ZHENG; YONGJUN
Patent Applications and Registrations
Patent applications and USPTO patent grants for ZHENG; YONGJUN.The latest application filed is for "addressable test chip".
- ZHENG; YONGJUN - Hangzhou CN
- Zheng; Yongjun - Fuzhou CN
- Zheng; Yongjun - Zhejiang CN
- Zheng; Yongjun - Fremont CA
- Zheng; Yongjun - Union City CA
| Patent | Date |
|---|---|
| Addressable Test Chip App 20220146573 - LAN; Fan ; et al. | 2022-05-12 |
| Addressable test chip test system Grant 10,254,339 - Lan , et al. | 2019-04-09 |
| Addressable ring oscillator test chip Grant 10,156,605 - Pan , et al. Dec | 2018-12-18 |
| Addressable Test Chip Test System App 20180188324 - LAN; Fan ; et al. | 2018-07-05 |
| Addressable test circuit and test method for key parameters of transistors Grant 9,817,058 - Pan , et al. November 14, 2 | 2017-11-14 |
| Programmable addressable test chip Grant 9,646,900 - Ouyang , et al. May 9, 2 | 2017-05-09 |
| Addressable test circuit and test method for key parameters of transistors App 20170059645 - PAN; WEIWEI ; et al. | 2017-03-02 |
| Anti-disengaging mechanism of cable connector Grant 9,407,041 - Lirong , et al. August 2, 2 | 2016-08-02 |
| Addressable Ring Oscillator Test Chip App 20160061895 - Pan; Weiwei ; et al. | 2016-03-03 |
| Anti-disengaging Mechanism Of Cable Connector App 20150311634 - Lirong; Jiang ; et al. | 2015-10-29 |
| Method for testing a plurality of transistors in a target chip Grant 9,146,270 - Shao , et al. September 29, 2 | 2015-09-29 |
| Programmable Addressable Test Chip App 20150212144 - OUYANG; XU ; et al. | 2015-07-30 |
| Addressable test circuit and test method for key parameters of transistors App 20150042372 - PAN; WEIWEI ; et al. | 2015-02-12 |
| Method for Testing a Plurality of Transistors in a Target Chip App 20150002184 - Shao; Kangpeng ; et al. | 2015-01-01 |
| Method of Generating Parameterized Units App 20140115547 - ZHENG; YONGJUN | 2014-04-24 |
| Estimating Icc current temperature scaling factor of an integrated circuit Grant 8,166,445 - Chen , et al. April 24, 2 | 2012-04-24 |
| Method of metal pattern inspection verification Grant 8,000,519 - Zheng , et al. August 16, 2 | 2011-08-16 |
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