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Patent applications and USPTO patent grants for Zienert; Inka.The latest application filed is for "method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate".
Patent | Date |
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System and method for estimating the crystallinity of stacked metal lines in microstructures Grant 7,718,447 - Zienert , et al. May 18, 2 | 2010-05-18 |
Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate Grant 7,421,060 - Zienert , et al. September 2, 2 | 2008-09-02 |
Method Of Determining An Orientation Of A Crystal Lattice Of A First Substrate Relative To A Crystal Lattice Of A Second Substrate App 20080056449 - Zienert; Inka ;   et al. | 2008-03-06 |
System And Method For Estimating The Crystallinity Of Stacked Metal Lines In Microstructures App 20070201615 - Zienert; Inka ;   et al. | 2007-08-30 |
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