Zwier; Olger Victor

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zwier; Olger Victor.The latest application filed is for "improvements in metrology targets".

Company Profile

3.5.8

Zwier; Olger Victor - Nuenen NL
ZWIER; Olger Victor - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology parameter determination and metrology recipe selection Grant 11,448,974 - Javaheri , et al. September 20, 2	2022-09-20
Improvements In Metrology Targets App 20220260929 - MEHTA; Nikhil ; et al.	2022-08-18
Metrology method, patterning device, apparatus and computer program Grant 11,385,553 - Zhou , et al. July 12, 2	2022-07-12
Metrology Method App 20220075276 - MATHIJSSEN; Simon Gijsbert Josephus ; et al.	2022-03-10
Target For Measuring A Parameter Of A Lithographic Process App 20220035255 - VAN DER SCHAAR; Maurits ; et al.	2022-02-03
Metrology Method, Patterning Device, Apparatus And Computer Program App 20210255553 - ZHOU; Zili ; et al.	2021-08-19
Metrology Parameter Determination And Metrology Recipe Selection App 20210208513 - JAVAHERI; Narjes ; et al.	2021-07-08
Metrology method, patterning device, apparatus and computer program Grant 10,996,570 - Zhou , et al. May 4, 2	2021-05-04
Metrology parameter determination and metrology recipe selection Grant 10,990,020 - Javaheri , et al. April 27, 2	2021-04-27
Metrology Method, Patterning Device, Apparatus and Computer Program App 20200110342 - ZHOU; Zili ; et al.	2020-04-09
Method of measuring a target, and metrology apparatus Grant 10,606,178 - Zwier	2020-03-31
Method of Measuring a Target, and Metrology Apparatus App 20190219931 - ZWIER; Olger Victor	2019-07-18
Metrology Parameter Determination And Metrology Recipe Selection App 20180321597 - JAVAHERI; Narjes ; et al.	2018-11-08

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