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name:-0.014401912689209
name:-0.0067951679229736
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Zhu; Sheng Nan Patent Filings

Zhu; Sheng Nan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zhu; Sheng Nan.The latest application filed is for "ar-based labeling tool for 3d object detection model training".

Company Profile
9.5.10
  • Zhu; Sheng Nan - Shanghai CN
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Ar-based Labeling Tool For 3d Object Detection Model Training
App 20220300738 - Hu; Guoqiang ;   et al.
2022-09-22
Object detection with missing annotations in visual inspection
Grant 11,354,793 - Xu , et al. June 7, 2
2022-06-07
Classifying images in overlapping groups of images using convolutional neural networks
Grant 11,341,370 - Ji , et al. May 24, 2
2022-05-24
Image recovery
Grant 11,295,439 - Li , et al. April 5, 2
2022-04-05
Feature Detection Based On Neural Networks
App 20220092756 - Huang; JingChang ;   et al.
2022-03-24
Object Detection With Missing Annotations In Visual Inspection
App 20210183038 - Xu; Jian ;   et al.
2021-06-17
Image defect identification
Grant 11,030,738 - Li , et al. June 8, 2
2021-06-08
Classifying Images In Overlapping Groups Of Images Using Convolutional Neural Networks
App 20210158094 - JI; Peng ;   et al.
2021-05-27
Defect Enhancement
App 20210118141 - Huang; JingChang ;   et al.
2021-04-22
Image Recovery
App 20210118113 - Li; Fan ;   et al.
2021-04-22
Self-structured Machine Learning Classifiers
App 20210073686 - Ding; Yuan Yuan ;   et al.
2021-03-11
Efficient defect localization/segmentation for surface defect inspection
Grant 10,896,341 - Zhu , et al. January 19, 2
2021-01-19
Image Defect Identification
App 20210004945 - LI; FAN ;   et al.
2021-01-07
Efficient Defect Localization/segmentation For Surface Defect Inspection
App 20200160083 - Zhu; Sheng Nan ;   et al.
2020-05-21

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