Zhao; Larry L.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Zhao; Larry L..The latest application filed is for "method and test structure for characterizing sidewall damage in a semiconductor device".
- Zhao; Larry L. - Austin TX
| Patent | Date |
|---|---|
| Method and test structure for characterizing sidewall damage in a semiconductor device Grant 6,600,333 - Martin , et al. July 29, 2 | 2003-07-29 |
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