U.S. patent application number 11/687573 was filed with the patent office on 2007-07-05 for dynamic random access memory cell layout and fabrication method thereof.
This patent application is currently assigned to NANYA TECHNOLOGY CORPORATION. Invention is credited to Ming-Cheng Chang, Yi-Nan Chen, Jeng-Ping Lin, Tieh-Chiang Wu.
Application Number | 20070152263 11/687573 |
Document ID | / |
Family ID | 34215182 |
Filed Date | 2007-07-05 |
United States Patent
Application |
20070152263 |
Kind Code |
A1 |
Chang; Ming-Cheng ; et
al. |
July 5, 2007 |
DYNAMIC RANDOM ACCESS MEMORY CELL LAYOUT AND FABRICATION METHOD
THEREOF
Abstract
A dynamic random access memory (DRAM) cell layout for arranging
deep trenches and active areas and a fabrication method thereof. An
active area comprises two vertical transistors, a common bitline
contact and two deep trenches. The first vertical transistor is
formed on a region where the first deep trench is partially
overlapped with the first gate conductive line. The second vertical
transistor is formed on a region where the second deep trench is
partially overlapped with the second gate conductive line.
Inventors: |
Chang; Ming-Cheng; (Taoyuan
Hsien, TW) ; Wu; Tieh-Chiang; (Ilan, TW) ;
Chen; Yi-Nan; (Taipei, TW) ; Lin; Jeng-Ping;
(Taoyuan, TW) |
Correspondence
Address: |
QUINTERO LAW OFFICE, PC
2210 MAIN STREET, SUITE 200
SANTA MONICA
CA
90405
US
|
Assignee: |
NANYA TECHNOLOGY
CORPORATION
TAOYUAN
TW
|
Family ID: |
34215182 |
Appl. No.: |
11/687573 |
Filed: |
March 16, 2007 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
10761985 |
Jan 21, 2004 |
|
|
|
11687573 |
Mar 16, 2007 |
|
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Current U.S.
Class: |
257/317 ;
257/321; 257/E21.652; 257/E21.653; 257/E21.655; 257/E21.658;
257/E29.304 |
Current CPC
Class: |
H01L 27/10867 20130101;
H01L 27/10832 20130101; H01L 27/10864 20130101; H01L 27/1087
20130101; H01L 27/10888 20130101; H01L 29/66181 20130101; H01L
27/10876 20130101 |
Class at
Publication: |
257/317 ;
257/321; 257/E29.304 |
International
Class: |
H01L 29/788 20060101
H01L029/788 |
Foreign Application Data
Date |
Code |
Application Number |
Sep 2, 2003 |
TW |
92124187 |
Claims
1-18. (canceled)
19. A transistor, comprising: a source/drain region; a buried strap
out-diffusion region adjacent to one sidewall of a deep trench; and
a bended gate structure having a bended gate and a bended gate
insulating layer, wherein the bended gate structure comprises a
first portion extending along a first direction and a second
portion extending along a second direction intersecting with the
first direction, wherein the first portion of the bended gate is
adjacent to the source/drain region and the second portion of the
bended gate is adjacent to the buried strap out-diffusion region,
and on an overlapping region between the deep trench and the bended
gate structure, the sidewall profile of the deep trench comprises
at least three edges.
20. The transistor as claimed in claim 19, wherein the deep trench
is a trench of a deep trench capacitor.
21. The transistor as claimed in claim 19, wherein the bended gate
is adjacent to a shallow trench isolation.
22. The transistor as claimed in claim 19, further comprising a bit
line contact electrically contacting the source/drain region.
23. The transistor as claimed in claim 21, wherein the bit line
contact is separated from the bit line contact by a spacer on a
sidewall of the bended gate.
24. The transistor as claimed in claim 19, wherein the bended gate
is L shaped in a cross section view.
25. The transistor as claimed in claim 19, wherein the bended gate
insulating layer is L shaped in a cross section view.
26. The transistor as claimed in claim 19, wherein the first
direction and the second direction are perpendicular.
27. The transistor as claimed in claim 19, wherein the source/drain
region is disposed in a substrate.
28. The transistor as claimed in claim 27, wherein the first
direction is parallel to the substrate surface.
29. The transistor as claimed in claim 19, wherein the second
direction is parallel to a sidewall of the trench.
