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name:-0.037737131118774
name:-0.032140016555786
name:-0.0043730735778809
ZHOU; Xianfeng Patent Filings

ZHOU; Xianfeng

Patent Applications and Registrations

Patent applications and USPTO patent grants for ZHOU; Xianfeng.The latest application filed is for "micro-nano structure formed by self-assembling organic small molecule compound and use thereof".

Company Profile
3.32.33
  • ZHOU; Xianfeng - Qingdao Shandong
  • Zhou; Xianfeng - Beijing CN
  • Zhou; Xianfeng - Meridian ID
  • Zhou; Xianfeng - Akron OH
  • Zhou; Xianfeng - Fremont CA
  • Zhou; Xianfeng - Tempe AZ US
  • Zhou; Xianfeng - Boise ID US
  • Zhou; Xianfeng - US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Micro-nano Structure Formed By Self-assembling Organic Small Molecule Compound And Use Thereof
App 20220105183 - ZHOU; Xianfeng ;   et al.
2022-04-07
Heat transfer tube and cracking furnace using the same
Grant 11,215,404 - Wang , et al. January 4, 2
2022-01-04
Heat Transfer Tube And Cracking Furnace Using The Same
App 20190128622 - WANG; Guoqing ;   et al.
2019-05-02
Heat transfer tube and cracking furnace using the same
Grant 10,209,011 - Wang , et al. Feb
2019-02-19
Isolation trench fill using oxide liner and nitride etch back technique with dual trench depth capability
Grant 9,799,727 - Zhou October 24, 2
2017-10-24
Steam cracking processes
Grant 9,505,677 - Wang , et al. November 29, 2
2016-11-29
Polyhedral oligomeric silsesquioxane (poss)-based bioactive hybrid glass as a scaffold for hard tissue engineering
Grant 9,486,555 - Sahai , et al. November 8, 2
2016-11-08
Isolation Trench Fill Using Oxide Liner and Nitride Etch Back Technique With Dual Trench Depth Capability
App 20160247878 - Zhou; Xianfeng
2016-08-25
Heat transfer tube and cracking furnace using the heat transfer tube
Grant 9,359,560 - Wang , et al. June 7, 2
2016-06-07
Isolation trench fill using oxide liner and nitride etch back technique with dual trench depth capability
Grant 9,349,632 - Zhou May 24, 2
2016-05-24
Fluorescent potassium ion sensors
Grant 9,181,375 - Tian , et al. November 10, 2
2015-11-10
Polyhedral Oligomeric Silsesquioxane (poss)-based Bioactive Hybrid Glass As A Scaffold For Hard Tissue Engineering
App 20150297788 - Sahai; Nita ;   et al.
2015-10-22
Isolation Trench Fill Using Oxide Liner And Nitride Etch Back Technique With Dual Trench Depth Capability
App 20150194336 - Zhou; Xianfeng
2015-07-09
Heat Transfer Tube And Cracking Furnace Using The Same
App 20150114609 - Wang; Guoqing ;   et al.
2015-04-30
Isolation trench fill using oxide liner and nitride etch back technique with dual trench depth capability
Grant 8,952,485 - Zhou February 10, 2
2015-02-10
Fluorescent Potassium Ion Sensors
App 20140200319 - Tian; Yanqing ;   et al.
2014-07-17
Heat Transfer Tube And Cracking Furnace Using The Heat Transfer Tube
App 20140127091 - WANG; Guoqing ;   et al.
2014-05-08
Tubular cracking furnace
Grant 8,585,890 - Wang , et al. November 19, 2
2013-11-19
Method of fabricating different gate oxides for different transistors in an integrated circuit
Grant 8,304,307 - Zhou November 6, 2
2012-11-06
Different Gate Oxides Thicknesses For Different Transistors In An Integrated Circuit
App 20120108051 - Zhou; Xianfeng
2012-05-03
Different gate oxides thicknesses for different transistors in an integrated circuit
Grant 8,102,006 - Zhou January 24, 2
2012-01-24
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 8,053,321 - Helm , et al. November 8, 2
2011-11-08
Semiconductor constructions
Grant 8,035,189 - Smith , et al. October 11, 2
2011-10-11
Multiple-depth STI trenches in integrated circuit fabrication
Grant 7,939,394 - Batra , et al. May 10, 2
2011-05-10
Formation Of Standard Voltage Threshold And Low Voltage Threshold Mosfet Devices
App 20110006372 - Helm; Mark ;   et al.
2011-01-13
Method And Apparatus Providing Different Gate Oxides For Different Transitors In An Integrated Circuit
App 20100295137 - Zhou; Xianfeng
2010-11-25
Semiconductor Constructions
