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Patent applications and USPTO patent grants for Zhongke Jingyuan Electron Limited.The latest application filed is for "abnormality detection for periodic patterns".
Patent | Date |
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Abnormality detection for periodic patterns Grant 10,789,704 - Zhang , et al. September 29, 2 | 2020-09-29 |
Abnormality Detection for Periodic Patterns App 20200242746 - Zhang; Zhaoli ;   et al. | 2020-07-30 |
Method and system for identifying defects of integrated circuits Grant 10,628,935 - Zhang , et al. | 2020-04-21 |
Sample height measurement using digital grating Grant 10,582,099 - Li , et al. | 2020-03-03 |
Laser-assisted electron-beam inspection for semiconductor devices Grant 10,553,393 - Li , et al. Fe | 2020-02-04 |
Laser-Assisted Electron-Beam Inspection for Semiconductor Devices App 20190333733 - Li; Shiguang ;   et al. | 2019-10-31 |
Sample Height Measurement Using Digital Grating App 20190320097 - Li; Shiguang ;   et al. | 2019-10-17 |
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