30. A memory device, comprising a deep trench capacitor and a
transistor controlling the deep trench capacitor, wherein the
transistor is as claimed in claim 19.
31. The transistor as claimed in claim 19, wherein on the
overlapping region between the deep trench and bended gate
structure, the sidewall profile of the deep trench comprises at
least five edges.
32. A memory device, comprising: a source/drain region; a buried
strap out-diffusion region adjacent to one sidewall of a deep
trench; and a bended gate structure having a bended gate and a
bended gate insulating layer, wherein the bended gate structure
comprises a first portion extending along a first direction and a
second portion extending along a second direction intersecting with
the first direction, wherein the first portion of the bended gate
is adjacent to the source/drain region and the second portion of
the bended gate is adjacent to the buried strap out-diffusion
region, and on an overlapping region between the deep trench and
the bended gate structure, the sidewall profile of the deep trench
is -shaped.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The invention relates to a memory cell of a semiconductor
device, and more particularly to a dynamic random access memory
(DRAM) cell layout for arranging deep trenches and active areas and
a fabrication method thereof.
[0003] 2. Description of the Related Art
[0004] A dynamic random access memory (DRAM) cell typically
includes a memory cell coupled to a storage capacitor. Generally
the storage capacitor is formed within a deep trench etched into a
semiconductor substrate. The storage capacitor is accessed using an
access transistor which allows charge to be stored in the storage
capacitor or retrieves charge from the storage capacitor depending
on whether the desired action is a read or write function. For a
buried strap type trench capacitor, dopant outdiffusion near a
wordline can cause a short channel effect in the access transistor
channel, thus reducing subthreshold conduction and causing a fail
in retention time.
[0005] FIG. 1 is a conventional DRAM cell layout. Deep trench
capacitors 10 are disposed under passing wordlines 12. Access
transistors 14 are electrically coupled to storage nodes 16 of the
trench capacitors 10 through diffusion regions 18 which may be
either a source or a drain of the access transistors 14. Diffusion
regions 20 are electrically connected to bitline contacts 22 which
connect to bitlines (not shown) to read and write to the storage
nodes 16 through the access transistors 14. Access transistors 14
are activated by the wordlines 12. When voltage is applied to the
wordlines 12, a channel below the wordline 12 conducts and allows
current to flow between diffusion regions 18 and 20 and into or out
of the storage node 16. Wordlines 12 are preferably spaced across
the smallest possible distance to conserve the layout area. The
smallest possible distance is typically a minimum feature size
"F".
[0006] FIG. 2 is a cross-section along line 2-2 of FIG. 1. Elements
of FIG. 2 are labeled as described in FIG. 1. The storage nodes 16
are isolated from a doped well 24 by a dielectric collar 26. A
shallow trench isolation (STI) 28 is provided over the storage
nodes 16 to electrically isolate the passing wordlines 12 formed
above storage nodes 16. The diffusion region 18 of the access
transistor 14 is connected to the storage node 16 through a buried
strap (BS) 32 and a BS out-diffusion region 30. Considering an
overlay tolerance effect, a BS merge phenomenon easily occurs to
cause a short channel effect in a channel region 34 underlying a
gate electrode 36 of the access transistor 14.
SUMMARY OF THE INVENTION
[0007] Accordingly, an object of the present invention is to
provide a DRAM cell layout and a fabrication method thereof to
improve subthreshold conduction and retention time performance.
[0008] According to the object of the invention, a dynamic random
access memory cell layout has a first gate conductor pair and a
second gate conductor pair extending along a first direction, in
which each gate conductor pair comprises a first gate conductive
line and a second gate conductive line. A bitline pair has a first
bitline and a second bitline, which extend along a second direction
and intersect the gate conductor pairs. Corresponding to the first
bitline, a first active area extends along the second direction to
cross the first gate conductor pair. Corresponding to the second
bitline, a second active area extends along the second direction to
cross the second gate conductor pair. Each active area has a first
deep trench and a second deep trench formed in a substrate
underneath the first gate conductive line and the second gate
conductive line, respectively. A bitline contact is formed between
the first gate conductive line and the second gate conductive line
to be electrically connected to the corresponding bitline. A common
source/drain region is formed in the substrate between the first
gate conductive line and the second gate conductive line to be
electrically connected to the bitline contact. A first vertical
transistor and a second vertical transistor are formed overlying
the first deep trench and the second deep trench, respectively.
