Zhang; Xiafang
Patent Applications and Registrations
Patent applications and USPTO patent grants for Zhang; Xiafang.The latest application filed is for "method of determining an asymmetric property of a structure".
- Zhang; Xiafang - San Jose CA US
| Patent | Date |
|---|---|
| Method of determining an asymmetric property of a structure Grant 9,239,522 - Shih , et al. January 19, 2 | 2016-01-19 |
| Method Of Determining An Asymmetric Property Of A Structure App 20120086940 - Shih; Meng-Fu ; et al. | 2012-04-12 |
| Method and apparatus for determining dielectric layer properties Grant 8,004,290 - Zhang , et al. August 23, 2 | 2011-08-23 |
| Substrate conditioning for corona charge control Grant 7,724,003 - Zhu , et al. May 25, 2 | 2010-05-25 |
| Measurement of effective capacitance Grant 7,525,304 - Feng , et al. April 28, 2 | 2009-04-28 |
| Corona based charge voltage measurement Grant 7,345,306 - Edelstein , et al. March 18, 2 | 2008-03-18 |
| Test Pads, Methods and Systems for Measuring Properties of a Wafer App 20070109003 - Shi; Jianou ; et al. | 2007-05-17 |
| Corona based charge voltage measurement Grant 7,098,050 - Edelstein , et al. August 29, 2 | 2006-08-29 |
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