App 20100276781 - Smith; Michael A. ;   et al.
2010-11-04
Method of fabricating different gate oxides for different transistors in an integrated circuit
Grant 7,790,544 - Zhou September 7, 2
2010-09-07
Semiconductor constructions, and electronic systems
Grant 7,781,860 - Smith , et al. August 24, 2
2010-08-24
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,755,146 - Helm , et al. July 13, 2
2010-07-13
Isolation Trench Fill Using Oxide Liner And Nitride Etch Back Technique With Dual Trench Depth Capability
App 20100148300 - Zhou; Xianfeng
2010-06-17
Tubular Cracking Furnace
App 20100147672 - Wang; Guoqing ;   et al.
2010-06-17
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,696,579 - Helm , et al. April 13, 2
2010-04-13
Isolation trench fill using oxide liner and nitride etch back technique with dual trench depth capability
Grant 7,691,722 - Zhou April 6, 2
2010-04-06
Formation Of Standard Voltage Threshold And Low Voltage Threshold Mosfet Devices
App 20090286366 - Helm; Mark ;   et al.
2009-11-19
Semiconductor Constructions, and Electronic Systems
App 20090072347 - Smith; Michael A. ;   et al.
2009-03-19
Semiconductor processing methods
Grant 7,473,615 - Smith , et al. January 6, 2
2009-01-06
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,439,140 - Helm , et al. October 21, 2
2008-10-21
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,413,946 - Helm , et al. August 19, 2
2008-08-19
Multiple-depth Sti Trenches In Integrated Circuit Fabrication
App 20080176378 - Batra; Shubneesh ;   et al.
2008-07-24
Multiple-depth STI trenches in integrated circuit fabrication
Grant 7,354,812 - Batra , et al. April 8, 2
2008-04-08
Formation Of Standard Voltage Threshold And Low Voltage Threshold Mosfet Devices
App 20080042216 - Helm; Mark ;   et al.
2008-02-21
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,304,353 - Helm , et al. December 4, 2
2007-12-04
Method and apparatus providing different gate oxides for different transitors in an integrated circuit
App 20070224746 - Zhou; Xianfeng
2007-09-27
Isolation trench fill using oxide liner and nitride etch back technique with dual trench depth capability
App 20070218645 - Zhou; Xianfeng
2007-09-20
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,265,012 - Helm , et al. September 4, 2
2007-09-04
Formation Of Standard Voltage Threshold And Low Voltage Threshold Mosfet Devices
App 20070093017 - Helm; Mark ;   et al.
2007-04-26
Formation Of Standard Voltage Threshold And Low Voltage Threshold Mosfet Devices
App 20070093016 - Helm; Mark ;   et al.
2007-04-26
Formation of standard voltage threshold and low voltage threshold MOSFET devices
Grant 7,189,607 - Helm , et al. March 13, 2
2007-03-13
Semiconductor processing methods, semiconductor constructions, and electronic systems
App 20070029635 - Smith; Michael A. ;   et al.
2007-02-08
Flash cell structures and methods of formation
App 20060043368 - Li; Di ;   et al.
2006-03-02
Multiple-depth STI trenches in integrated circuit fabrication
App 20060043455 - Batra; Shubneesh ;   et al.
2006-03-02
Flash cell structures and methods of formation
App 20060046402 - Li; Di ;   et al.
2006-03-02
Formation of standard voltage threshold and low voltage threshold MOSFET devices
App 20060003513 - Helm; Mark ;   et al.
2006-01-05
Formation of standard voltage threshold and low voltage threshold MOSFET devices
App 20050227427 - Helm, Mark ;   et al.
2005-10-13
Formation of standard voltage threshold and low voltge threshold MOSFET devices
App 20050026352 - Helm, Mark ;   et al.
2005-02-03
Method for forming standard voltage threshold and low voltage threshold MOSFET devices
Grant 6,849,492 - Helm , et al. February 1, 2
2005-02-01
Imaging system for producing double exposure composite images and application thereof
App 20040151489 - Zhou, Xianfeng
2004-08-05
Formation of standard voltage threshold and low voltage threshold MOSFET devices
App 20040005752 - Helm, Mark ;   et al.
2004-01-08

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