Each vertical transistor has a buried strap out-diffusion region
formed in the substrate adjacent to one sidewall of the deep
trench.
DESCRIPTION OF THE DRAWINGS
[0009] The present invention will become more fully understood from
the detailed description given hereinbelow and the accompanying
drawings, given by way of illustration only and thus not intended
to be limitative of the present invention.
[0010] FIG. 1 is a conventional DRAM cell layout.
[0011] FIG. 2 is a cross-section along line 2-2 of FIG. 1.
[0012] FIG. 3 is a DRAM cell layout of deep trenches and active
areas according to the first embodiment of the present
invention.
[0013] FIG. 4 is a cross-section along line 4-4 of FIG. 3.
[0014] FIG. 5 is a DRAM cell layout of deep trenches and active
areas according to the second embodiment of the present
invention.
[0015] FIG. 6 is a three-dimensional diagram of a vertical
transistor according to the second embodiment of the present
invention.
[0016] FIGS. 7A.about.7L are cross-sections of a fabrication method
for above-described deep trenches and vertical transistors.
DETAILED DESCRIPTION OF THE INVENTION
First Embodiment
[0017] FIG. 3 is a DRAM cell layout of deep trenches and active
areas according to the first embodiment of the present invention.
The DRAM cell layout comprises a plurality of gate conductor pairs
P.sub.1, P.sub.2 and P.sub.3 and a plurality of bitlines BL.sub.1
and BL.sub.2. Each of the gate conductor pairs P.sub.1, P.sub.2 and
P.sub.3 comprises a first gate conductive line GC.sub.1 and a
second gate conductive line GC.sub.2 arranged parallel to each
other. The gate conductive lines GC.sub.1 and GC.sub.2 extending
along a first direction and the bitlines BL.sub.1 and BL.sub.2
extending along a second direction intersect to define a plurality
of DRAM cells. A first active area AA.sub.1 is defined at the
intersection of the second gate conductor pair P.sub.2 and the
first bitline BL.sub.1. A second active area AA.sub.2 is defined at
the intersection of the first gate conductor pair P.sub.1 and the
second bitline BL.sub.2, alternatively, at the intersection of the
third gate conductor pair P.sub.3 and the second bitline
BL.sub.2.
[0018] The first active area AA.sub.1 extends along the first
bitline BL.sub.1 to cross the first gate conductive line GC.sub.1
and a second gate conductive line GC.sub.2 of the second gate
conductor pair P.sub.2, and comprises two vertical transistors
T.sub.1 and T.sub.2, a common bitline contact BC and two deep
trenches DT.sub.1 and DT.sub.2. The first vertical transistor
T.sub.1 is formed on a region where the first deep trench DT.sub.1
is partially overlapped with the first gate conductive line
GC.sub.1. The second vertical transistor T.sub.2 is formed on a
region where the second deep trench DT.sub.2 is partially
overlapped with the second gate conductive line GC.sub.2.
[0019] The second active area AA.sub.2 extends along the second
bitline BL.sub.2 to cross the first gate conductive line GC.sub.1
and a second gate conductive line GC.sub.2 of the first gate
conductor pair P.sub.1. Alternatively, the second active area
AA.sub.2 crosses the first gate conductive line GC.sub.1 and a
second gate conductive line GC.sub.2 of the third gate conductor
pair P.sub.3. The second active area AA.sub.2 comprises two
vertical transistors T.sub.1 and T.sub.2, a common bitline contact
BC and two deep trenches DT.sub.1 and DT.sub.2. The first vertical
transistor T.sub.1 is formed on a region where the first deep
trench DT.sub.1 is partially overlapped with the first gate
conductive line GC.sub.1. The second vertical transistor T.sub.2 is
formed on a region where the second deep trench DT.sub.2 is
partially overlapped with the second gate conductive line
GC.sub.2.
