriate charge to the grid 32. The grid 32 is
charged in accordance with a predetermined time sequence which may
be such that as each mass group of the plurality of masses in the
entire spectrum of a particular fluid being analyzed reaches the
end of the assembly 11 the mass selector 33 provides a suitable
charge to the grid 32 which allows observation of each particular
mass at the time when it is in best focus. The charging of grid 32
in this example causes flow through gates 13 and 15 to channel 1 of
the recorder 16 and to the oscilloscope 17 respectively.
Thus, it will be appreciated that with this technique it is
possible to precisely observe each and every mass of the entire
spectrum and this is accomplished in a simple manner by the
cooperation of the time lag focus device 43 and the mass selector
device 33.
As previously mentioned, the switch assembly 40 also has an off
position 40A and a manual position 40C. With the arm 41 in the
manual position 40C the spectrometer 10 may be operated
independently of the mass selector 33. Also, in the manual position
electrical power is provided through connection 45 of the switch 40
and may be of any suitable voltage level such as plus 15 volts for
example.
With the cooperating arrangement of components presented herein the
variable restrictor 42 may be used to adjust the time lag focus at
any particular mass in either the manual or programmed position
while the amplifier 36 is used to amplify the signal to the time
lag focus device 43. It will also be appreciated that the slope of
the voltage ramp for the time device or circuit 43 can be changed
in order to obtain best focus for all masses in the spectrum. In
particular the resistor 42 may be used to change the high end of
the slope while the bias voltage on the amplifier 36 is used to
change the low end whereby different slopes may be obtained for
various voltage levels.
The particular electrical components comprising the mass selector
33, the voltage ramp generator 35, the amplifier 36, and the time
lag focus device 43 may be of any suitable known construction
provided that they perform the function essentially as described
herein. It will also be appreciated that the electron pulse
generator 20 and the ion pulse generator 21 may also provide
electrical signals in a known manner.
The mass selector 33 may also be used to control the voltage
magnitude and polarity of each gate pulse. In addition, it will
also be appreciated that the mass selector may be provided with
suitable external adjusting means, shown as a manual adjusting knob
47 which may be used to control a suitable electrical load means
such as a variable resistor to more precisely control the delay
between each ion pulse and each gate pulse for a particular
mass.
Thus it is seen that this invention synchronizes the time delay
between each ionizing electron pulse, each ion pulse, and each gate
pulse so that each mass of a plurality of masses under observation
is always kept in best focus.
In this example of the invention the time lag focus device 43 and
mass selector 33 in their simplest forms may be considered as time
delay means. Further, the mass selector 33 may be considered as
either defining or comprising what may be commonly referred to as
the output scanner for the spectrometer 10, and such output scanner
has the measuring means defined by the recorder 16 and oscilloscope
17 associated therewith.
While present exemplary embodiments of this invention, and methods
of practicing the same, have been illustrated and described, it
will be recognized that this invention may be otherwise variously
embodied and practiced by those skilled in the art.
* * * * *