Zimmerman; Jeffrey S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zimmerman; Jeffrey S..The latest application filed is for "method for enhanced semiconductor product diagnostic fail signature detection".

Company Profile

0.17.16

Zimmerman; Jeffrey S. - Swanton VT
Zimmerman; Jeffrey S. - Essex Junction VT
Zimmerman; Jeffrey S. - Hinesburg VT
Zimmerman; Jeffrey S. - Beaconsfield CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for enhanced semiconductor product diagnostic fail signature detection Grant 10,101,388 - Redburn , et al. October 16, 2	2018-10-16
Method For Enhanced Semiconductor Product Diagnostic Fail Signature Detection App 20170168112 - Redburn; Robert C. ; et al.	2017-06-15
Structure, semiconductor structure and method of manufacturing a semiconductor structure and packaging thereof Grant 9,000,585 - Daubenspeck , et al. April 7, 2	2015-04-07
Protection of one-time programmable (OTP) memory Grant 8,990,478 - Fifield , et al. March 24, 2	2015-03-24
Protection Of One-time Programmable (otp) Memory App 20140025915 - Fifield; John A. ; et al.	2014-01-23
Controlling Density Of Particles Within Underfill Surrounding Solder Bump Contacts App 20130161822 - Barbeau; Stephane S. ; et al.	2013-06-27
Controlling Density Of Particles Within Underfill Surrounding Solder Bump Contacts App 20120168956 - Barbeau; Stephane S. ; et al.	2012-07-05
Structure, Semiconductor Structure And Method Of Manufacturing A Semiconductor Structure And Packaging Thereof App 20120104600 - Daubenspeck; Timothy H. ; et al.	2012-05-03
Structure, semiconductor structure and method of manufacturing a semiconductor structure and packaging thereof Grant 8,114,767 - Daubenspeck , et al. February 14, 2	2012-02-14
Structure, failure analysis tool and method of determining white bump location using failure analysis tool Grant 7,958,477 - Daubenspeck , et al. June 7, 2	2011-06-07
Sensor, method, and design structure for a low-k delamination sensor Grant 7,716,992 - Maloney , et al. May 18, 2	2010-05-18
Determining allowance antenna area as function of total gate insulator area for SOI technology Grant 7,712,057 - Bonges , et al. May 4, 2	2010-05-04
Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing Grant 7,649,262 - Chapple-Sokol , et al. January 19, 2	2010-01-19
Suppression Of Localized Metal Precipitate Formation And Corresponding Metallization Depletion In Semiconductor Processing App 20090294968 - Chapple-Sokol; Jonathan D. ; et al.	2009-12-03
Sensor, Method, And Design Structure For A Low-k Delamination Sensor App 20090246892 - Maloney; John J. ; et al.	2009-10-01
Design Structure, Semiconductor Structure And Method Of Manufacturing A Semiconductor Structure And Packaging Thereof App 20090230547 - Daubenspeck; Timothy H. ; et al.	2009-09-17
Design Structure, Failure Analysis Tool And Method Of Determining White Bump Location Using Failure Analysis Tool App 20090235212 - Daubenspeck; Timothy H. ; et al.	2009-09-17
Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing Grant 7,572,650 - Chapple-Sokol , et al. August 11, 2	2009-08-11
Determining Allowable Antenna Area As Function Of Total Gate Insulator Area For Soi Technology App 20090158230 - Bonges, III; Henry A. ; et al.	2009-06-18
Immunity To Charging Damage In Silicon-on-insulator Devices App 20090094567 - Eng; Chung-Ping ; et al.	2009-04-09
Structure And Method For Reducing Susceptibility To Charging Damage In Soi Designs App 20070271540 - Eng; Chung-Ping ; et al.	2007-11-22
Method and apparatus for completely covering a wafer with a passivating material Grant 7,232,695 - Daubenspeck , et al. June 19, 2	2007-06-19
Suppression Of Localized Metal Precipitate Formation And Corresponding Metallization Depletion In Semiconductor Processing App 20070040277 - Chapple-Sokol; Jonathan D. ; et al.	2007-02-22
Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing Grant 7,173,338 - Chapple-Sokol , et al. February 6, 2	2007-02-06
Method And Apparatus For Completely Covering A Wafer With A Passivating Material App 20060281197 - Daubenspeck; Timothy H. ; et al.	2006-12-14
Halo implant in semiconductor structures Grant 6,949,796 - Ellis-Monaghan , et al. September 27, 2	2005-09-27
Suppression Of Localized Metal Precipitate Formation And Corresponding Metallization Depletion In Semiconductor Processing App 20050194689 - Chapple-Sokol, Jonathan D. ; et al.	2005-09-08
Statistical guardband methodology Grant 6,937,965 - Bilak , et al. August 30, 2	2005-08-30
Variable fuel heating value adaptive control for gas turbine engines Grant 6,226,976 - Scott , et al. May 8, 2	2001-05-08
Robust domino circuit design for high stress conditions Grant 6,097,207 - Bernstein , et al. August 1, 2	2000-08-01

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