[0020] FIG. 4 is a cross-section along line 4-4 of FIG. 3. For the
first active area AA.sub.1, the first deep trench DT.sub.1 and the
second deep trench DT.sub.2 are formed by etching a semiconductor
silicon substrate 40, and a shallow trench isolation structure STI
is formed outside the first deep trench DT.sub.1 and the second
deep trench DT.sub.2 for isolating the first active area AA.sub.1
from the second active area AA.sub.2. A first deep trench capacitor
C.sub.1 and a second deep trench capacitor C.sub.2 are formed at
the lower portions of the first deep trench DT.sub.1 and the second
deep trench DT.sub.2, respectively. A first buried strap
out-diffusion region BS.sub.1 is formed in the substrate 40
adjacent to one sidewall of the middle portion of the first deep
trench D.sub.1. The first buried strap out-diffusion region
BS.sub.1 serves as a source/drain region of the first vertical
transistor T.sub.1, and provides an electrical connection between
the first vertical transistor T.sub.1 and the first deep trench
capacitor C.sub.1. Similarly, a second buried strap out-diffusion
region BS.sub.2 is formed in the substrate 40 adjacent to one
sidewall of the middle portion of the second deep trench D.sub.2.
The second buried strap out-diffusion region BS.sub.2 serves as a
source/drain region of the second vertical transistor T.sub.2, and
provides an electrical connection between the second vertical
transistor T.sub.2 and the second deep trench capacitor C.sub.2.
The first gate conductive line GC.sub.1 partially overlaps the
upper portion of first deep trench DT.sub.1 to serve as a gate
electrode of the first vertical transistor T.sub.1. The second gate
conductive line GC.sub.2 partially overlaps the upper portion of
second deep trench DT.sub.2 to serve as a gate electrode of the
second vertical transistor T.sub.2. A common source/drain region
S/D is formed in the substrate 40 between the first gate conductive
line GC.sub.1 and the second gate conductive line GC.sub.2. Thus, a
first vertical channel region is provided between the common
source/drain region S/D and the first buried strap out-diffusion
region BS.sub.1, and a second vertical channel region is provided
between the common source/drain region S/D and the second buried
strap out-diffusion region BS.sub.2. The bitline contact BC is
formed overlying the common source/drain region S/D and
electrically connected to the first bitline BL.sub.1. Accordingly,
the DRAM cell layout of the vertical transistors T.sub.1 and
T.sub.2 and the deep trenches DT.sub.1 and DT.sub.2 can prevent
deterioration of subthreshold conduction, thus improving retention
time performance.
Second Embodiment
[0021] FIG. 5 is a DRAM cell layout of deep trenches and active
areas according to the second embodiment of the present invention.
FIG. 6 is a three-dimensional diagram of a vertical transistor
according to the second embodiment of the present invention.
Elements similar to those shown in FIGS. 3 and 4 are omitted
here.
[0022] The DRAM cell layout of deep trenches and active areas of
the second embodiment is substantially similar to that of the first
embodiment, with the similar portions omitted herein. The different
portion is the profile of the overlapping region between the deep
trench and the vertical transistor. In the first embodiment, on the
overlapping region between the deep trench and the vertical
transistor, the sidewall profile of the deep trench is a line.
Comparatively, in the second embodiment, on the overlapping region
between the deep trench and the vertical transistor, the sidewall
profile of the deep trench comprises at least three edges. For
example, a five-edge sidewall profile, such as a -shaped
sidewall.
[0023] Preferably, on an active area AA, the first deep trench
DT.sub.1 is partially overlapped with the first gate conductive
line GC.sub.1, and the first deep trench DT.sub.1 comprises a
-shaped sidewall within the overlapping portion therebetween.
Similarly, the second deep trench DT.sub.2 is partially overlapped
with the second gate conductive line GC.sub.2, and the second deep
trench DT.sub.2 comprises a -shaped sidewall within the overlapping
portion therebetween. Therefore, the vertical channel region
between the common source/drain region S/D and the buried strap
out-diffusion region BS becomes a multilateral structure, viewed as
a three-dimensional design, which can further improve subthreshold
conduction and retention time performance.
Third Embodiment
[0024] FIGS. 7A-7L are cross-sections of a fabrication method for
above-described deep trenches and vertical transistors.
[0025] In FIG. 7A, an array area I and a support area II are
defined on a semiconductor silicon substrate 40. A p-type
semiconductor silicon substrate 40 is described below for example.
First, a pad layer 41 and a reactive ion etching (RIE) method are
employed to pattern a deep trench DT in the substrate 40 within the
array area I. Then, a deep trench capacitor 42 including a bottom
electrode plate 44, a capacitor dielectric 46 and an upper
electrode plate 48 is fabricated at the lower portion of the deep
trench DT. Preferably, the bottom electrode plate 44 is an
n.sup.+-type diffusion region, the capacitor dielectric 46 is an
ONO (oxide-nitride-oxide) stack structure, and the upper electrode
plate 48 is a first polysilicon layer with n.sup.+-type dopants.
