Zschech; Ehrenfried

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zschech; Ehrenfried.The latest application filed is for "device for carrying out bending tests on panel-shaped or beam shaped samples".

Company Profile

0.12.11

Zschech; Ehrenfried - Moritzburg DE
Zschech, Ehrenfried - Morizburg DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Device for carrying out bending tests on panel-shaped or beam shaped samples Grant 11,243,151 - Sander , et al. February 8, 2	2022-02-08
Device For Carrying Out Bending Tests On Panel-shaped Or Beam Shaped Samples App 20200309652 - SANDER; Christoph ; et al.	2020-10-01
Illumination and imaging device for high-resolution X-ray microscopy with high photon energy Grant 10,153,062 - Gall , et al. Dec	2018-12-11
Arrangement and method for the synchronous determination of the shear modulus and of the Poisson's number on samples of elastically isotropic and anisotropic materials Grant 10,151,645 - Yeap , et al. Dec	2018-12-11
Illumination And Imaging Device For High-resolution X-ray Microscopy With High Photon Energy App 20170003234 - GALL; Martin ; et al.	2017-01-05
Insulation material for integrated circuits and use of said integrated circuits Grant 9,117,771 - Seifert , et al. August 25, 2	2015-08-25
Arrangement And Method For The Synchronous Determination Of The Shear Modulus And Of The Poisson's Number On Samples Of Elastically Isotropic And Anisotropic Materials App 20150066394 - YEAP; Kong Boon ; et al.	2015-03-05
Insulation Material For Integrated Circuits And Use Of Said Integrated Circuits App 20110297869 - Seifert; Gotthart ; et al.	2011-12-08
Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques Grant 8,056,402 - Hecker , et al. November 15, 2	2011-11-15
Technique for forming embedded metal lines having increased resistance against stress-induced material transport Grant 8,039,395 - Meyer , et al. October 18, 2	2011-10-18
Nanoprobe Tip For Advanced Scanning Probe Microscopy Comprising A Layered Probe Material Patterned By Lithography And/or Fib Techniques App 20090114000 - Hecker; Michael ; et al.	2009-05-07
Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing Grant 7,441,446 - Chumakov , et al. October 28, 2	2008-10-28
Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure Grant 7,311,008 - Langer , et al. December 25, 2	2007-12-25
Method And Apparatus For Determining Surface Characteristics By Using Spm Techniques With Acoustic Excitation And Real-time Digitizing App 20070044544 - Chumakov; Dmytro ; et al.	2007-03-01
Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal line Grant 7,183,629 - Engelmann , et al. February 27, 2	2007-02-27
Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure App 20050263760 - Langer, Eckhard ; et al.	2005-12-01
Technique for monitoring the state of metal lines in microstructures Grant 6,953,755 - Meyer , et al. October 11, 2	2005-10-11
Technique for forming embedded metal lines having increased resistance against stress-induced material transport App 20050161817 - Meyer, Moritz-Andreas ; et al.	2005-07-28
Soft error resistant semiconductor device Grant 6,894,390 - Schammler , et al. May 17, 2	2005-05-17
Technique for monitoring the state of metal lines in microstructures App 20050072919 - Meyer, Moritz Andreas ; et al.	2005-04-07
Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal line App 20050046031 - Engelmann, Hans-Juergen ; et al.	2005-03-03
Soft error resistant semiconductor device App 20040164409 - Schammler, Gisela ; et al.	2004-08-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.