Next, in a collar dielectric process, a collar dielectric layer 50
is formed on the sidewall of the deep trench DT. Next, a second
polysilicon layer 52 with n.sup.+-type dopants and a third
polysilicon layer 54 are formed in the deep trench DT. Next, a
thermal diffusion process is employed to make the n.sup.+-type
dopants diffuse through the third polysilicon layer 54 into the
substrate 40, resulting in a buried strap out-diffusion region 56
in the substrate 40 adjacent to the third polysilicon layer 54.
Next, deposition and etching are used to form a top isolating layer
58 on the third polysilicon layer 54.
[0026] In FIG. 7B, an anti-reflective coating (ARC) layer 60 is
formed in the deep trench DT, and a first photoresist layer 62 is
patterned on the substrate 40 for defining shallow trench
isolations in the array area I and the support area II. Next, using
the first photoresist layer 62 as a mask, the exposed portions of
the pad layer 41 and the semiconductor silicon substrate 40 are
removed to form shallow trenches 63, as shown in FIG. 7C, thus
defining an active area AA within the array area I. Then, the ARC
layer 60 and the first photoresist layer 62 are removed.
[0027] In FIG. 7D, a nitride liner 64 is conformally deposited on
the substrate 40, and then a first HDP (high density plasma) oxide
layer 66 is formed to fill the shallow trenches 63. Next, chemical
mechanical polishing (CMP) is used to level off the top surfaces of
the first HDP oxide layer 66 and the nitride liner 64. Next, in
FIG. 7E, a second photoresist layer 68 is provided to cover the
support area II. Next, using the nitride liner 64 as an etching
stop layer, the first HDP oxide layer 66 within the array area I is
removed. Then, the second photoresist layer 68 is removed. In FIG.
IF, after removing the nitride liner 64 and the pad layer 41, a
sacrificial oxide layer is formed so as to perform an ion
implantation process on the array area I and the support area II
for adjusting device threshold voltage.
[0028] In FIG. 7G, after removing the sacrificial oxide layer, a
thermal oxidation process is employed to grow a gate oxide layer 70
on the exposed silicon surface of the substrate 40. Next, in FIG.
7E, a gate polysilicon layer 72, a metallic silicide layer 74 (such
as a WSi layer) and a nitride cap layer 76 are successively
deposited on the substrate 40. Then, using a third photoresist
layer 78 as a mask to perform an etching process, the gate
polysilicon layer 72, the metallic silicide layer 74 and the
nitride cap layer 76 within the array area I are patterned as a
gate conductive line GC, which partially overlaps two tops of two
adjacent deep trenches DT.
[0029] In FIG. 7I, after removing the third photoresist layer 78, a
second HDP oxide layer 80 is formed to fill the shallow trench 63
outside the active area AA of the array area I, and then CMP is
employed to level off the top surfaces of the second HDP oxide
layer 80 and the gate conductive line GC. Next, in FIG. 7J, by
performing photolithography and etching on the active area AA of
the array area I, a first contact hole 82I is formed to penetrate
the gate conductive line GC and the gate oxide layer 70, thus
exposing the substrate 40.
[0030] In FIG. 7K, a nitride spacer 84 is formed on the sidewall of
the first contact hole 82I, and then an ion implantation process is
performed to form a source/drain diffusion region 86 in the
semiconductor silicon substrate 40 exposed by the first contact
hole 82I. Next, deposition and CMP for a BPSG layer 88 and
deposition and annealing for a TEOS oxide layer 90 are successively
performed thereon. Next, using photolithography and etching, a
second contact hole 82II is formed to expose the first contact hole
82I and the source/drain diffusion region 86. Finally, in FIG. 7L,
the second contact hole 8211 is filled with a polysilicon contact
layer 92, and then a W/TiN/Ti layer 94 is formed on the polysilicon
contact layer 92, and then a bitline 96 is patterned thereon.
[0031] While the invention has been described by way of example and
in terms of the preferred embodiments, it is to be understood that
the invention is not limited to the disclosed embodiments. To the
contrary, it is intended to cover various modifications and similar
arrangements (as would be apparent to those skilled in the art).
Therefore, the scope of the appended claims should be accorded the
broadest interpretation so as to encompass all such modifications
and similar arrangements.
* * * * *